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1987 IEEE International Symposium on Electromagnetic Compatibility最新文献

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A Simple Model for Weakly Coupled Lossy Transmission Lines of Finite Length Located Above A Grounded Dielectric Slab 介电接地板上有限长度弱耦合损耗传输线的简单模型
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570783
R. Olsen, Jay D. Reeves
{"title":"A Simple Model for Weakly Coupled Lossy Transmission Lines of Finite Length Located Above A Grounded Dielectric Slab","authors":"R. Olsen, Jay D. Reeves","doi":"10.1109/ISEMC.1987.7570783","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570783","url":null,"abstract":"A simple model is derived for coupling between two parallel and possibly lossy wires of finite length located above a grounded dielectric slab. The ana lysis is based upon the reci­ procity theorem, and weak coupling is assumed. The first wire is driven by a source and associated im pedance a t one end and is term inated with an im pedance a t the other end. The second wire is term inated with an im pedance a t each end. When the index of refraction, n, goes to unity, the formula is shown to agree well with the results of previously reported experim ent and theory. In addition, when n = 1 the formula reduces to the fam iliar inductive and capacitive coupling term s (neglecting wire losses).'F inally, theoretical results are com­ pared with experimental results when n is greater th an unity.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132457724","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Validation of Charge Distribution Models of Lightning Stepped Leaders from Electric Field Data 基于电场数据的闪电梯级引线电荷分布模型验证
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570803
S. P. Nathan, K. Arichandran
{"title":"Validation of Charge Distribution Models of Lightning Stepped Leaders from Electric Field Data","authors":"S. P. Nathan, K. Arichandran","doi":"10.1109/ISEMC.1987.7570803","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570803","url":null,"abstract":"","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"147 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123057113","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Development and Validation of Bonding Strap Impedance Model 键合带阻抗模型的开发与验证
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570740
L.J. Haller, B. Farris
{"title":"Development and Validation of Bonding Strap Impedance Model","authors":"L.J. Haller, B. Farris","doi":"10.1109/ISEMC.1987.7570740","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570740","url":null,"abstract":"In RF environments, electromagnetic fields can induce currents in conductors, creating potentia l differences betw ee n ad jacent m eta l objects. These p o te n t ia l differences can cause arcing and the nonlinear mixing of the incident signals.! To reduce the threat o f interference from these induced differences in potential, bonding straps are frequently used to interconnect metal objects. However, the bond always exhibits a finite impedance due to th e m ateria l o f th e bonding strap and th e geometry of the bonding strap and the bonded objects. The effectiveness of the bonding strap depends directly upon this impedance. To predict this im pedance, a computer model was developed and validated by a series of measurements performed on sample bonding straps in a repesentative bonding configuration.2","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127976059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Military Applications of Emission and Susceptibility Data 发射和磁化率数据的军事应用
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570824
H. Kohlbacher, William Walker
{"title":"Military Applications of Emission and Susceptibility Data","authors":"H. Kohlbacher, William Walker","doi":"10.1109/ISEMC.1987.7570824","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570824","url":null,"abstract":"","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115695504","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Microprocessor Software for EMI Recovery 用于EMI恢复的微处理器软件
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570788
Kimball Williams
{"title":"Microprocessor Software for EMI Recovery","authors":"Kimball Williams","doi":"10.1109/ISEMC.1987.7570788","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570788","url":null,"abstract":"","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114239170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Relationship of Equipment Grounding System Configurations to ESD Immunity 设备接地系统配置与防静电的关系
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570798
Toshinori Mori, O. Ibaragi, Taichi Kon, K. Shinozaki
{"title":"Relationship of Equipment Grounding System Configurations to ESD Immunity","authors":"Toshinori Mori, O. Ibaragi, Taichi Kon, K. Shinozaki","doi":"10.1109/ISEMC.1987.7570798","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570798","url":null,"abstract":"This paper presents a new technique of predicting and controlling noise caused by ESD for electronic systems. The relationship of physical configurations in an equipment grounding system to induced noise voltage was analyzed using a simple ground coupling model. The results show a remarkable depen­ dency of induced noise and immunity on the unbalance in ground cable lengths, on the im­ pedance of ground conductors connecting cir­ cuit boards, and on the type of grounding system.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123767013","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Conducted Emission Models for Switching Power Supplies 开关电源的传导发射模型
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570769
A. B. Bruno
{"title":"Conducted Emission Models for Switching Power Supplies","authors":"A. B. Bruno","doi":"10.1109/ISEMC.1987.7570769","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570769","url":null,"abstract":"Military Standard 461C specifies the limit for harmonic currents generated by electronic equipments in the frequency ranges that cover CE01 emissions (60 Hz 20 kHz) and CE03 emissions (20 kHz 50 MHz). These emissions are typical of the electromagnetic interference generated by switching power supplies. A computer model has been developed to study the effect of nonlinear loads on military power distri­ bution systems. Harmonic distortion caused by nonlinear loads is modeled by ideal current sources shunting the appropriate load impedance. The current sources can be given assumed harmonic structures that match measured data. Harmonic voltages and currents are computed at various points in the power distribution system, and the total harmonic distortion is estimated as a figure of merit for the particular configuration. Predicted values of total harmonic distortion will be compared to actual shipboard measurements.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125234206","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
FCC Enforcement Activities - An Industry View 联邦通信委员会执法活动-行业观点
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570793
Glen Dash
{"title":"FCC Enforcement Activities - An Industry View","authors":"Glen Dash","doi":"10.1109/ISEMC.1987.7570793","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570793","url":null,"abstract":"The last two years have witnessed a marked increase in enforcement activities of the Federal Communications Commission. The Commission made its presence known at key trade shows, such as Comdex, and tripled the number of fines and Justice Department referrals. The purpose of this paper is to review what has happened, outline the basis for this regulatory action, and predict some future trends. With the percentage of interference complaints due to Part 15 devices rising, and with the FCC continuing to uncover cases of widespread noncompliance, the Commission will have little choice but to continue active enforcement. Manufacturers should be wary of activities which can cause them to fall afoul of FCC rules.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125447870","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Monitoring Measuring Repeatability at Radiated Emissions Testing Facilities 辐射排放测试设施的监测测量重复性
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570775
S. Roleson
{"title":"Monitoring Measuring Repeatability at Radiated Emissions Testing Facilities","authors":"S. Roleson","doi":"10.1109/ISEMC.1987.7570775","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570775","url":null,"abstract":"Maintaining adequate measuring accuracy and repeatability at radiated emissions testing facilities (e.g., open field sites and semi-anechoic chambers) is necessary to maintain credibility. Although catastrophic failures are usually readily apparent, slow changes to measurement accuracy or minor failures are difficult to detect. Annual or semi-annual preven­ tative maintenance is necessary to insure accuracy, but cannot insure repeatability (i.e., continued accuracy) between maintenance periods. A method is described ap­ plying statistical quality control to weekly measure­ ments of a standard, multifrequency source to produce a running control chart of EMI measuring system repeatability.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124687448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Fast Approach to Test Method CS03 of MIL-STD-462 MIL-STD-462测试方法CS03的快速测试方法
1987 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1987-08-01 DOI: 10.1109/ISEMC.1987.7570773
M. Massaro, R. F. Lane
{"title":"A Fast Approach to Test Method CS03 of MIL-STD-462","authors":"M. Massaro, R. F. Lane","doi":"10.1109/ISEMC.1987.7570773","DOIUrl":"https://doi.org/10.1109/ISEMC.1987.7570773","url":null,"abstract":"A new approach to the two-signal intermodulaticn conducted susceptibility test CS03 of M U j-STO-462 is presented. The new approach can reduce test time in those situations in which the receiver to be tested has a low signal operating threshold and/or a wide band of operating frequencies, cr in which the conducted susceptibility threshold is dependent on signal-processing that is not performed in real time. Tntermodulaticn formulas in terms of CS03 test parameters are derived to permit the determination of those frequency bands in which an intermodulaticn response is most likely to occur. Test time can be reduced by selecting those frequency bands having intermodulaticn response orders that are of interest. An example demonstrating the new approach is discussed whereby test time was reduced by a factor of at least ten.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131254078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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