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PM-15 ZnO nanoparticles with fluorescent properties suitable for modification on protein surfaces. 具有荧光特性的PM-15氧化锌纳米颗粒适合于蛋白质表面修饰。
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz096
T. Okuyama, Akinori Nakamura, K. Ohta, K. Matsuyama, H. Muto
{"title":"PM-15 ZnO nanoparticles with fluorescent properties suitable for modification on protein surfaces.","authors":"T. Okuyama, Akinori Nakamura, K. Ohta, K. Matsuyama, H. Muto","doi":"10.1093/jmicro/dfz096","DOIUrl":"https://doi.org/10.1093/jmicro/dfz096","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz096","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46340882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PB-11 3D-Modeling of Arabidopsis Root System Architecture by X-ray Micro-CT at SPring-8: Observation at Different Experimental Hutches PB-11春-8期拟南芥根系结构的x射线微ct三维建模:不同实验舱的观察
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz076
Tomofumi Kurogane, Daisuke Tamaoki, S. Yano, Fumiaki Tanigaki, T. Shimazu, H. Kasahara, D. Yamauchi, K. Uesugi, M. Hoshino, S. Kamisaka, Y. Mineyuki, I. Karahara
{"title":"PB-11 3D-Modeling of Arabidopsis Root System Architecture by X-ray Micro-CT at SPring-8: Observation at Different Experimental Hutches","authors":"Tomofumi Kurogane, Daisuke Tamaoki, S. Yano, Fumiaki Tanigaki, T. Shimazu, H. Kasahara, D. Yamauchi, K. Uesugi, M. Hoshino, S. Kamisaka, Y. Mineyuki, I. Karahara","doi":"10.1093/jmicro/dfz076","DOIUrl":"https://doi.org/10.1093/jmicro/dfz076","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz076","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43739960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PM-14 Three Dimensional Observations and Quantitative Analysis of Functional Polymer Materials 功能高分子材料的三维观察与定量分析
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz103
F. Uehara, Masayo Muraoka, N. Kaneko, Y. Otsuka
{"title":"PM-14 Three Dimensional Observations and Quantitative Analysis of Functional Polymer Materials","authors":"F. Uehara, Masayo Muraoka, N. Kaneko, Y. Otsuka","doi":"10.1093/jmicro/dfz103","DOIUrl":"https://doi.org/10.1093/jmicro/dfz103","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz103","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45959786","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
LS-1 Local electronic structure analysis and its mapping by STEM-EELS LS-1局域电子结构分析及其STEM-EELS映射
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz045
M. Haruta
{"title":"LS-1 Local electronic structure analysis and its mapping by STEM-EELS","authors":"M. Haruta","doi":"10.1093/jmicro/dfz045","DOIUrl":"https://doi.org/10.1093/jmicro/dfz045","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz045","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42093216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PB-05 Recycling of Uranyl acetate solution PB-05醋酸铀酰溶液的回收
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz082
H. Takase, Makoto Sugiura-Nakazato
{"title":"PB-05 Recycling of Uranyl acetate solution","authors":"H. Takase, Makoto Sugiura-Nakazato","doi":"10.1093/jmicro/dfz082","DOIUrl":"https://doi.org/10.1093/jmicro/dfz082","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz082","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48797102","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PM-12 3D-structural distributions of silica aggregates in styrene-butadiene rubber obtained by FIB-SEM FIB-SEM获得的苯乙烯-丁二烯橡胶中二氧化硅聚集体的PM-12三维结构分布
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz104
Ryōta Yamamoto, K. Hagita, Kazuya Morishita, Hirofumi Senga, T. Tominaga, H. Jinnai
{"title":"PM-12 3D-structural distributions of silica aggregates in styrene-butadiene rubber obtained by FIB-SEM","authors":"Ryōta Yamamoto, K. Hagita, Kazuya Morishita, Hirofumi Senga, T. Tominaga, H. Jinnai","doi":"10.1093/jmicro/dfz104","DOIUrl":"https://doi.org/10.1093/jmicro/dfz104","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz104","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48827469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SM-3 Noise Reduction Method Based on Machine Learnings for Electron Holography SM-3基于机器学习的电子全息降噪方法
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz056
Y. Asari
{"title":"SM-3 Noise Reduction Method Based on Machine Learnings for Electron Holography","authors":"Y. Asari","doi":"10.1093/jmicro/dfz056","DOIUrl":"https://doi.org/10.1093/jmicro/dfz056","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz056","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45407571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PM-13 Three-dimensional analysis of porous material by FIB/SEM and correlation with physical property measurement PM-13多孔材料的FIB/SEM三维分析及其与物性测量的相关性
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz098
Kazumi Takahashi, S. Yoshimoto, Y. Otsuka
{"title":"PM-13 Three-dimensional analysis of porous material by FIB/SEM and correlation with physical property measurement","authors":"Kazumi Takahashi, S. Yoshimoto, Y. Otsuka","doi":"10.1093/jmicro/dfz098","DOIUrl":"https://doi.org/10.1093/jmicro/dfz098","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz098","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47006447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
K-1 Road to Electron Microscope Development K-1电子显微镜发展之路
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz039
K. Fukushima
{"title":"K-1 Road to Electron Microscope Development","authors":"K. Fukushima","doi":"10.1093/jmicro/dfz039","DOIUrl":"https://doi.org/10.1093/jmicro/dfz039","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":"150 1","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz039","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60941679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PM-22 Surveillance study on the SI-traceable nanometrology by transmission electron microscopy (TEM) and trial fabrication of reference materials for TEM 透射电子显微镜(TEM)对PM-22硅可追溯纳米测量的监测研究及TEM标准物质的制备试验
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz089
Keita Kobayashi
{"title":"PM-22 Surveillance study on the SI-traceable nanometrology by transmission electron microscopy (TEM) and trial fabrication of reference materials for TEM","authors":"Keita Kobayashi","doi":"10.1093/jmicro/dfz089","DOIUrl":"https://doi.org/10.1093/jmicro/dfz089","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz089","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48312927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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