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2007 International Conference on Perspective Technologies and Methods in MEMS Design最新文献

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BioMEMS and Molecular Processing: Engineering Biomimetics in Design of MEMS and Processing Platforms 生物机械系统与分子加工:机械机械系统与加工平台设计中的工程仿生学
2007 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2007-05-23 DOI: 10.1109/MEMSTECH.2007.4283419
M. Lyshevski, S. Lyshevski
{"title":"BioMEMS and Molecular Processing: Engineering Biomimetics in Design of MEMS and Processing Platforms","authors":"M. Lyshevski, S. Lyshevski","doi":"10.1109/MEMSTECH.2007.4283419","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2007.4283419","url":null,"abstract":"The fundamentals, operation and functionality of MEMS and their components can be envisioned to be devised and prototyped through biomimetics. Examining actuation, sensing, processing and other key functions, we focus on the pilot studies of efficient hardware and software which are inherently possessed and exhibited by living biosystems. There are a great number of unsolved fundamental and technological problems. To some extent, a number of problems can be attacked by examining and attempting to utilize different biomolecular-centered actuation, sensing and processing solutions. BioMEMS and processing platforms are examined due to their superior performance and unprecedented capabilities. However, non-comprehended cellular phenomena and mechanisms in biosystems are emphasized. This paper documents novel MEMS devices and systems which can be designed utilizing some phenomena and effects observed in biosystems. The performance estimates are reported.","PeriodicalId":421462,"journal":{"name":"2007 International Conference on Perspective Technologies and Methods in MEMS Design","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129707550","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Yarn hairiness determination the algorithms of computer measurement methods 纱线毛羽度测定算法的计算机测量方法
2007 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2007-05-23 DOI: 10.1109/MEMSTECH.2007.4283454
M. Kuzahski, L. Jackowska-Strumillo
{"title":"Yarn hairiness determination the algorithms of computer measurement methods","authors":"M. Kuzahski, L. Jackowska-Strumillo","doi":"10.1109/MEMSTECH.2007.4283454","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2007.4283454","url":null,"abstract":"The article describes the algorithm of the edge detection in the computer application of the assessment of yarn quality. The proposed algorithm and the measurement method allows the real setting of the length and number of the protruding fibres. That solution introduces a new quality to the measurement of yarn hairiness.","PeriodicalId":421462,"journal":{"name":"2007 International Conference on Perspective Technologies and Methods in MEMS Design","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128283994","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Usage of XML for Fluidic MEMS Database Design XML在流体MEMS数据库设计中的应用
2007 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2007-05-23 DOI: 10.1109/MEMSTECH.2007.4283450
P. Denysyuk
{"title":"Usage of XML for Fluidic MEMS Database Design","authors":"P. Denysyuk","doi":"10.1109/MEMSTECH.2007.4283450","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2007.4283450","url":null,"abstract":"Usage of XML in database design of fluidic MEMS is considered in this paper, what gives possibility to spread functional features of MEMS CAD's database's structures.","PeriodicalId":421462,"journal":{"name":"2007 International Conference on Perspective Technologies and Methods in MEMS Design","volume":"2009 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125600784","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
An Intelligent BIST Mechanism for MEMS Fault Detection 微机电系统故障检测的智能BIST机制
2007 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2007-05-23 DOI: 10.1109/MEMSTECH.2007.4283415
J. Tanha, R. Asgary
{"title":"An Intelligent BIST Mechanism for MEMS Fault Detection","authors":"J. Tanha, R. Asgary","doi":"10.1109/MEMSTECH.2007.4283415","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2007.4283415","url":null,"abstract":"Diversity of application fields and properties of new materials generate new failure mechanisms in micro electro mechanical systems (MEMS). Now if we take into account the lessons from the past in microelectronics, we note that failure analysis played a major rule not only in development time reduction but also in qualification and reliability evaluation Most of the researches which have been done in MEMS reliability are about new material properties and fabrication technologies. Only a few fault detection methods have been introduced for fault detection in MEMS. Some of these methods can be used only for special MEMS. Additionally most of them need a precise model of system. In this paper a new intelligent method is proposed for fault detection in MEMS. In addition some parts of proposed neural network are changed in order to implement it as a BIST mechanism.","PeriodicalId":421462,"journal":{"name":"2007 International Conference on Perspective Technologies and Methods in MEMS Design","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125232952","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Motion Analysis in Automatic Systems 自动系统中的运动分析
2007 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2007-05-23 DOI: 10.1109/MEMSTECH.2007.4283435
V. Abakumov, O. Lomakina
{"title":"Motion Analysis in Automatic Systems","authors":"V. Abakumov, O. Lomakina","doi":"10.1109/MEMSTECH.2007.4283435","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2007.4283435","url":null,"abstract":"This text deals with image processing and motion analysis in automatic systems. Numerous technical applications which concern reception, processing, preservation and transfer of information are guided today by the development of systems in which information has the character of image. Image which can be considered as a two-dimensional signal, are considerably more capacitor data carrier, than a usual one-dimensional (time) signal. Due to the information that has visual character the decision of difficult scientific and engineering problems became possible.","PeriodicalId":421462,"journal":{"name":"2007 International Conference on Perspective Technologies and Methods in MEMS Design","volume":"150 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117311366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Network microresonator: modeling and simulations 网络微谐振器:建模与仿真
2007 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2007-05-23 DOI: 10.1109/MEMSTECH.2007.4283436
T. Sviridova, L. Sviridova
{"title":"Network microresonator: modeling and simulations","authors":"T. Sviridova, L. Sviridova","doi":"10.1109/MEMSTECH.2007.4283436","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2007.4283436","url":null,"abstract":"In this paper mathematical model of network micro resonator is presented, dependencies of output characteristics to length of connecting beam are carried out.","PeriodicalId":421462,"journal":{"name":"2007 International Conference on Perspective Technologies and Methods in MEMS Design","volume":"379 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123443881","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design Digital Data Acquisition and Processing Systems for Embedded System 嵌入式系统数字数据采集与处理系统的设计
2007 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2007-05-23 DOI: 10.1109/MEMSTECH.2007.4283423
M. Antonyuk, M. Lobur, V. Antonyuk
{"title":"Design Digital Data Acquisition and Processing Systems for Embedded System","authors":"M. Antonyuk, M. Lobur, V. Antonyuk","doi":"10.1109/MEMSTECH.2007.4283423","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2007.4283423","url":null,"abstract":"This paper describe main way to design digital data acquisition and processing systems. Represents architecture of two systems and main advantages and problems by design such system.","PeriodicalId":421462,"journal":{"name":"2007 International Conference on Perspective Technologies and Methods in MEMS Design","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130876694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Effect of Annealing on Optical and Band Gap Alignments of CdTe Thin Films Prepared by Pulsed Laser Deposition 退火对脉冲激光沉积CdTe薄膜光学对准和带隙对准的影响
2007 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2007-05-23 DOI: 10.1109/MEMSTECH.2007.4283426
V. Savchuk, B. Kotlyarchuk, A. Zaginey, R. Lesyuk, M. Oszwaldowski
{"title":"Effect of Annealing on Optical and Band Gap Alignments of CdTe Thin Films Prepared by Pulsed Laser Deposition","authors":"V. Savchuk, B. Kotlyarchuk, A. Zaginey, R. Lesyuk, M. Oszwaldowski","doi":"10.1109/MEMSTECH.2007.4283426","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2007.4283426","url":null,"abstract":"The influence of postgrowth thermal annealing into various atmospheres (mercury and dry air) on the optical, electrical and photoelectric properties of CdTe thin films prepared by the pulsed laser deposition method were studied.","PeriodicalId":421462,"journal":{"name":"2007 International Conference on Perspective Technologies and Methods in MEMS Design","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133865606","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modern OCR construction approaches and ill-conditioned problem theory 现代OCR构建方法与病态问题理论
2007 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2007-05-23 DOI: 10.1109/MEMSTECH.2007.4283434
I.I.A. Sbieh
{"title":"Modern OCR construction approaches and ill-conditioned problem theory","authors":"I.I.A. Sbieh","doi":"10.1109/MEMSTECH.2007.4283434","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2007.4283434","url":null,"abstract":"In this paper the modern approaches to development of the optical character recognition systems and enhancement of their efficiency using the ill-condition problem theory are given.","PeriodicalId":421462,"journal":{"name":"2007 International Conference on Perspective Technologies and Methods in MEMS Design","volume":"320 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125924193","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Microelectronic Devices Failure Diagnostics 微电子设备故障诊断
2007 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2007-05-23 DOI: 10.1109/MEMSTECH.2007.4283448
S. Ivchuk, V. Kogut, V. Karkulyovskyy
{"title":"The Microelectronic Devices Failure Diagnostics","authors":"S. Ivchuk, V. Kogut, V. Karkulyovskyy","doi":"10.1109/MEMSTECH.2007.4283448","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2007.4283448","url":null,"abstract":"Issues regarding microelectronic devices diagnostics are discussed in this paper. Constant high temperature exposure period and fast temperature cycling are two main methods of thermal load, used for computer electronics components. Efficiency estimation of every cycle's influence on the process of faster defect detection with defined parameter is considered in this paper. Let use activation system by Arrenius-Iring, which shows efficiency of thermal action on the acceleration of degradation processes. Taking into account this analysis, proposed equations could be compared in point of their efficiency and relation acceleration of the defect detection in electronic devices.","PeriodicalId":421462,"journal":{"name":"2007 International Conference on Perspective Technologies and Methods in MEMS Design","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129297067","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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