发布求助
文献互助 智能选刊 最新文献

IEEE International Conference on Software - Science, Technology & Engineering (SwSTE'05)最新文献

筛选
英文 中文
Pattern-based design recovery from object-oriented languages to object process methodology 从面向对象语言到对象过程方法论的基于模式的设计恢复
IEEE International Conference on Software - Science, Technology & Engineering (SwSTE'05) Pub Date : 2005-02-22 DOI: 10.1109/SWSTE.2005.16
D. Dori, Valeria Perelman, Galia Shlezinger, Iris Reinhartz-Berger
{"title":"Pattern-based design recovery from object-oriented languages to object process methodology","authors":"D. Dori, Valeria Perelman, Galia Shlezinger, Iris Reinhartz-Berger","doi":"10.1109/SWSTE.2005.16","DOIUrl":"https://doi.org/10.1109/SWSTE.2005.16","url":null,"abstract":"Keeping large software projects well documented is expensive and time consuming. Small code changes seldom propagate up to the design level. Therefore, design of large software becomes incoherent with the actual code. Yet understanding the original design intentions is crucial for supporting the life cycle of the software. Reverse engineering (RE) is the process of constructing a model of a system at a level that is more abstract than the source level at which the system is specified. In software, this amounts primarily to recovering the system design from its existing code. Most existing RE tools are UML-based. The majority of them recover only static aspects of the design, displayed by class diagrams. Others use pattern detection techniques to recover some of the high-level behavior. In this work, we argue that modeling dynamic behavior of even moderately complex systems is hardly feasible with UML due to its lack of hierarchy. As an alternative, we propose RE that is based on object process methodology (OPM), which provides a hierarchical view and a simple representation of design patterns.","PeriodicalId":434556,"journal":{"name":"IEEE International Conference on Software - Science, Technology & Engineering (SwSTE'05)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-02-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125605766","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A process-complete automatic acceptance testing framework 一个过程完整的自动验收测试框架
IEEE International Conference on Software - Science, Technology & Engineering (SwSTE'05) Pub Date : 2005-02-22 DOI: 10.1109/SWSTE.2005.2
D. Talby, O. Nakar, Noam Shmueli, Eli Margolin, Arie Keren
{"title":"A process-complete automatic acceptance testing framework","authors":"D. Talby, O. Nakar, Noam Shmueli, Eli Margolin, Arie Keren","doi":"10.1109/SWSTE.2005.2","DOIUrl":"https://doi.org/10.1109/SWSTE.2005.2","url":null,"abstract":"We present a new automated software acceptance tests framework. The framework is novel in supporting the entire lifecycle and all QA activities, including test maintenance over multiple versions, interaction with programmers and business analysts, traceability to specifications, multi-user test cases and more. This enables a significant increase in QA productivity and product quality. We compare our framework to other available tools, products and frameworks, and present several patterns and anti-patterns for implementing a successful automated acceptance testing solution.","PeriodicalId":434556,"journal":{"name":"IEEE International Conference on Software - Science, Technology & Engineering (SwSTE'05)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-02-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114290730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Transforming an operational system model to a data warehouse model: a survey of techniques 将操作系统模型转换为数据仓库模型:技术综述
IEEE International Conference on Software - Science, Technology & Engineering (SwSTE'05) Pub Date : 2005-02-22 DOI: 10.1109/SWSTE.2005.22
D. Dori, R. Feldman, A. Sturm
{"title":"Transforming an operational system model to a data warehouse model: a survey of techniques","authors":"D. Dori, R. Feldman, A. Sturm","doi":"10.1109/SWSTE.2005.22","DOIUrl":"https://doi.org/10.1109/SWSTE.2005.22","url":null,"abstract":"Data warehouse modeling is a complicated task, which involves both knowledge of business processes, as well as familiarity with operational information systems structure and behavior. Several modeling techniques were suggested to utilize the operational system structural or behavioral model in order to construct a data warehouse conceptual model. In this paper, we survey these techniques and analyze their capabilities using a feature-based comparison method. Our analysis clearly indicates that the various techniques are limited in their applicability to model large-scale systems, as they require acquaintance with the business processes and ability to select relevant transactional entities. These techniques also require multiple manual actions, since discovering measures and relevant dimensional entities are unassisted, and usually disregard the process perspective. Our analysis points out the need for improving the surveyed techniques.","PeriodicalId":434556,"journal":{"name":"IEEE International Conference on Software - Science, Technology & Engineering (SwSTE'05)","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-02-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115533052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Mapping structures for flash memories: techniques and open problems 闪存的映射结构:技术和开放性问题
IEEE International Conference on Software - Science, Technology & Engineering (SwSTE'05) Pub Date : 2005-02-22 DOI: 10.1109/SWSTE.2005.14
E. Gal, Sivan Toledo
{"title":"Mapping structures for flash memories: techniques and open problems","authors":"E. Gal, Sivan Toledo","doi":"10.1109/SWSTE.2005.14","DOIUrl":"https://doi.org/10.1109/SWSTE.2005.14","url":null,"abstract":"Flash memory is a type of electrically erasable programmable read-only memory (EEPROM). Because flash memories are nonvolatile and relatively dense, they are now used to store files and other persistent objects in handheld computers, mobile phones, digital cameras, portable music players, and many other computer systems in which magnetic disks are inappropriate. Flash, like earlier EEPROM devices, suffers from two limitations. First, bits can only be cleared by erasing a large block of memory. Second, each block can only sustain a limited number of erasures, after which it can no longer reliably store data. Due to these limitations, sophisticated data structures and algorithms are required to effectively use flash memories. These algorithms and data structures support efficient not-in-place updates of data, reduce the number of erasures, and level the wear of the blocks in the device. This survey presents these algorithms and data structures as well as open theoretical problems that arise in this area.","PeriodicalId":434556,"journal":{"name":"IEEE International Conference on Software - Science, Technology & Engineering (SwSTE'05)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-02-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121399461","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
Do SQA programs work - CMM works. a meta analysis 做SQA程序工作- CMM工作。meta分析
IEEE International Conference on Software - Science, Technology & Engineering (SwSTE'05) Pub Date : 2005-02-22 DOI: 10.1109/SWSTE.2005.12
Daniel Galin, Motti Avrahami
{"title":"Do SQA programs work - CMM works. a meta analysis","authors":"Daniel Galin, Motti Avrahami","doi":"10.1109/SWSTE.2005.12","DOIUrl":"https://doi.org/10.1109/SWSTE.2005.12","url":null,"abstract":"Many software development professionals and managers of software development organizations are not fully convinced in the profitability of investments for the advancement of SQA systems. The results included in each of the articles we found, cannot lead to general conclusions on the impact of investments in upgrading an SQA system. Our meta analysis was based on CMM level transition (CMMLT) analysis of available publications and was for the seven most common performance metric. The CMMLT analysis is applicable for combined analysis of empirical data from many sources. Each record in our meta analysis database is calculated as \"after-before ratio\", which is nearly free of the studied organization's characteristics. Because the CMM guidelines and SQA requirement are similar, we claim that the results for CMM programs are also applicable to investments in SQA systems. The extensive database of over 1,800 projects from a variety of 19 information sources leading to the meta analysis results - proved that investments in CMM programs and similarly in SQA systems contribute to software development performance.","PeriodicalId":434556,"journal":{"name":"IEEE International Conference on Software - Science, Technology & Engineering (SwSTE'05)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-02-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127617122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
首页 上一页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信