1987 IEEE International Symposium on Electromagnetic Compatibility最新文献

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Termination Transfer Impedance Z TT
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570750
Michael Van Brunt, John S. Miller
{"title":"Termination Transfer Impedance Z TT","authors":"Michael Van Brunt, John S. Miller","doi":"10.1109/ISEMC.1987.7570750","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570750","url":null,"abstract":"The measurement of termination transfer impedance of terminating shielding devices such as shield grounding flanges and chassis mount shielding connectors is accomplished utilizing a recently developed ground return current sensor. An appropriately driven load or loaded transformer imparts current to a short coaxial fixture with its input and output isolated by the fixtured sample which shorts the coax conductors. The resistive coaxial current sensor is in the current return path and encircles the sample. The transfer resistance of the sensor and sample are measured with D.C. and the equivalent measurement verified at low frequency. Ground loop currents or ground loop resonance are minimized using special fixturing. Two fixtures are identified to test large samples from D.C. to 200 MHz and small samples from D.C. to 3 GHz. Applicability of transfer impedance and shielding effectiveness is discussed relative to wavelength and sample size.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128457046","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Fault Tolerant Bus Transceiver System - Jamming and RF Interference Elimination. 容错总线收发器系统-干扰和射频干扰消除。
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570787
A. Partyka
{"title":"Fault Tolerant Bus Transceiver System - Jamming and RF Interference Elimination.","authors":"A. Partyka","doi":"10.1109/ISEMC.1987.7570787","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570787","url":null,"abstract":"A method of designing a fault-tolerant, microprocessor controlled, radio frequency bus transceiver system, suitable for digital communication network based on broadband coaxial cable is presented. It significantly reduces probability of network jamming and RF interference due to the bus transceiver failure. The method is based on multiloop structure of the bus transceiver system in which each element is periodically, automatically tested and in which failure of any single component des not result in uncontrolled carrier transmission, thus allowing for isolation and reporting of any single element failure before fatal, multiple failure can occur. Both hardware and software failure aspects are addressed. Presented method is cost effective and easy to implement.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116043065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electromagnetic Modelling Methods for EMC Design 电磁兼容设计中的电磁建模方法
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570821
T. H. Kneath
{"title":"Electromagnetic Modelling Methods for EMC Design","authors":"T. H. Kneath","doi":"10.1109/ISEMC.1987.7570821","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570821","url":null,"abstract":"Electromagnetic analysis by computer modelling can now be applied to a wide range of important EMC problems. There currently exist a variety of numerical modelling techniques, which have become available to the EMC industry through complicated computer programs. The major modelling and prediction methods for Electromagnetic design are reviewed and compared. Certain modelling techniques are identified as being preferential for the solution of particular EMC problems, but arguments are given that no one modelling technique can be identified as being suited to all EMC problems. A selection of commonly available computer programs are discussed and examples of their use made.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131952008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Antenna Related Factors Affecting the Correlation of Screen Room Measurements 影响屏室测量相关性的天线相关因素
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570797
H. Berger
{"title":"Antenna Related Factors Affecting the Correlation of Screen Room Measurements","authors":"H. Berger","doi":"10.1109/ISEMC.1987.7570797","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570797","url":null,"abstract":"","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133873736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Magnetic Field Penetration through Protective Metal Screens Using an Equivalent Magnetic Dipole Representation of an Array of Elliptical Apertures 利用椭圆孔阵列的等效磁偶极子表示磁场穿透保护性金属屏
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570739
R. Richmond, J. O'Neal
{"title":"Magnetic Field Penetration through Protective Metal Screens Using an Equivalent Magnetic Dipole Representation of an Array of Elliptical Apertures","authors":"R. Richmond, J. O'Neal","doi":"10.1109/ISEMC.1987.7570739","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570739","url":null,"abstract":"Introduction This paper presents the development of a model to predict the coupling of external magnetic fields into a cylindrical object through an aperture shielded with a metal screen. Also presented, are the results from an experiment designed to test the model. The coupling of these exterior fields through a single elliptical aperture is approximated by the radiation from an equivalent dipole into the object. The magnetic moments for this dipole are determined by the physical size of the aperture. The screen is then modeled as a linear superposition of many individual aper­ tures. The total field at an interior point is calculated by summing the components of the fields from each of these apertures. In order to test this model, an aluminum cylinder was constructed to be used as a test object. This cylinder was the meters long with a diameter of one meter. The ends of the cylinder were tapered to provide a constant impedance at the terminations. The entire object was mounted in a multiple wire coaxial return path to provide a nominal 50 Ohm imped­ ance. The center section of the cylinder cylinder contained an aperture that was 1.5 m long and that extended along a circumferential arc of 120 degrees. Covers for this aperture were constructed using different sizes of expanded metal mesh. An impulsive current generator was used to inject currents axially onto the cylinder. The peak currents levels were up to 30 kiloamps (kA). The resulting magnetic fields across the screened aperture were measured and compared with the simul­ taneous fields at interior points.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130015511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Transient Protected Connectors for EMP Suppression 用于EMP抑制的瞬态保护连接器
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570762
C. Dutcher, H. Hyatt
{"title":"Transient Protected Connectors for EMP Suppression","authors":"C. Dutcher, H. Hyatt","doi":"10.1109/ISEMC.1987.7570762","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570762","url":null,"abstract":"In most present electronic systems, the elements of the system are interconnected by wire cables. The wires in the cables carry either power or information, both of which we will refer to as signals. Besides the signals, other spurious voltages may appear on the wires. The class of spurious voltages with which we will be concerned here are transients. Transients are generally voltages of relatively short duration and often random and of high amplitude.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133328297","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
EMI Fingerstock Performance When Mated to Various Surfaces EMI指股性能时,配合各种表面
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570764
B. Archambeault
{"title":"EMI Fingerstock Performance When Mated to Various Surfaces","authors":"B. Archambeault","doi":"10.1109/ISEMC.1987.7570764","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570764","url":null,"abstract":"This paper discusses the relative perform­ ance of various fingerstock types when mated to a variety of different materials commonly used in shielded computer cabinets. The use of the transfer impedance of the entire seam (fingerstock and mating material combined) before and after environmental aging, is used as the measure of goodness. A description of the special transfer impedance test fixture built to allow the insertion and removal of mated fingerstock and mating material pairs is included.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132352757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An Evaluation of the Long Term EMI Performance of Several Shield Ground Adapters 几种屏蔽接地适配器的长期电磁干扰性能评价
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570767
D. Dixon, S. I. Sherman, Michael Van Brunt
{"title":"An Evaluation of the Long Term EMI Performance of Several Shield Ground Adapters","authors":"D. Dixon, S. I. Sherman, Michael Van Brunt","doi":"10.1109/ISEMC.1987.7570767","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570767","url":null,"abstract":"","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"227 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127213292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Measured Crosstalk of Multiconductor Cables that Use a Single Connection to the Reference Plane 参考平面采用单路连接的多导体电缆的串扰测量
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570776
L. Hoeft, J. Hofstra
{"title":"Measured Crosstalk of Multiconductor Cables that Use a Single Connection to the Reference Plane","authors":"L. Hoeft, J. Hofstra","doi":"10.1109/ISEMC.1987.7570776","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570776","url":null,"abstract":"","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128396065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Improved Measurement Techniques of Bridgewire Heating Caused by Induced Electromagnetic Radiation 感应电磁辐射引起的桥丝发热的改进测量技术
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570743
K. R. Lee, J. E. Bennett, W. Pinkston
{"title":"Improved Measurement Techniques of Bridgewire Heating Caused by Induced Electromagnetic Radiation","authors":"K. R. Lee, J. E. Bennett, W. Pinkston","doi":"10.1109/ISEMC.1987.7570743","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570743","url":null,"abstract":"A method is proposed for measuring temperatures at low energy levels o f a bridgewire in an electroexplosive device (EED). This passive method utilizes thermal energy transmitted by an infrared-optical fiber, and the temperatures in question are caused by induced electromagnetic energy that is mainly in the microwatt ranges. Signal processing techniques are used to enhance the estimate of temperature caused by the induced energy. The proposed method also minimizes the effects of both coherent background noise and noise due to temperature variations along the length of the infrared-fiber. encountered with this technique is a slow system response time reported as approximately 70 ms. There is a possibility that thermal characteristics could be altered due to the method of sensing temperature. This system is still under study. This paper proposes a new method of measuring the induced currents in die EED's bridgewire. The method makes use of infrared optical fiber which reduces the uncertainties associated with the use of thermocouples to detect induced electromagnetic energy in the EED. The method reduces coherent noise in sensing bridgewire currents, and it also eliminates any appreciable thermal loading on the bridgewire. The response time of this experimental system is approximately 10 ms, and it can be lowered if required. The outline of the paper is as follows, the overall system is presented and discussed, the design criteria are discussed; and various system parameters are shown.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129745730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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