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Switching Characteristics of a-ITZO Based Thin Film Transistor 基于a-ITZO薄膜晶体管的开关特性
SKIT Research Journal Pub Date : 2023-04-01 DOI: 10.47904/ijskit.13.1.2023.42-44
Abhinandan Jain, P. K. Jain, N. Jain
{"title":"Switching Characteristics of a-ITZO Based Thin Film Transistor","authors":"Abhinandan Jain, P. K. Jain, N. Jain","doi":"10.47904/ijskit.13.1.2023.42-44","DOIUrl":"https://doi.org/10.47904/ijskit.13.1.2023.42-44","url":null,"abstract":"-This study examines the thickness of SiO 2 dielectric materials in a-ITZO TFT using a numerical simulation performed by the Silvaco Atlas software. The switching characteristics of the device are investigated. The thickness of dielectric oxide material varies significantly between 180 nm and 50 nm, and device characteristics are studied. The significant results as threshold voltage of -0.65 V, mobility of 16.51 cm 2 V -1 s -1 , sub-threshold swing 0.049 V/dec and I on /I off of 1.43x10 11 is obtained in simulation of ITZO TFT for 50 nm optimum SiO 2 dielectric material thickness. The switching characteristics of the device are also affected by the use of high k dielectric material. The simulation results for an a-ITZO TFT(high k dielectric material) include a V T of -0.42 V, 𝜇 of 31.15 cm 2 V -1 s -1 , S of 0.034 V/dec, and I on /I off of 1.71x10 10 .","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126962898","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Assessment on the State of Art of Internet of Things (IoT) 物联网(IoT)技术现状评估
SKIT Research Journal Pub Date : 2023-04-01 DOI: 10.47904/ijskit.13.1.2023.23-28
Sarabjeet Singh Sethi, D. Kumar, Lalit Kumar Lata
{"title":"An Assessment on the State of Art of Internet of Things (IoT)","authors":"Sarabjeet Singh Sethi, D. Kumar, Lalit Kumar Lata","doi":"10.47904/ijskit.13.1.2023.23-28","DOIUrl":"https://doi.org/10.47904/ijskit.13.1.2023.23-28","url":null,"abstract":"","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126978492","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effect of Power Law Index Variation on Eigen Frequency of Functionally Graded Piezoelectric Round Disc 幂律指数变化对功能梯度压电圆片本征频率的影响
SKIT Research Journal Pub Date : 2023-04-01 DOI: 10.47904/ijskit.13.1.2023.10-12
Trivedra Kumar Sharma, Monu Gupta, R. Kumar, Prem Singh, Amit Jhalani, Sanjay Choudhary
{"title":"Effect of Power Law Index Variation on Eigen Frequency of Functionally Graded Piezoelectric Round Disc","authors":"Trivedra Kumar Sharma, Monu Gupta, R. Kumar, Prem Singh, Amit Jhalani, Sanjay Choudhary","doi":"10.47904/ijskit.13.1.2023.10-12","DOIUrl":"https://doi.org/10.47904/ijskit.13.1.2023.10-12","url":null,"abstract":"-Piezoelectric functionally graded hollow discs are highly used materials. It makes smart devices like car hinges, drones, and microelectromechanical devices. Shear-induced eigenfrequency is much less utilized because it is very difficult to analyze. To apply functionally graded piezoelectric materials, shear vibration of the functionally graded holoow disc has been obtained by producing the d15 effect. The d15 has a higher coupling coefficient than d33 and d31, so it can be utilized to exit shear vibrations in the FGPM round hollow disc. Effect on eigenfrequency of FGPM round disk has been obtained for varying the value of power law index. The material property of the functionally graded disc varies along the thickness by helping power law. The disc is radially polarized, and an electric field is applied along the thickness.","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128254324","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Patch Antenna at 2.4 GHz Frequency for Bluetooth 一种2.4 GHz频率的蓝牙贴片天线
SKIT Research Journal Pub Date : 2023-02-11 DOI: 10.47904/ijskit.13.3.2023.34-36
Uma Rathore, Jyoti Yadav, Mukesh Arora, Harshal Nigam, Suman Sharma
{"title":"A Patch Antenna at 2.4 GHz Frequency for Bluetooth","authors":"Uma Rathore, Jyoti Yadav, Mukesh Arora, Harshal Nigam, Suman Sharma","doi":"10.47904/ijskit.13.3.2023.34-36","DOIUrl":"https://doi.org/10.47904/ijskit.13.3.2023.34-36","url":null,"abstract":"","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"238 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136052366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Deployment of Formal Verification Methodology for AXI based Protocol for a Memory Model Verification 基于AXI的内存模型验证协议的形式化验证方法的部署
SKIT Research Journal Pub Date : 2023-02-11 DOI: 10.47904/ijskit.13.3.2023.12-16
Arpit Awasthi
{"title":"Deployment of Formal Verification Methodology for AXI based Protocol for a Memory Model Verification","authors":"Arpit Awasthi","doi":"10.47904/ijskit.13.3.2023.12-16","DOIUrl":"https://doi.org/10.47904/ijskit.13.3.2023.12-16","url":null,"abstract":"","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"301 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136052369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Slotted Antenna in Different Substrate: A Review And the Current State of the Art 不同基板上的开槽天线:综述及研究现状
SKIT Research Journal Pub Date : 2023-02-11 DOI: 10.47904/ijskit.13.3.2023.17-19
T. Hemalatha, B. Roy
{"title":"Slotted Antenna in Different Substrate: A Review And the Current State of the Art","authors":"T. Hemalatha, B. Roy","doi":"10.47904/ijskit.13.3.2023.17-19","DOIUrl":"https://doi.org/10.47904/ijskit.13.3.2023.17-19","url":null,"abstract":"","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136052370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Review on slotted microstrip antenna for different feed 不同馈电方式的开槽微带天线研究进展
SKIT Research Journal Pub Date : 2023-02-11 DOI: 10.47904/ijskit.13.3.2023.41-43
Venkata Lakshmaiah Y., B. Roy
{"title":"A Review on slotted microstrip antenna for different feed","authors":"Venkata Lakshmaiah Y., B. Roy","doi":"10.47904/ijskit.13.3.2023.41-43","DOIUrl":"https://doi.org/10.47904/ijskit.13.3.2023.41-43","url":null,"abstract":"","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136052373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Plasma Cleaning Methodology for Stain Removal in Electronic Packages 电子封装中去除污渍的等离子清洗方法
SKIT Research Journal Pub Date : 2023-02-11 DOI: 10.47904/ijskit.13.3.2023.5-7
Subhash J., Palani P., Anju Singh, Ajay andhiwal, Kamaljeet singh, Nirmal A. V.
{"title":"Plasma Cleaning Methodology for Stain Removal in Electronic Packages","authors":"Subhash J., Palani P., Anju Singh, Ajay andhiwal, Kamaljeet singh, Nirmal A. V.","doi":"10.47904/ijskit.13.3.2023.5-7","DOIUrl":"https://doi.org/10.47904/ijskit.13.3.2023.5-7","url":null,"abstract":"","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"69 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136052374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
FTIR Spectroscopy of charge transfer Complexes Galvinoxyl 电荷转移配合物Galvinoxyl的FTIR光谱
SKIT Research Journal Pub Date : 2023-02-11 DOI: 10.47904/ijskit.13.3.2023.8-11
Salman Zabha, Vishal R. Jain, Dhaval Khant
{"title":"FTIR Spectroscopy of charge transfer Complexes Galvinoxyl","authors":"Salman Zabha, Vishal R. Jain, Dhaval Khant","doi":"10.47904/ijskit.13.3.2023.8-11","DOIUrl":"https://doi.org/10.47904/ijskit.13.3.2023.8-11","url":null,"abstract":"","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136052368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Environment Friendly Machining of Different Materials: A Review 不同材料的环保加工:综述
SKIT Research Journal Pub Date : 2023-02-11 DOI: 10.47904/ijskit.13.3.2023.44-46
Tauseef Uddin Siddiqui, Vaibhav Chait
{"title":"Environment Friendly Machining of Different Materials: A Review","authors":"Tauseef Uddin Siddiqui, Vaibhav Chait","doi":"10.47904/ijskit.13.3.2023.44-46","DOIUrl":"https://doi.org/10.47904/ijskit.13.3.2023.44-46","url":null,"abstract":"","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136052372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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