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Proceedings of Conference on Precision Electromagnetic Measurements Digest最新文献

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Measuring amplifier noise on a noise source calibration radiometer 测量噪声源校准辐射计上的放大器噪声
Proceedings of Conference on Precision Electromagnetic Measurements Digest Pub Date : 1994-06-27 DOI: 10.1109/CPEM.1994.333234
G. Williams
{"title":"Measuring amplifier noise on a noise source calibration radiometer","authors":"G. Williams","doi":"10.1109/CPEM.1994.333234","DOIUrl":"https://doi.org/10.1109/CPEM.1994.333234","url":null,"abstract":"The complex noise parameters of amplifiers and other active devices are measured on radiometers designed to calibrate noise sources. A summary of the method is presented together with a set of results.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"175 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126954149","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Multi-variance analysis: last improvements and practical utilization 多方差分析:最后改进及实际应用
Proceedings of Conference on Precision Electromagnetic Measurements Digest Pub Date : 1994-06-27 DOI: 10.1109/CPEM.1994.333315
F. Vernotte, G. Zalamansky, E. Lantz
{"title":"Multi-variance analysis: last improvements and practical utilization","authors":"F. Vernotte, G. Zalamansky, E. Lantz","doi":"10.1109/CPEM.1994.333315","DOIUrl":"https://doi.org/10.1109/CPEM.1994.333315","url":null,"abstract":"The multi-variance analysis yields a better sensitivity for the measurement of the frequency noise altering the oscillators as well as an estimation of the measurement uncertainties. This method has been improved in order to measure simultaneously drift and noise coefficients and non-equally spaced timing sequences. We defined a new standard of time stability measurement which is used for classical clocks as well as millisecond pulsars.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133316921","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Study of a 196.0 THz (1529 nm) frequency standard based on an optically pumped rubidium vapor 基于光抽运铷蒸气的196.0 THz (1529 nm)频率标准的研究
Proceedings of Conference on Precision Electromagnetic Measurements Digest Pub Date : 1994-06-27 DOI: 10.1109/CPEM.1994.333383
M. Breton, P. Tremblay, C. Julien, N. Cyr, M. Tetu
{"title":"Study of a 196.0 THz (1529 nm) frequency standard based on an optically pumped rubidium vapor","authors":"M. Breton, P. Tremblay, C. Julien, N. Cyr, M. Tetu","doi":"10.1109/CPEM.1994.333383","DOIUrl":"https://doi.org/10.1109/CPEM.1994.333383","url":null,"abstract":"We study the performance-of 196.0 THz (1529 nm) DFB lasers frequency-locked to absorption lines of a rubidium vapor optically pumped at 384 THz (780 nm). We describe a simple theoretical model giving the absorption profile of such a vapor. The measured frequency stability of two DFB lasers frequency-locked to these lines reaches a level of 8/spl times/10/sup -10/.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133617054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A low-current precision DC, AC and DC/AC clamp-on measurement sensor 低电流精密直流，交流和DC/AC夹紧测量传感器
Proceedings of Conference on Precision Electromagnetic Measurements Digest Pub Date : 1994-06-27 DOI: 10.1109/CPEM.1994.333389
S. Ren, Hengchun Ding, S. She
{"title":"A low-current precision DC, AC and DC/AC clamp-on measurement sensor","authors":"S. Ren, Hengchun Ding, S. She","doi":"10.1109/CPEM.1994.333389","DOIUrl":"https://doi.org/10.1109/CPEM.1994.333389","url":null,"abstract":"A low-current precision DC, AC and DC/AC clamp-on measurement sensor is described that can be used to make on-line calibration and measurement of DC, AC and DC/AC low-current in industry and laboratory. The sensor features current ratio accuracy grade of better than (5/spl sim/10)/spl times/10/sup -4/ for 10/spl sim/200 amperes current range, current resolution of 0.01 ampere, and transient response time of less than 1/spl times/10/sup -3/ second for the DC, AC and DC/AC clamp-on prototype.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134352145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A new self-calibrating standard instrument for current transformer calibration 一种新型电流互感器自校准标准仪
Proceedings of Conference on Precision Electromagnetic Measurements Digest Pub Date : 1994-06-27 DOI: 10.1109/CPEM.1994.333241
I. Zoltán
{"title":"A new self-calibrating standard instrument for current transformer calibration","authors":"I. Zoltán","doi":"10.1109/CPEM.1994.333241","DOIUrl":"https://doi.org/10.1109/CPEM.1994.333241","url":null,"abstract":"A new current comparator-based self-calibrating instrument for current transformer calibration has been developed. The instrument measures the in-phase and quadrature components of the error by means of a digital vector voltmeter. The built-in ratio matching unit makes it possible to compare current transformers of different ratios. A set of built-in auxiliary windings ensure complete on-site self-testing of the instrument. The ratio matching unit can be tested and calibrated by the anti-offset method. The basic accuracy of the instrument is 2 ppm with 0.1 ppm resolution.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"199 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133781937","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A review of realizations and comparisons of Josephson array voltage standards 约瑟夫逊阵列电压标准的实现与比较综述
Proceedings of Conference on Precision Electromagnetic Measurements Digest Pub Date : 1994-06-27 DOI: 10.1109/CPEM.1994.333167
T. J. Witt
{"title":"A review of realizations and comparisons of Josephson array voltage standards","authors":"T. J. Witt","doi":"10.1109/CPEM.1994.333167","DOIUrl":"https://doi.org/10.1109/CPEM.1994.333167","url":null,"abstract":"This presentation will review realizations of reference standards of voltage based on arrays of Josephson junctions and efforts to compare the standards of different laboratories.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133866125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The present watt balance: a measure of its resolution 现在的瓦特天平:它的分辨率的量度
Proceedings of Conference on Precision Electromagnetic Measurements Digest Pub Date : 1994-06-27 DOI: 10.1109/CPEM.1994.333181
P. T. Olsen, R. Steiner, G. R. Jones, E. Williams
{"title":"The present watt balance: a measure of its resolution","authors":"P. T. Olsen, R. Steiner, G. R. Jones, E. Williams","doi":"10.1109/CPEM.1994.333181","DOIUrl":"https://doi.org/10.1109/CPEM.1994.333181","url":null,"abstract":"It was possible to operate the watt balance in the normal mode, but with the magnetic field reduced by more than six orders of magnitude. This mode of operation allowed the investigation of possible sources of systematic errors not specifically connected with the magnetic field, but rather with the balance environment. This measurement revealed a general lack of environmental effects and indicated an upper limit of resolution less than thirty parts per billion for a potential watt evaluation.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125547944","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A possibility of reducing the effect of interrogation phase noise on the frequency stability in passive frequency standards 降低无源频率标准中询问相位噪声对频率稳定性影响的可能性
Proceedings of Conference on Precision Electromagnetic Measurements Digest Pub Date : 1994-06-27 DOI: 10.1109/CPEM.1994.333405
D. Venot, R. Barillet, C. Audoin
{"title":"A possibility of reducing the effect of interrogation phase noise on the frequency stability in passive frequency standards","authors":"D. Venot, R. Barillet, C. Audoin","doi":"10.1109/CPEM.1994.333405","DOIUrl":"https://doi.org/10.1109/CPEM.1994.333405","url":null,"abstract":"Due to an intermodulation effect, the local oscillator phase noise may limit the medium term frequency stability of passive frequency standards. A new possibility of reducing this effect is presented. The mathematical approach is confirmed by a simulation of the frequency standard behavior. Optimal demodulation waveforms are given.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115841537","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Large signal load-pull measurements using six-port reflectometers 大信号负载-拉力测量使用六端口反射计
Proceedings of Conference on Precision Electromagnetic Measurements Digest Pub Date : 1994-06-27 DOI: 10.1109/CPEM.1994.333395
F. Deshours, E. Bergeault, L. Jallet, B. Huyart
{"title":"Large signal load-pull measurements using six-port reflectometers","authors":"F. Deshours, E. Bergeault, L. Jallet, B. Huyart","doi":"10.1109/CPEM.1994.333395","DOIUrl":"https://doi.org/10.1109/CPEM.1994.333395","url":null,"abstract":"This paper describes an active load-pull measurement system, using two six-port junctions for nonlinear characterization of power transistors. Load-pull measurements on a 600 /spl mu/m MESFET have been performed at 2 GHz.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"159 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132562568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Advancements in picosecond resolution time interval measurement techniques 皮秒分辨率时间间隔测量技术的进展
Proceedings of Conference on Precision Electromagnetic Measurements Digest Pub Date : 1994-06-27 DOI: 10.1109/CPEM.1994.333311
L. Dobos
{"title":"Advancements in picosecond resolution time interval measurement techniques","authors":"L. Dobos","doi":"10.1109/CPEM.1994.333311","DOIUrl":"https://doi.org/10.1109/CPEM.1994.333311","url":null,"abstract":"New, efficient measurement techniques are used to adequately characterize the actual performance of the new generation of programmable equivalent time sequential sampling oscilloscopes. These instruments provide new time interval measurement capabilities with increased repeatability and accuracy. Subpicosecond repeatability for risetime measurements of fast step generators (20 ps transition time) has been observed. A typical timebase related peak error of 3 ps for short time interval measurements (up to tens of ns) has been shown. A brief introduction on the horizontal timebase error sources is followed by the description of the automated measurement techniques. Finally actual measurement results are shown using the described techniques.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134383639","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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