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Sinc-Collocation method for solving astrophysics equations 求解天体物理方程的c-配点法
Journal of End-to-end-testing Pub Date : 2010-08-01 DOI: 10.1016/s9999-9994(10)00481-2
K. Parand, A. Pirkhedri
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引用次数: 83
On the effect of magnetic field on the low-l solar p-mode oscillations 磁场对太阳低振幅p模振荡的影响
Journal of End-to-end-testing Pub Date : 2010-08-01 DOI: 10.1016/s9999-9994(10)00486-1
H. Cavus, A. Karafistan
{"title":"On the effect of magnetic field on the low-l solar p-mode oscillations","authors":"H. Cavus, A. Karafistan","doi":"10.1016/s9999-9994(10)00486-1","DOIUrl":"https://doi.org/10.1016/s9999-9994(10)00486-1","url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126533983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Rapid apsidal motion in V381 Cassiopeiae 仙后座V381的快速运动
Journal of End-to-end-testing Pub Date : 2010-08-01 DOI: 10.1016/s9999-9994(09)00480-2
M. Wolf, L. Šmelcer, H. Kučáková, T. Hynek, K. Onderková, P. Svoboda, M. Chrastina
{"title":"Rapid apsidal motion in V381 Cassiopeiae","authors":"M. Wolf, L. Šmelcer, H. Kučáková, T. Hynek, K. Onderková, P. Svoboda, M. Chrastina","doi":"10.1016/s9999-9994(09)00480-2","DOIUrl":"https://doi.org/10.1016/s9999-9994(09)00480-2","url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"179 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121044960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Abundance analysis of a sample of evolved stars in the outskirts of ωω Centauri ωω半人马座外围演化恒星样本的丰度分析
Journal of End-to-end-testing Pub Date : 2010-08-01 DOI: 10.1016/s9999-9994(09)00479-6
S. Villanova, G. Carraro, R. Scarpa, G. Marconi
{"title":"Abundance analysis of a sample of evolved stars in the outskirts of ωω Centauri","authors":"S. Villanova, G. Carraro, R. Scarpa, G. Marconi","doi":"10.1016/s9999-9994(09)00479-6","DOIUrl":"https://doi.org/10.1016/s9999-9994(09)00479-6","url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121291755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analytical solution of subthreshold channel potential of gate underlap cylindrical gate-all-around MOSFET 栅极下搭圆柱栅极-全能MOSFET的亚阈值通道电位解析解
Journal of End-to-end-testing Pub Date : 2010-07-06 DOI: 10.1016/J.ENDEND.2010.06.030
Lining Zhang, Chenyue Ma, Jin He, Xinnan Lin, M. Chan
{"title":"Analytical solution of subthreshold channel potential of gate underlap cylindrical gate-all-around MOSFET","authors":"Lining Zhang, Chenyue Ma, Jin He, Xinnan Lin, M. Chan","doi":"10.1016/J.ENDEND.2010.06.030","DOIUrl":"https://doi.org/10.1016/J.ENDEND.2010.06.030","url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115128102","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 39
The direct evidence of substrate potential propagation in a gate-grounded NMOS 栅极接地NMOS中衬底电位传播的直接证据
Journal of End-to-end-testing Pub Date : 2010-07-01 DOI: 10.1016/j.endend.2010.06.029
Dao-Hong Yang, Jone F. Chen, Kuo-Ming Wu, J. Shih, Jian-Hsing Lee
{"title":"The direct evidence of substrate potential propagation in a gate-grounded NMOS","authors":"Dao-Hong Yang, Jone F. Chen, Kuo-Ming Wu, J. Shih, Jian-Hsing Lee","doi":"10.1016/j.endend.2010.06.029","DOIUrl":"https://doi.org/10.1016/j.endend.2010.06.029","url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"15 12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127649868","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Large-signal model for AlGaN/GaN HEMTs suitable for RF switching-mode power amplifiers design AlGaN/GaN hemt大信号模型，适用于射频开关模式功率放大器设计
Journal of End-to-end-testing Pub Date : 2010-07-01 DOI: 10.1016/J.ENDEND.2010.06.032
A. Jarndal, Pouya Aflaki, L. Degachi, A. Birafane, A. Kouki, R. Negra, F. Ghannouchi
{"title":"Large-signal model for AlGaN/GaN HEMTs suitable for RF switching-mode power amplifiers design","authors":"A. Jarndal, Pouya Aflaki, L. Degachi, A. Birafane, A. Kouki, R. Negra, F. Ghannouchi","doi":"10.1016/J.ENDEND.2010.06.032","DOIUrl":"https://doi.org/10.1016/J.ENDEND.2010.06.032","url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"66 7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130035053","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Effects of thermal annealing on structure, morphology and electrical properties of F16CuPc/α6T heterojunction thin films 热处理对F16CuPc/α6T异质结薄膜结构、形貌和电性能的影响
Journal of End-to-end-testing Pub Date : 2010-07-01 DOI: 10.1016/J.ENDEND.2010.06.031
R. Ye, M. Baba, K. Ohta, Kazunori Suzuki
{"title":"Effects of thermal annealing on structure, morphology and electrical properties of F16CuPc/α6T heterojunction thin films","authors":"R. Ye, M. Baba, K. Ohta, Kazunori Suzuki","doi":"10.1016/J.ENDEND.2010.06.031","DOIUrl":"https://doi.org/10.1016/J.ENDEND.2010.06.031","url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116223565","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Experimental observation of strong mixing due to internal wave focusing over sloping terrain 倾斜地形上内波聚焦引起的强混合实验观测
Journal of End-to-end-testing Pub Date : 2010-06-01 DOI: 10.1016/S9999-9994(09)20544-7
A. Swart, A. Manders, U. Harlander, L. Maas
{"title":"Experimental observation of strong mixing due to internal wave focusing over sloping terrain","authors":"A. Swart, A. Manders, U. Harlander, L. Maas","doi":"10.1016/S9999-9994(09)20544-7","DOIUrl":"https://doi.org/10.1016/S9999-9994(09)20544-7","url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125261312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Influence of support acid–base properties on the platinum-catalyzed enantioselective hydrogenation of activated ketones 载体酸碱性质对铂催化活化酮对映选择性加氢反应的影响
Journal of End-to-end-testing Pub Date : 2010-05-01 DOI: 10.1016/J.ENDEND.2010.04.053
Fatos Hoxha, B. Schimmoeller, Zdenek Cakl, A. Urakawa, T. Mallát, S. Pratsinis, A. Baiker
{"title":"Influence of support acid–base properties on the platinum-catalyzed enantioselective hydrogenation of activated ketones","authors":"Fatos Hoxha, B. Schimmoeller, Zdenek Cakl, A. Urakawa, T. Mallát, S. Pratsinis, A. Baiker","doi":"10.1016/J.ENDEND.2010.04.053","DOIUrl":"https://doi.org/10.1016/J.ENDEND.2010.04.053","url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129006225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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