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PM-21 Optimization of hyperparameters in dictionary learning algorithm for peak detection of atom-resolved scanning transmission electron microscope images 原子分辨扫描透射电子显微镜图像峰检测的字典学习算法超参数优化
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz086
Sosuke Hattori, Yuki Nomura, K. Saitoh
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引用次数: 0
PM-08 Precipitation of Pigeonite and Enstatite in Augite of Ultrahigh Temperature Metamorphic Rock from Antarctica PM-08南极超高温变质岩Augite中鸽子岩和顽火辉石的沉淀
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz100
S. Toh, T. Miyamoto
{"title":"PM-08 Precipitation of Pigeonite and Enstatite in Augite of Ultrahigh Temperature Metamorphic Rock from Antarctica","authors":"S. Toh, T. Miyamoto","doi":"10.1093/jmicro/dfz100","DOIUrl":"https://doi.org/10.1093/jmicro/dfz100","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz100","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44861689","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PB-07 Organelle detection from electron microscopic images by deep learning 基于深度学习的PB-07电子显微镜图像细胞器检测
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz074
Kei Kato, Y. Shinohara, T. Ueki, N. Ohno
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引用次数: 0
SB-5 Abstraction of Pathological Information and Integration of Cancer Genome Information SB-5肿瘤病理信息提取与基因组信息整合
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz051
S. Ishikawa
{"title":"SB-5 Abstraction of Pathological Information and Integration of Cancer Genome Information","authors":"S. Ishikawa","doi":"10.1093/jmicro/dfz051","DOIUrl":"https://doi.org/10.1093/jmicro/dfz051","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz051","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47691567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SS1-4 3D reconstruction of intracytoplasmic membrane structure of methane-oxidizing bacteria by electron microscopy imaging SS1-4甲烷氧化菌胞质内膜结构的电镜成像三维重建
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz065
K. Uematsu, Chong Chen, H. Hirayama
{"title":"SS1-4 3D reconstruction of intracytoplasmic membrane structure of methane-oxidizing bacteria by electron microscopy imaging","authors":"K. Uematsu, Chong Chen, H. Hirayama","doi":"10.1093/jmicro/dfz065","DOIUrl":"https://doi.org/10.1093/jmicro/dfz065","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz065","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48077618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SPL-1 Electron Holography and Information Science: Toward High-Precision Electromagnetic Measurements 电子全息与信息科学:迈向高精度电磁测量
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz060
Y. Murakami
{"title":"SPL-1 Electron Holography and Information Science: Toward High-Precision Electromagnetic Measurements","authors":"Y. Murakami","doi":"10.1093/jmicro/dfz060","DOIUrl":"https://doi.org/10.1093/jmicro/dfz060","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz060","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44098829","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
KA-2 Structural Analysis Based on Measurements of Slight Cation Displacements from High Resolution STEM Images 基于高分辨率STEM图像微小阳离子位移测量的KA-2结构分析
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz044
S. Kobayashi
{"title":"KA-2 Structural Analysis Based on Measurements of Slight Cation Displacements from High Resolution STEM Images","authors":"S. Kobayashi","doi":"10.1093/jmicro/dfz044","DOIUrl":"https://doi.org/10.1093/jmicro/dfz044","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz044","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46044511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SM-6 Thorough quantification of micrograph by AI and advanced mathematics SM-6通过人工智能和高等数学对显微照片进行彻底量化
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz059
Y. Adachi, T. Ogawa, Zhi‐Lei Wang, Kohei Enya, Fumito Ajioka
{"title":"SM-6 Thorough quantification of micrograph by AI and advanced mathematics","authors":"Y. Adachi, T. Ogawa, Zhi‐Lei Wang, Kohei Enya, Fumito Ajioka","doi":"10.1093/jmicro/dfz059","DOIUrl":"https://doi.org/10.1093/jmicro/dfz059","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz059","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60941208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SM-1 Identification of Z-contrast image of twinned catalytic gold nanoparticles processed by Hough transformation using convolutional neural network SM-1卷积神经网络识别Hough变换处理的孪晶催化金纳米粒子Z对比度图像
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz054
Yuta Yamamoto, Junya Ohyama, A. Satsuma, N. Tanaka, S. Muto
{"title":"SM-1 Identification of Z-contrast image of twinned catalytic gold nanoparticles processed by Hough transformation using convolutional neural network","authors":"Yuta Yamamoto, Junya Ohyama, A. Satsuma, N. Tanaka, S. Muto","doi":"10.1093/jmicro/dfz054","DOIUrl":"https://doi.org/10.1093/jmicro/dfz054","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz054","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43961642","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SS2-2 Frontiers of AFM imaging method –high-resolution AFM in liquids and subsurface imaging– SS2-2 AFM成像方法的前沿——液体和地下成像中的高分辨率AFM——
IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI: 10.1093/jmicro/dfz067
H. Yamada, K. Kobayashi
{"title":"SS2-2 Frontiers of AFM imaging method –high-resolution AFM in liquids and subsurface imaging–","authors":"H. Yamada, K. Kobayashi","doi":"10.1093/jmicro/dfz067","DOIUrl":"https://doi.org/10.1093/jmicro/dfz067","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz067","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46439813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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