{"title":"Study of field coupling mechanism at susceptibility testing of automotive components in the Gigahertz range","authors":"B. Korber, D. Sperling, K. Gonschorek","doi":"10.1109/EMCZUR.2007.4388262","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388262","url":null,"abstract":"In the Gigahertz range the coupling into the wiring harness predominates the direct field coupling into conductive traces of unshielded DUT. Using the Tubular Wave Coupler [5] is a very effective way to simulate the direct field coupling into separated traces by injection of common mode disturbing currents into the ground system of the DUT.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126421500","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Field Compensation for Resistance Welding","authors":"R. Herms, G. Bartels, R. Doebbelin, A. Lindemann","doi":"10.1109/EMCZUR.2007.4388304","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388304","url":null,"abstract":"Resulting from high welding currents, resistance welding is accompanied by intense magnetic fields. In the paper, it is demonstrated that field exposure of operators of resistance welding machines can be lowered by means of field compensation, if otherwise exposure limits would be exceeded. The field compensation arrangements are investigated and optimized by finite elements (FEM) simulation and verified by measurements.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"126 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124693202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
I. Chahine, M. Kadi, E. Gaboriaud, A. Louis, B. Mazari
{"title":"Using neural networks for predicting the integrated circuits susceptibility to conducted electromagnetic disturbances","authors":"I. Chahine, M. Kadi, E. Gaboriaud, A. Louis, B. Mazari","doi":"10.1109/EMCZUR.2007.4388184","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388184","url":null,"abstract":"The decrease in normal signal levels, the increase in the operating frequencies, and the use of digital electronics in modern systems have led to the need for heightened EMC considerations, and consequently, better EMC models. A preliminary mathematical model based on neural networks theory is developed for predicting the level of susceptibility of integrated circuits to conducted electromagnetic disturbances such as a sine wave. A good correlation between measured and simulated results is obtained.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128403556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Modelling Interactions between Multiport-systems and Canonical Stochastic Environments","authors":"B. Michielsen","doi":"10.1109/EMCZUR.2007.4388211","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388211","url":null,"abstract":"The interaction between an interconnect system and an electromagnetically active environment is one of the principal concerns in EMC modelling. An interconnect system can be modelled as a multi-port system and all its model parameters can be expressed in terms of integrals over system-bound current distributions and incident electromagnetic fields. These model parameters are the observables of the interaction theory. The difficulty we have to face is that we do not master the environment in every detail and if we want to make useful predictions of levels of environment induced interference, we shall have to quantify the fluctuations around our idealised or “average value” predictions. In this contribution, we define a canonical stochastic environment which can be seen as the most natural choice of ambient field given the knowledge we have about the configuration our system is going to be placed in. This leads to the computation of “interaction resistances,” to be added to the ports, which represent the energetic coupling to the environment. But, even more importantly, these resistances have a computable “noise temperature” expressed in terms of a single parameter characterising the level of the ambient electromagnetic field.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131276644","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Nozomu Ishii, Hiroki Shiga, Ken-ichi Sato, L. Hamada, Soichi Watanabe
{"title":"A gain calibration in the liquid including the effects of fresnel field and systematic uncertainty","authors":"Nozomu Ishii, Hiroki Shiga, Ken-ichi Sato, L. Hamada, Soichi Watanabe","doi":"10.1109/EMCZUR.2007.4388216","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388216","url":null,"abstract":"One of calibration techniques for electric field probes used in the standardized SAR (Specific Absorption Rate) assessment is based on the Friis transmission formula in the far-field region for the conductive medium. In practice, it is difficult to measure power transmission between transmitting and receiving antennas in the far-field region for the liquid used in the SAR assessment because of its large attenuation. To overcome the difficulty, the authors extended the formula taking into account the Fresnel approximation. The extended formula is valid in the Fresnel region of the antennas for the conductive medium. In this paper, the far-field gain of the antennas can be estimated by not only using the extended formula but also considering systematic uncertainty of measuring power transmission. Adding the effect of the measurement uncertainties can make the resulting uncertainty of the gain small, because the measurement uncertainty of the power transmission largely depends on its level so that this behavior can not be ignored in the liquid.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"357 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134519810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Generation of passive macromodels for lossy multiconductor transmission lines","authors":"A. Chinea, S. Grivet-Talocia","doi":"10.1109/EMCZUR.2007.4388196","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388196","url":null,"abstract":"This paper presents an algorithm for the enforcement of passivity in delay-based multiconductor transmission line macromodels based on the Generalized Method of Characteristics. The algorithm enforces passivity via an iterative procedure based on first-order perturbations. More precisely, the short-circuit admittance matrix of the macromodel is iteratively modified until it becomes positive real. This iterative perturbation is performed on the solutions of a nonlinear eigenvalue problem, whereas the passivity verification is performed using an adaptive frequency sampling process. The proposed technique results in passive, accurate, and efficient macromodels for arbitrary lossy multiconductor transmission lines, which can be synthesized in SPICE netlists for system-level analysis and design.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130040136","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Worst case signal integrity analysis for in-vehicle data transmission via UTP cables","authors":"V. Zwillich, W. Menzel, H. Leier","doi":"10.1109/EMCZUR.2007.4388220","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388220","url":null,"abstract":"Future luxury car applications require reliable data transmission at higher data rates over copper cables. The unshielded twisted pair (UTP) cable is well proven for low data rates and is considered as a cost effective candidate for high speed data transmission. In this paper, the impedance of a UTP cable as a function of the distance to the car body is analyzed and a worst case impedance profile is identified. Resonances in frequency domain were measured and simulated, and their effect on time domain signals was analyzed for different bit patterns at various data rates.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114685376","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Computed SAR distributions for the occupants of a car with a 400 MHz transmitter on the rear seat","authors":"A. Ruddle","doi":"10.1109/EMCZUR.2007.4388190","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388190","url":null,"abstract":"Numerical simulations have been used to investigate the impact of occupant distribution on the field exposure threat due to a transmitter operating at 400 MHz inside a car. Eight different occupancy configurations involving the driver and up to three passengers were considered, and both 10 g and 1 g SAR measures were determined. The models suggest that mean SAR limits are likely to be reached at lower power levels than would be needed to reach maximum SAR limits. The presence of the vehicle structures is found to result in higher mean SAR values for all occupant locations, although maximum SAR levels are lower with the vehicle for the driver position. It is concluded that evaluating the in-vehicle field exposure threat by comparing average fields over the interior of the empty vehicle with the reference levels recommended for assessing the exposure of the general public provides a safety factor approaching two for the source configuration under investigation.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117169286","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Influence of discrete series devices on crosstalk phenomena in multiconductor transmission lines","authors":"Ziya Mazloom, N. Theethayi, Rajeev Thottappillil","doi":"10.1109/EMCZUR.2007.4388241","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388241","url":null,"abstract":"Usually the crosstalk mechanisms in multiconductor transmission lines (MTL) are studied considering lumped loads or devices connected at the line terminations (either at source or load ends) or as shunt load to ground along the lines, as seen in conventional power and railway system networks. However there are practical systems, e.g. like in typical Swedish railway systems, wherein discrete lumped devices like the booster transformer (BT) exist in series with the line. With lightning transients various parameters that influence crosstalk in MTL systems, such as the ground conductivity, have been analyzed e.g. in [1]. For realistic crosstalk analysis we conclude that inclusion of discrete devices like BT should be accounted. The study could be beneficial in better understanding of the crosstalk mechanism in the electrified railway systems.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124728625","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Double bulk current injection test with amplitude and phase control","authors":"F. Marliani, G. Spadacini, S. Pignari","doi":"10.1109/EMCZUR.2007.4388287","DOIUrl":"https://doi.org/10.1109/EMCZUR.2007.4388287","url":null,"abstract":"This paper deals with a new double bulk current injection (DBCI) test relying upon amplitude and phase control of the RF power sources used to feed the injection probes. The proposed DBCI test has the capability to inject RF currents with user-selected frequency shape into the equipment under test and, in particular, it can be used to reproduce currents induced by external non-uniform electromagnetic fields. A theoretical analysis of the test setup is presented, a practical implementation is described and experimental results are reported to demonstrate strengths/weakness of the proposed test procedure.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125054950","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}