{"title":"Effects of thermal annealing on structure, morphology and electrical properties of F16CuPc/α6T heterojunction thin films","authors":"R. Ye, M. Baba, K. Ohta, Kazunori Suzuki","doi":"10.1016/J.ENDEND.2010.06.031","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of End-to-end-testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/J.ENDEND.2010.06.031","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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