M. Yen, F. Colella, H. Kytomaa, Boyd Allin, Alex E. Ockfen
{"title":"Contact Burn Injuries : Part II: The influence of object shape, size, contact resistance, and applied heat flux","authors":"M. Yen, F. Colella, H. Kytomaa, Boyd Allin, Alex E. Ockfen","doi":"10.1109/SPCE50045.2020.9296194","DOIUrl":"https://doi.org/10.1109/SPCE50045.2020.9296194","url":null,"abstract":"Increasing use of consumer electronics such as wearables brings new concerns associated with long duration, low temperature skin burn risk. Contact with these devices of low thermal mass results in the temperature of the device changing as energy is transferred from the device to the skin during contact. Current regulatory standards concerned with contact burn injury thresholds are designed assuming that the thermal energy in the hot contacting device is infinite and that the temperature of the object does not change significantly during contact. Furthermore, geometrical aspects of the contacting objects (i.e. contact shape, object size) and operational aspects (i.e. presence or absence of heat source associated with active components) are not accounted for in the standards. This paper is the second of a two-part series that discusses a numerical methodology that relies on the concept of cumulative equivalent exposure to evaluate contact burn injury thresholds. Part I described a burn injury model which numerically solves the transient heat transfer equation in living tissues and presents the burn injury threshold conditions associated with finite thermal mass objects. In Part I, the effect of a finite thermal mass is analyzed for an infinite plate of several finite thicknesses. In Part II, the sensitivities to object shape, size, thickness, contact resistance and applied heat flux are considered.","PeriodicalId":426226,"journal":{"name":"2020 IEEE Symposium on Product Compliance Engineering - (SPCE Portland)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127827494","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Yen, F. Colella, H. Kytomaa, Boyd Allin, Alex E. Ockfen
{"title":"Contact Burn Injuries : Part I: The influence of object thermal mass","authors":"M. Yen, F. Colella, H. Kytomaa, Boyd Allin, Alex E. Ockfen","doi":"10.1109/SPCE50045.2020.9295962","DOIUrl":"https://doi.org/10.1109/SPCE50045.2020.9295962","url":null,"abstract":"Burn injuries are a recognized hazard in our everyday interactions with consumer products and consumer electronics. They can be painful and life-altering and can cause permanent physical as well as emotional harm. Our increasing intimacy with consumer electronics including wearables is challenging the current regulatory standard framework. The typical thermal exposure associated with wearables and consumer electronics is characterized by long duration and relatively low temperatures with a contacting object with low thermal mass. As a result, the temperature of the object changes over time and is heavily affected by the transfer of energy to the skin during contact. The current regulatory standards dealing with contact burn injury thresholds assume that the thermal energy contained within the hot object is infinite and that its surface temperature remains approximately constant during contact. This paper presents a comprehensive approach to account for the common scenario where the user contacts a finite thermal mass object. The methodology numerically solves the transient heat transfer equation in living tissues and identifies the burn injury threshold conditions associated with finite thermal mass objects. The model is able to predict burn injury by employing a concept of cumulative equivalent exposure. The predictive capabilities are validated with experimental observations of human burn injuries. This paper is the first of a two-part series that discusses a numerical methodology that relies on the concept of cumulative equivalent exposure to evaluate contact burn injury thresholds. In Part II: The influence of object shape, size, contact resistance, and applied heat flux, the framework presented here in Part I is extended to investigate the effects of various contacting object conditions.","PeriodicalId":426226,"journal":{"name":"2020 IEEE Symposium on Product Compliance Engineering - (SPCE Portland)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127332695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electrical Fire Patterns in Vegetation","authors":"L. F. Bilancia","doi":"10.1109/SPCE50045.2020.9296155","DOIUrl":"https://doi.org/10.1109/SPCE50045.2020.9296155","url":null,"abstract":"The formation of branching patterns is commonly associated with electrical discharges. Lightning and electrostatic discharges from a Van DeGraff generator are transient luminous branching patterns, sometimes the passing of an electrical current leaves residual physical patterns. Such patterns can be captured in skin, sand, oil, and vegetation. Unfortunately for the fire investigator, patterns etched into wood-frame structures are often destroyed by subsequent combustion. Sometimes the patterns persist and can serve to indicate what actually happened. Char patterns were found etched into dry mustard plant, blackberry stalks, and Douglas fir. The first two were from current sourced by an electric fence charger (used for livestock management) and the third by contact between the tree and a power transmission line. Examples of how such patterns are formed are presented.","PeriodicalId":426226,"journal":{"name":"2020 IEEE Symposium on Product Compliance Engineering - (SPCE Portland)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125964920","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Techniques for Connecting IGBT Modules and Loss Mitigation: A Survey","authors":"M. Nawaz, Mohsin Khalil","doi":"10.1109/SPCE50045.2020.9296164","DOIUrl":"https://doi.org/10.1109/SPCE50045.2020.9296164","url":null,"abstract":"The circuit elements which are able to handle high power play a pivotal role in power electronics industry. By connecting these devices in series or parallel, high power ratings may be achieved based upon their application. The ability of Insulated Gate Bipolar Transistors (IGBTs) to handle high power is well known, however, they might experience losses during switching. Another challenge in this regard is the aspect of voltage and current balancing in series and parallel connections, respectively. Various techniques have been proposed in literature to achieve this voltage/current balance in IGBTs. Most commonly used techniques for voltage balancing are active gate control method, snubber circuits and clamping circuits. Moreover, widely used approaches to achieve current balancing are active gate control, impedance balancing and derating factor. In this work, we discuss the major failure mechanisms and the techniques to handle such failures. Furthermore, we also dilate upon the open circuit and short circuit fault detection methods. With an aim of minimizing the IGBT connection problems we explain the viable approaches, the methods to reduce the switching losses and the techniques to handle failures in series and parallel combinations.","PeriodicalId":426226,"journal":{"name":"2020 IEEE Symposium on Product Compliance Engineering - (SPCE Portland)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121176539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Henry W. Benitez, A. Inan, C. Miles, P. E. Perkins, Joshua Thompson
{"title":"Conducted Emissions Feedback from VSD operated products : What can we learn from testing actual VSD driven products?","authors":"Henry W. Benitez, A. Inan, C. Miles, P. E. Perkins, Joshua Thompson","doi":"10.1109/SPCE50045.2020.9295966","DOIUrl":"https://doi.org/10.1109/SPCE50045.2020.9295966","url":null,"abstract":"The ubiquitous increase in the use of mains power switching devices has been paralleled by the increase in ‘nuisance tripping’ of GFCIs and other protection devices. The GFCI uses the change in line current levels to detect fault current diverted to earth/ground, an electric shock hazard to humans. Examples of >1MHz conducted high frequency threat signals generated are shown in this paper; their relationship to electric shock touch current is described. False tripping of GFCIs is shown. ‘Nuisance tripping’ can be identified to contain such high frequency signals and these must be properly taken into account when designing proper GFCI operation in this environment.","PeriodicalId":426226,"journal":{"name":"2020 IEEE Symposium on Product Compliance Engineering - (SPCE Portland)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116933708","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The need for adequate sampling in a well-functioning market surveillance system","authors":"I. Hendrikx, N. Tuneski","doi":"10.1109/SPCE50045.2020.9296162","DOIUrl":"https://doi.org/10.1109/SPCE50045.2020.9296162","url":null,"abstract":"Current regulatory requirements for products emphasize more on faster access of products to the market while at the same time increasing post-market or market surveillance actions. Doing this way the cost of market surveillance actions are increasing and therefore market surveillance shall be more carefully planned to keep costs reasonable. In this regard, adequate sampling is essential for the well-functioning of a market surveillance system. As small as possible statistically significant sample size is the main factor that determines the costs of market surveillance actions. This paper studies various possibilities for calculation of the size of the sample with an emphasis on the method based on the binomial distribution. Examples, comparisons, and conclusions are provided.","PeriodicalId":426226,"journal":{"name":"2020 IEEE Symposium on Product Compliance Engineering - (SPCE Portland)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115360678","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}