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Study on Reliability Trend Analysis of Warship Weapon System Using Field Data RAM Analysis Results 基于现场数据RAM分析结果的舰船武器系统可靠性趋势分析研究
Sinloeseong eung'yong yeon'gu Pub Date : 2023-06-30 DOI: 10.33162/jar.2023.6.23.2.154
Eun-Byeol Jo, Young-In Jung, Sung-Chul Ha
{"title":"Study on Reliability Trend Analysis of Warship Weapon System Using Field Data RAM Analysis Results","authors":"Eun-Byeol Jo, Young-In Jung, Sung-Chul Ha","doi":"10.33162/jar.2023.6.23.2.154","DOIUrl":"https://doi.org/10.33162/jar.2023.6.23.2.154","url":null,"abstract":"Purpose: This study proposes a reliability trend analysis process of the warship weapon system using actual failure data for use in establishing a warship maintenance policy and consequently strengthening the utilization of field data RAM analysis result.BRMethods: The characteristics of the warship weapon system and the types of data that can be extracted from the field data RAM analysis results were reviewed. Based on this, methods such as annual analysis and non-dimensionalization were proposed.BRResults: The proposed method involved several processes, including data extraction from RAMVV, calculations of annual reliability, data calibration, non-dimensionalization, year calibration, and reliability trend analysis.BRConclusion: A case study was performed by applying the proposed method. The reliability of the warship weapon system continuously increased over the entire life cycle. Moreover, the trend was clearly observed in the section that included various ships; thus, it is expected that the reliability of the trend analysis will be improved through the accumulation of considerable amount of data.","PeriodicalId":499683,"journal":{"name":"Sinloeseong eung'yong yeon'gu","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135922449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of Trends in Reliability Engineering Using Patent Information 利用专利信息分析可靠性工程的发展趋势
Sinloeseong eung'yong yeon'gu Pub Date : 2023-06-30 DOI: 10.33162/jar.2023.6.23.2.205
Sunghyun Hwang
{"title":"Analysis of Trends in Reliability Engineering Using Patent Information","authors":"Sunghyun Hwang","doi":"10.33162/jar.2023.6.23.2.205","DOIUrl":"https://doi.org/10.33162/jar.2023.6.23.2.205","url":null,"abstract":"Purpose: This study aims to grasp the trends in reliability engineering research in Korea based on quantitative data such as patent information.BRMethods: Trend analysis, time series analysis BRResults: Time series analysis revealed that the compound annual growth rate (CAGR) of reliability-related patents has steadily increased to 16%, with domestic corporations holding the majority of such patents. In addition, these patents are concentrated in the field of electrical and physical engineering; reliability engineering is widely employed in precision manufacturing. While hardware-related patents still hold many reliability-related patents, patents in the network reliability engineering (NRE) and software reliability engineering (SRE) sectors are relatively increasing.BRConclusion: Patent analysis showed that patents in the field of reliability engineering in Korea are steadily increasing and the scope of patent use is gradually expanding.","PeriodicalId":499683,"journal":{"name":"Sinloeseong eung'yong yeon'gu","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135922448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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