{"title":"A Passive Testing Approach using a Semi-Supervised Intrusion Detection Model for SCADA Network Traffic","authors":"Herbert Muehlburger, F. Wotawa","doi":"10.1109/AITest55621.2022.00015","DOIUrl":"https://doi.org/10.1109/AITest55621.2022.00015","url":null,"abstract":"Worldwide cyber-attacks constantly threaten the security of available infrastructure relying on cyber-physical systems. Infrastructure companies use passive testing approaches such as anomaly-based intrusion detection systems to observe such systems and prevent attacks. However, the effectiveness of intrusion detection systems depends on the underlying models used for detecting attacks and the observations that may suffer from scarce data availability. Hence, we need research on a) passive testing methods for obtaining appropriate detection models and b) for analysing the impact of the scarceness of data for improving intrusion detection systems. In this paper, we contribute to these challenges. We build on former work on supervised intrusion detection of power grid substation SCADA network traffic where a real-world data set (APG data set) is available. In contrast to previous work, we use a semi-supervised model with recurrent neural network architectures (i.e., LSTM Autoencoders and sequence models). This model only considers samples of ordinary data traffic without attacks to learn an adequate detection model. We outline the underlying foundations regarding the machine learning approach used. Furthermore, we present and discuss the obtained experimental results and compare them with prior results on supervised machine learning approaches. The source code of this work is available at:https: //github.com/muehlburger/semi-supervised-intrusion-detection-scada","PeriodicalId":427386,"journal":{"name":"2022 IEEE International Conference On Artificial Intelligence Testing (AITest)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124616734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Metrics for Measuring Error Extents of Machine Learning Classifiers","authors":"Hong Zhu, Ian Bayley, Mark Green","doi":"10.1109/AITest55621.2022.00016","DOIUrl":"https://doi.org/10.1109/AITest55621.2022.00016","url":null,"abstract":"Metrics play a crucial role in evaluating the performance of machine learning (ML) models. Metrics for quantifying the extent of errors, in particular, have been intensively studied and widely used but only so far for regression models. This paper focuses instead on classifier models. A new approach is proposed in which datamorphic exploratory testing is used to discover the boundary values between classes and the distance of misclassified instances from that boundary is used to quantify the errors that the model makes. Empirical experiments and case studies are reported that validate and evaluate the proposed metrics.","PeriodicalId":427386,"journal":{"name":"2022 IEEE International Conference On Artificial Intelligence Testing (AITest)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116060586","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Qingying Liu, Tao Zhang, J. Gao, Shaoying Liu, Jing Cheng
{"title":"Construction of Semantic Model for GUI of Mobile Applications Using Deep Learning","authors":"Qingying Liu, Tao Zhang, J. Gao, Shaoying Liu, Jing Cheng","doi":"10.1109/AITest55621.2022.00010","DOIUrl":"https://doi.org/10.1109/AITest55621.2022.00010","url":null,"abstract":"Modeling the graphical user interface (GUI) of mobile applications is a crucial task for automated robotic testing. Pixel-based modeling methods are non-intrusive and thus have potential for truly black-box automation. However, existing modeling methods can hardly produce accurate models because they do not take the semantic and structural information of GUI into account. In this paper, we propose a layered semantic approach to modeling GUI for mobile applications to address this important problem. The proposed approach adopts a method for recognizing GUI elements and a novel strategy for semantics acquisition using deep learning. The model generated using the proposed approach can support the fully black-box automated robotic testing. We evaluate the approach by conducting a small experiment on 10 mobile applications. The results demonstrate that the proposed approach is effective in generating the GUI models.","PeriodicalId":427386,"journal":{"name":"2022 IEEE International Conference On Artificial Intelligence Testing (AITest)","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125013740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Gao, ShiTing Li, Chuanqi Tao, Yejun He, Amrutha Pavani Anumalasetty, Erica Wilson Joseph, Akshata Hatwar Kumbashi Sripathi, Himabindu Nayani
{"title":"An Approach to GUI Test Scenario Generation Using Machine Learning","authors":"J. Gao, ShiTing Li, Chuanqi Tao, Yejun He, Amrutha Pavani Anumalasetty, Erica Wilson Joseph, Akshata Hatwar Kumbashi Sripathi, Himabindu Nayani","doi":"10.1109/AITest55621.2022.00020","DOIUrl":"https://doi.org/10.1109/AITest55621.2022.00020","url":null,"abstract":"With the fast advance of artificial intelligence technology and data-driven machine learning techniques, more and more AI approaches are applied in software engineering activities, such as coding, testing and etc.. Conventionally, test engineers use manual testing tools to test mobile apps and deliver products. Object detection technology like YOLO is widely used in image processing these days. Inspired from this, on the basis of detecting GUI elements using machine learning models, we propose an automated approach to GUI test scenario generation based on mockup diagrams. The list of possible scenarios can be visualized using NetworkX which can indicate the feasibility and effectiveness of the proposed approach.","PeriodicalId":427386,"journal":{"name":"2022 IEEE International Conference On Artificial Intelligence Testing (AITest)","volume":"20 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125075904","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Abdullah Murat Buldu, A. Sen, Karthik Swaminathan, B. Kahne
{"title":"MBET: Resilience Improvement Method for DNNs","authors":"Abdullah Murat Buldu, A. Sen, Karthik Swaminathan, B. Kahne","doi":"10.1109/AITest55621.2022.00019","DOIUrl":"https://doi.org/10.1109/AITest55621.2022.00019","url":null,"abstract":"Deep neural network (DNN) accelerators become a large study field. Low voltage DNN accelerators are designed to achieve high throughput and reduce energy consumption. Using low voltage leads to many bit errors in DNN weights. One method to increase fault tolerance against random bit errors is random bit error training. In this paper, we improve this method with multiple bit error rate training (MBET). MBET aims to improve the fault tolerance of the DNN model with using more than one bit error rates. During the training, we inject bit errors with different rates and combine the corresponding loss values. The experimental results on 4 state-of-the-art models show that this method improves fault tolerance of the model against random bit errors while it does not decrease the test accuracy of the model.","PeriodicalId":427386,"journal":{"name":"2022 IEEE International Conference On Artificial Intelligence Testing (AITest)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123509718","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An Approach For Verifying And Validating Clustering Based Anomaly Detection Systems Using Metamorphic Testing","authors":"Faqeer ur Rehman, C. Izurieta","doi":"10.1109/AITest55621.2022.00011","DOIUrl":"https://doi.org/10.1109/AITest55621.2022.00011","url":null,"abstract":"An oracle or test oracle is a mechanism that a software tester uses to verify the program output. In software testing, the oracle problem arises when either the oracle is not available or it may be available but is so expensive that it is infeasible to apply. To help address this problem in testing machine learning-based applications, we propose an approach for testing clustering algorithms. We exemplify this in the implementation of the award-winning density-based clustering algorithm i.e., Density-based Spatial Clustering of Applications with Noise (DBSCAN). Our proposed approach is based on the ‘Metamorphic Testing’ technique which is considered an effective approach in alleviating the oracle problem. Our contributions in this paper include, i) proposing and showing the applicability of a broader set of 21 Metamorphic Relations (MRs), among which 8 target the verification aspect, whereas, 14 of them target the validation aspect of testing the algorithm under test, and ii) identifying and segregating the MRs (by providing a detailed analysis) to help both naive and expert users understand how the proposed MRs target both the verification and validation aspects of testing the DBSCAN algorithm. To show the effectiveness of the proposed approach, we further conduct a case study on an anomaly detection system. The results obtained show that, i) different MRs have the ability to reveal different violation rates (for the given data instances); thus, showing their effectiveness, and ii) although we have not found any implementation issues (through verification) in the algorithm under test (that further enhances our trust in the implementation), the results suggest that the DBSCAN algorithm may not be suitable for scenarios (meeting the user expectations a.k.a validation) captured by almost 79% of violated MRs; which show high susceptibility to small changes in the dataset.","PeriodicalId":427386,"journal":{"name":"2022 IEEE International Conference On Artificial Intelligence Testing (AITest)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132723071","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hamzah Al-Qadasi, Changshun Wu, Yliès Falcone, S. Bensalem
{"title":"DeepAbstraction: 2-Level Prioritization for Unlabeled Test Inputs in Deep Neural Networks","authors":"Hamzah Al-Qadasi, Changshun Wu, Yliès Falcone, S. Bensalem","doi":"10.1109/AITest55621.2022.00018","DOIUrl":"https://doi.org/10.1109/AITest55621.2022.00018","url":null,"abstract":"Deep learning systems recently achieved unprecedented success in various industries. However, DNNs still exhibit some erroneous behaviors, which lead to catastrophic results. As a result, more data should be collected to cover more corner cases. On the other hand, a massive amount of data consumes more human annotators (oracle), which increases the labeling budget and time. We propose an effective test prioritization technique, called DeepAbstraction to prioritize the more likely error-exposing instances among the entire unlabeled test dataset. The ultimate goal of our framework is to reduce the labeling cost and select the potential corner cases earlier before production. Different from existing work, DeepAbstraction leverages runtime monitors. In the literature, runtime monitors are primarily used to supervise the prediction of the neural network. Then, monitors trigger a verdict for each prediction: acceptance, rejection, or uncertainty. Monitors quantity the acquired knowledge into box abstraction during the training. Each box abstraction contains instances that share similar high-level features. In the test part, the verdict of monitor depends in which box abstraction a test instance resides. Moreover, we study intensively where corner cases can reside in the feature space, either near-boundary regions or nearcentroid regions. The existing test prioritization techniques can only prioritize many near-boundary instances and a few nearcentroid instances. Nevertheless, DeepAbstraction can effectively prioritize numerous instances from both regions. Therefore, our evaluation shows that DeepAbstraction outperforms the state-of the-art test prioritization techniques.","PeriodicalId":427386,"journal":{"name":"2022 IEEE International Conference On Artificial Intelligence Testing (AITest)","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132385717","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Anomalous Anomaly Detection","authors":"Muyeed Ahmed, Iulian Neamtiu","doi":"10.1109/AITest55621.2022.00009","DOIUrl":"https://doi.org/10.1109/AITest55621.2022.00009","url":null,"abstract":"Anomaly Detection (AD) is an integral part of AI, with applications ranging widely from health to finance, manufacturing, and computer security. Though AD is popular and various AD algorithm implementations are found in popular toolkits, no attempt has been made to test the reliability of these implementations. More generally, AD verification and validation are lacking. To address this need, we introduce an approach and study on 4 popular AD algorithms as implemented in 3 popular tools, as follows. First, we checked whether implementations can perform their basic task of finding anomalies in datasets with known anomalies. Next, we checked two basic properties, determinism and consistency. Finally, we quantified differences in algorithms’ outcome so users can get a idea of variations that can be expected when using different algorithms on the same dataset. We ran our suite of analyses on 73 datasets that contain anomalies. We found that, for certain implementations, validation can fail on 10–73% of datasets. Our analysis has revealed that five implementations suffer from nondeterminism (19–98% of runs are nondeterministic), and 10 out of 12 implementation pairs are inconsistent.","PeriodicalId":427386,"journal":{"name":"2022 IEEE International Conference On Artificial Intelligence Testing (AITest)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115710303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Review of Quality Assurance Research of Dialogue Systems","authors":"Xiaomin Li, Chuanqi Tao, Jerry Gao, Hongjing Guo","doi":"10.1109/AITest55621.2022.00021","DOIUrl":"https://doi.org/10.1109/AITest55621.2022.00021","url":null,"abstract":"With the development of machine learning and big data technology, dialogue systems have been applied to many fields, including aerospace, banking and other scenarios that require high accuracy of answer. This has prompted a great deal of research on quality verification and assurance of dialogue systems. As two means to ensure the quality of software, testing and evaluation are rarely comprehensively summarized in current research work. Firstly, the dialogue systems are classified according to different classification standards. Secondly, this paper reviews the existing quality assurance work of dialogue systems from testing and dialogue evaluation, including testing methods, testing tools, evaluation metrics and dialogue quality attributes. Moreover, the issues and needs are discussed aiming at the deficiency in the current work, which can provide references for future research.","PeriodicalId":427386,"journal":{"name":"2022 IEEE International Conference On Artificial Intelligence Testing (AITest)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130106762","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sunny Shree, Jaganmohan Chandrasekaran, Yu Lei, R. Kacker, D. R. Kuhn
{"title":"DeltaExplainer: A Software Debugging Approach to Generating Counterfactual Explanations","authors":"Sunny Shree, Jaganmohan Chandrasekaran, Yu Lei, R. Kacker, D. R. Kuhn","doi":"10.1109/AITest55621.2022.00023","DOIUrl":"https://doi.org/10.1109/AITest55621.2022.00023","url":null,"abstract":"The profound black-box nature of Machine Learning (ML) based Artificial Intelligence (AI) systems leads to the problem of interpretability. Explainable Artificial Intelligence (XAI) tries to provide explanations to human users to understand the decisions made by ML-based systems. In this paper, we propose a software debugging-based approach called DeltaExplainer for generating counterfactual explanations for predictions made by ML models. The key insight of our approach is that the problem of XAI is similar to the problem of software debugging. We evaluate DeltaExplainer on eight ML models trained using real-world datasets. We compare DeltaExplainer to two state-of-the-art counterfactual explanation tools, i.e., DiCE and GeCo. Our experimental results suggest that the proposed approach can successfully generate counterfactual explanations and, in most cases, generate better explanations than DiCE and GeCo.","PeriodicalId":427386,"journal":{"name":"2022 IEEE International Conference On Artificial Intelligence Testing (AITest)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127840288","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}