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2015 IEEE International Conference on Telecommunications and Photonics (ICTP)最新文献

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Tuning of transmission characteristics of epsilon-near-zero metamaterials by controlling permittivity of embedded defects 通过控制嵌入缺陷的介电常数调谐epsilon-近零超材料的透射特性
2015 IEEE International Conference on Telecommunications and Photonics (ICTP) Pub Date : 2015-12-01 DOI: 10.1109/ICTP.2015.7427961
Topojit Debnath, Samiul Hoque, Md. Zahurul Islam
{"title":"Tuning of transmission characteristics of epsilon-near-zero metamaterials by controlling permittivity of embedded defects","authors":"Topojit Debnath, Samiul Hoque, Md. Zahurul Islam","doi":"10.1109/ICTP.2015.7427961","DOIUrl":"https://doi.org/10.1109/ICTP.2015.7427961","url":null,"abstract":"In this paper we present the results of analytical and numerical studies on the effect of change of permittivity of embedded defects on the transmission characteristics of epsilon-near-zero (ENZ) metamaterials. We investigated electromagnetic wave transmission in the microwave regime through an isotropic ENZ metamaterial-based waveguide embedded with rectangular defects. We found that by adjusting the permittivity of the defect the transmission coefficient can be adjusted over a wide range, and even total transmission can be achieved. With a single rectangular defect, precise control of its permittivity is necessary to achieve and maintain near-perfect transmission through the waveguide. We found that if two defects are used in the ENZ medium, the range of permittivity for near-perfect transmission can be increased. We have also shown that this increase of permittivity range for total transmission and total reflection is also possible in anisotropic ENZ (AENZ) materials with rectangular defect(s).","PeriodicalId":410572,"journal":{"name":"2015 IEEE International Conference on Telecommunications and Photonics (ICTP)","volume":"70 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132152261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Design and development of an optical pressure sensing system using bellows as primary sensor 以波纹管为主要传感器的光学压力传感系统的设计与开发
2015 IEEE International Conference on Telecommunications and Photonics (ICTP) Pub Date : 2015-12-01 DOI: 10.1109/ICTP.2015.7427923
N. Mandal, B. Kumar, R. Sarkar
{"title":"Design and development of an optical pressure sensing system using bellows as primary sensor","authors":"N. Mandal, B. Kumar, R. Sarkar","doi":"10.1109/ICTP.2015.7427923","DOIUrl":"https://doi.org/10.1109/ICTP.2015.7427923","url":null,"abstract":"A new optical type pressure sensing system is proposed in this paper. Bellows, an elastic type sensing element is used to indicate the pressure in the form of displacement of bellows element. For automated process industries, the signal is required to be send to a remote location like control room. In order to send the mechanical movement of bellow corresponding to the applied pressure, to a control room the signal is to be converted in the form of electrical, pneumatic or optical signal. For inflammable industries optical signal transmission is preferred. In this work the displacement of bellow element is first converted into an electrical signal using hall probe sensor then it is converted into an optical signal using (MZI) Mach-Zehnder Interferometer. The proposed sensing system is designed and its theory of operation is developed. The experiment was done on the proposed system and the experimental characteristic shows very good linearity with excellent repeatability.","PeriodicalId":410572,"journal":{"name":"2015 IEEE International Conference on Telecommunications and Photonics (ICTP)","volume":"117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122463128","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Intra- and inter-wafer characterization of waveguide propagation loss and reflectivity 波导传播损耗和反射率的晶圆内和晶圆间表征
2015 IEEE International Conference on Telecommunications and Photonics (ICTP) Pub Date : 2015-12-01 DOI: 10.1109/ICTP.2015.7427930
M. I. Reja
{"title":"Intra- and inter-wafer characterization of waveguide propagation loss and reflectivity","authors":"M. I. Reja","doi":"10.1109/ICTP.2015.7427930","DOIUrl":"https://doi.org/10.1109/ICTP.2015.7427930","url":null,"abstract":"In silicon photonics, due to the increasing complexity of the device designs and the increasing density of the functions integrated on a single circuit, the precise characterization of the building blocks has become essential in order to assess the quality of the fabrication outcomes. As waveguides are the fundamental building block of photonic integrated circuits, its accurate characterization is very important to evaluate the quality of all passive elements. In this paper the characterization of two very important parameters, namely waveguide propagation loss and waveguide sidewall reflectivity, are reported for waveguides utilized inside a microring-based silicon photonic network-on-chip. Using a recently proposed method based on undercoupled all-pass microring structure, the two parameters from five differently positioned chips in two different wafers are measured in order to investigate the intra- and inter-wafer variations. Precise measurements alloalloww to define range of values and variations for these two parameters in photonic network-on-chip.","PeriodicalId":410572,"journal":{"name":"2015 IEEE International Conference on Telecommunications and Photonics (ICTP)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127944209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Effect of lower index dielectric coating on plasmon polaritons guided by finite metal stripes 低折射率介质涂层对有限金属条纹引导等离子激元的影响
2015 IEEE International Conference on Telecommunications and Photonics (ICTP) Pub Date : 2015-12-01 DOI: 10.1109/ICTP.2015.7427951
M. Islam, Md Samiul Alam, M. S. Alam
{"title":"Effect of lower index dielectric coating on plasmon polaritons guided by finite metal stripes","authors":"M. Islam, Md Samiul Alam, M. S. Alam","doi":"10.1109/ICTP.2015.7427951","DOIUrl":"https://doi.org/10.1109/ICTP.2015.7427951","url":null,"abstract":"The propagation properties of plasmon polaritons considering the effect of a lower index dielectric coating on metal stripe have been analyzed in this work by using a vector finite element method (FEM). The coating layer in the structure can reduce the propagation loss significantly for both symmetric and asymmetric modes without altering the 2D sub-wavelength power confinement much in the metal stripe. The effect of index contrast between coating and embedding dielectric material is also studied here for equal and unequal variation in thicknesses of coating layer in transverse plane.","PeriodicalId":410572,"journal":{"name":"2015 IEEE International Conference on Telecommunications and Photonics (ICTP)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127958369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Robust antenna array processor in the presence of steering angle mismatch and mutual coupling effect 鲁棒天线阵列处理器在转向角失配和互耦效应下的应用
2015 IEEE International Conference on Telecommunications and Photonics (ICTP) Pub Date : 2015-12-01 DOI: 10.1109/ICTP.2015.7427963
M. Ali, M. S. Hossain, M. Rashid
{"title":"Robust antenna array processor in the presence of steering angle mismatch and mutual coupling effect","authors":"M. Ali, M. S. Hossain, M. Rashid","doi":"10.1109/ICTP.2015.7427963","DOIUrl":"https://doi.org/10.1109/ICTP.2015.7427963","url":null,"abstract":"Due to the presence of mutual coupling between antenna arrays and antenna steering angle mismatch, the performance of adaptive antenna array processor is degraded highly. For this reason, robustness of the adaptive antenna array processor has become an important issue. The main drawback of conventional loading is so as to there is no clear concept to select loading level according to errors. This paper shows the robustness of this proposed loading technique to cancel interferences and to select loading levels automatically according to error level. This technique also minimizes steering angle mismatch as well as mutual coupling effect in the same algorithm. The performance of the proposed loading technique in the presence of both array imperfections is illustrated using numerical examples and compared with the existing robust processor.","PeriodicalId":410572,"journal":{"name":"2015 IEEE International Conference on Telecommunications and Photonics (ICTP)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125727219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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