{"title":"DOCTOR: An Integrate Software Fault Injection environrnent - an Extended Abstract","authors":"Seungjae Han, H. Rosenberg, K. Shin","doi":"10.1109/WIEM.1994.654405","DOIUrl":"https://doi.org/10.1109/WIEM.1994.654405","url":null,"abstract":"","PeriodicalId":386840,"journal":{"name":"Third Int'l Workshop on Integrating Error Models with Fault Injection","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115332871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Evaluation Of Very High Coverage","authors":"D. Powell, J. Arlat","doi":"10.1109/WIEM.1994.654399","DOIUrl":"https://doi.org/10.1109/WIEM.1994.654399","url":null,"abstract":"","PeriodicalId":386840,"journal":{"name":"Third Int'l Workshop on Integrating Error Models with Fault Injection","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115981359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Johansson, J. Karlsson, P. Lidén, P. Dahlgren, J. Torin
{"title":"An Investigation Of The Validity Of The Single Bit Error Model For Particle-induced Transients By Physical Fault Injection.","authors":"R. Johansson, J. Karlsson, P. Lidén, P. Dahlgren, J. Torin","doi":"10.1109/WIEM.1994.654409","DOIUrl":"https://doi.org/10.1109/WIEM.1994.654409","url":null,"abstract":"","PeriodicalId":386840,"journal":{"name":"Third Int'l Workshop on Integrating Error Models with Fault Injection","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128506703","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Framework For System-level Error Recovery Modelling","authors":"J. Dugan","doi":"10.1109/WIEM.1994.654413","DOIUrl":"https://doi.org/10.1109/WIEM.1994.654413","url":null,"abstract":"System-level dependability modeling requires a careful balance between detailed modeling of critical aspects of system behavior and abstract modeling to achieve tractability. A complex, detailed model requiring excessive resources for model construction and solution may be elegant, but provides limited utility to system designers. High-level abstract models that are easy to specify and solve can provide a quick means to evaluate tradeoffs during the design process, but if they ignore critical information, the designers may make inappropriate design decisions. A framework for providing a system-level abstraction of the behavior of hardware and software faults and errors is proposed.","PeriodicalId":386840,"journal":{"name":"Third Int'l Workshop on Integrating Error Models with Fault Injection","volume":"181 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133910701","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fault-recovery Testing Of Intelligent Fault Tolerant Systems","authors":"E. Dekel, I. Golan, A. Winokur","doi":"10.1109/WIEM.1994.654396","DOIUrl":"https://doi.org/10.1109/WIEM.1994.654396","url":null,"abstract":"An example for such a system would be a communication channel that continues to function and transfer files between two end points in the presence of noise. The continuous availability of the system is achieved by allowing the system to perform recovery actions. There are two kinds of recovery actions: Immediate and Learned. Immediate recovery reacts only to the fault at hand. In our example this recovery consists of packets reconstruction (using some error correcting code) and/or retrys (asking for retransmission of packets). A reaction to a fault is a Learned recovery when it is based on accumulated knowledge in the system. It is designed to handle re-occurring faults. In our example, the system, when the number of faults that are related to noise exceed a given threshold, can decide, using the collected history, to reroute or to gracefully terminate the communication.","PeriodicalId":386840,"journal":{"name":"Third Int'l Workshop on Integrating Error Models with Fault Injection","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129868643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A layered functional/resource framework for error injection testing of system fault tolerance","authors":"A. Robinson","doi":"10.1109/WIEM.1994.654391","DOIUrl":"https://doi.org/10.1109/WIEM.1994.654391","url":null,"abstract":"","PeriodicalId":386840,"journal":{"name":"Third Int'l Workshop on Integrating Error Models with Fault Injection","volume":"88 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124163861","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An Environment For Simulation-based Fault Injection For ASIC-based Safety-critical Digital Systems","authors":"Dziem Nguyen, Tuan Le","doi":"10.1109/WIEM.1994.654411","DOIUrl":"https://doi.org/10.1109/WIEM.1994.654411","url":null,"abstract":"","PeriodicalId":386840,"journal":{"name":"Third Int'l Workshop on Integrating Error Models with Fault Injection","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115029325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Linking Software Failure Behavior To Specification","authors":"Frederick T. Sheldon, K. Kavi","doi":"10.1109/WIEM.1994.654403","DOIUrl":"https://doi.org/10.1109/WIEM.1994.654403","url":null,"abstract":"POSITION S TATEMENT For the past two decades, various software fault-tolerance (IT) schemes have been proposed, e.g., N-Version Programming, Self-checking and Recovery Block schemes among others. Yet, few real systems have incorporated software fault-tolerance schemes in practice. The reluctance to use software fault-tolerance schemes stems from some formidable sources: (a) inherent complexity and development risk, (b) high cost of HW lk SW redundancy, (c) realization of acceptability test logic (including the overhead imposed on performancej, and (d) lack of trustworthy evaluation methods for determining system reliability. We seek to better understand the source and mechanism of software failures, and to identify the software fault-tolerance mechanism most appropriate for a articular class of failures. We are attempting to relate the failure behavior of software to the formal specification of the software system at higher levels. RELATED WORK: RELIABILITY GROWTH TESTING Current approaches utilize reliability growth testing which is highly dependent on the predictive validity of the model, test coverage and operational profile. These approaches often employ goodness of fit and recalibration techniques to enable the user to gauge how well the model is working. Software reliability can be predicted based on measurable characteristics of the software development process and artifacts. A program's failure rate is related to the fault hazard rate profile. Unfortunately, the hazard rate profile is usually determined by \"fault seeding\" or by retrospective failure analysis. Under a particular operational profile, provided the same information (i.e., frequency with which potential faults are encountered) can be provided by adding randomly placed counters within the code. SYSTEMS LEVEL: INHERENT RELIABILITY OF A SW FT DESIGN CANDIDATE Thee different result spaces are possible from software fault-tolerance (see Figure 1): 1) Intended or correct results, shown by the horizontally oriented oval, which fulfill the intention of the user a d are defined by system requirements, 2) Actuai results, those produced by the system (Ova at 4s0), and 3) Accepted results. those admitted by the error detection module as being tolerable (vertical ovai). The relationshp between these three result sets make possible four state categones (see tree structure): i) No error: actual result is correct and accepted. ii) False alarm: X t U a l result is correct but not accepted, iii) Missing alarm: actual result is not correct but accepted, and iv) Detected error: actual result is not correct and not accepted.","PeriodicalId":386840,"journal":{"name":"Third Int'l Workshop on Integrating Error Models with Fault Injection","volume":"121 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121299842","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}