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Architecting a common-source-line array for bipolar non-volatile memory devices 构建双极非易失性存储器器件的公共源线阵列
2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2012-03-01 DOI: 10.1109/date.2012.6176594
Bo Zhao, Jun Yang, Youtao Zhang, Yiran Chen, Hai Li
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引用次数: 16
Extending the lifetime of NAND flash memory by salvaging bad blocks 通过回收坏块来延长NAND闪存的寿命
2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2012-03-01 DOI: 10.1109/date.2012.6176473
Chundong Wang, Weng-Fai Wong
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引用次数: 32
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