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Extending the lifetime of NAND flash memory by salvaging bad blocks

2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2012-03-01 DOI:10.1109/date.2012.6176473
Chundong Wang, Weng-Fai Wong
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引用次数: 32
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通过回收坏块来延长NAND闪存的寿命
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)
2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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