2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)最新文献

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Software-only Diverse Redundancy on GPUs for Autonomous Driving Platforms 自动驾驶平台gpu的纯软件多样化冗余
S. Alcaide, Leonidas Kosmidis, Carles Hernández, J. Abella
{"title":"Software-only Diverse Redundancy on GPUs for Autonomous Driving Platforms","authors":"S. Alcaide, Leonidas Kosmidis, Carles Hernández, J. Abella","doi":"10.1109/IOLTS.2019.8854378","DOIUrl":"https://doi.org/10.1109/IOLTS.2019.8854378","url":null,"abstract":"Autonomous driving (AD) builds upon high-performance computing platforms including (1) general purpose CPUs as well as (2) specific accelerators, being GPUs one of the main representatives. Microcontrollers have reached ASIL-D compliance by implementing diverse redundancy with lockstep execution. However, ASIL-D compliant GPUs rely on either fully redundant lockstep GPUs (i.e. 2 GPUs), which doubles hardware costs, or fully redundant systems with a GPU and another accelerator, which virtually doubles design and validation/verification (V&V) costs. In this paper we analyze the degree of diversity achieved when implementing redundancy on a single GPU, showing that diverse redundancy is not achieved in many cases, and propose software strategies that guarantee achieving diverse redundancy for any kernel on systems using commercial off-the-shelf (COTS) GPUs, thus showing how to achieve ASIL-D compliance on a single COTS GPU in controlled scenarios.","PeriodicalId":383056,"journal":{"name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133779183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
On a Side Channel and Fault Attack Concurrent Countermeasure Methodology for MCU-based Byte-sliced Cipher Implementations 基于单片机的字节切片密码实现的边信道和故障攻击并发对策方法
Ehsan Aerabi, Athanasios Papadimitriou, D. Hély
{"title":"On a Side Channel and Fault Attack Concurrent Countermeasure Methodology for MCU-based Byte-sliced Cipher Implementations","authors":"Ehsan Aerabi, Athanasios Papadimitriou, D. Hély","doi":"10.1109/IOLTS.2019.8854372","DOIUrl":"https://doi.org/10.1109/IOLTS.2019.8854372","url":null,"abstract":"As IoT applications are increasingly being deployed, there comes along an ever increasing need for the security and privacy of the involved data. Since cryptographic implementations are used to achieve these goals, it is important for embedded software developers to take into consideration hardware attacks. Side Channel Analysis (SCA) and Fault Attacks (FA) are the main classes of such attacks, which can either reduce or even eliminate the security levels of an embedded design. Therefore, cryptographic implementations must address both of them at the same time. To this end, multiple solutions have been proposed to address both attacks in one solution, such as Dual Pre-charge Logic (DPL) and Encoding countermeasures. In this work, we discuss the advantages and disadvantages of the state of the art, concurrent SCA and FA countermeasures. Additionally, we propose a software countermeasure in order to provide protection against both types of attacks. The proposed countermeasure is a general approach, applicable to any byte-sliced cipher and any modern (32/64-bit) Micro-Controller Units (MCU). The proposed countermeasure is applied to an AES S-BOX implementation, for a 32-bit MCU (ARM Cortex-M3). The countermeasure has been experimentally evaluated against Correlation Power Analysis (CPA) attacks for both platforms while its fault detection capabilities are theoretically described.","PeriodicalId":383056,"journal":{"name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124323540","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
IOLTS 2019 Keynote
{"title":"IOLTS 2019 Keynote","authors":"","doi":"10.1109/iolts.2019.8854448","DOIUrl":"https://doi.org/10.1109/iolts.2019.8854448","url":null,"abstract":"","PeriodicalId":383056,"journal":{"name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"01 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127265042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Hierarchical Check Based Detection and Diagnosis of Sensor-Actuator Malfunction in Autonomous Systems: A Quadcopter Study 自主系统中基于分层检查的传感器-执行器故障检测与诊断:四轴飞行器研究
Md Imran Momtaz, A. Chatterjee
{"title":"Hierarchical Check Based Detection and Diagnosis of Sensor-Actuator Malfunction in Autonomous Systems: A Quadcopter Study","authors":"Md Imran Momtaz, A. Chatterjee","doi":"10.1109/IOLTS.2019.8854392","DOIUrl":"https://doi.org/10.1109/IOLTS.2019.8854392","url":null,"abstract":"Future pervasive autonomous systems such as un-manned land and air vehicles will need to be extremely resilient to failures in sensors, actuators and on-board electronics for the purpose of overall vehicle safety. While detection of failures in sensors and actuators has been addressed in the past, direct application of prior error checking schemes to complex autonomous systems with multiple actuators is difficult. This is due to the large numbers of system state variables involved, the resulting degraded ability to perform accurate error detection and most importantly, loss of the ability to perform accurate error diagnosis. In this research, a hierarchical error checking scheme is presented that allows errors in centralized as well as distributed control of autonomous systems to be detected with high accuracy and low latency while allowing error diagnosis down to individual sensor-actuator subsystems. Checking mechanisms for subsystems as well as centralized control are synthesized so as to ensure coverage of all sensors and actuator errors. The viability of the proposed technique is demonstrated using a quadcopter flight control system. High error coverage and diagnosis down to critical sensor-actuator subsystems is demonstrated.","PeriodicalId":383056,"journal":{"name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130992638","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories : (Invited Paper) 利用新兴记忆满足低功耗和弹性的冲突目标:(特邀论文)
Karthikeyan Nagarajan, Mohammad Nasim Imtiaz Khan, Sina Sayyah Ensan, Abdullah Ash-Saki, Swaroop Ghosh
{"title":"Meeting the Conflicting Goals of Low-Power and Resiliency Using Emerging Memories : (Invited Paper)","authors":"Karthikeyan Nagarajan, Mohammad Nasim Imtiaz Khan, Sina Sayyah Ensan, Abdullah Ash-Saki, Swaroop Ghosh","doi":"10.1109/IOLTS.2019.8854412","DOIUrl":"https://doi.org/10.1109/IOLTS.2019.8854412","url":null,"abstract":"Emerging non-volatile memory (NVM) technologies are being aggressively explored to replace and/or assist conventional CMOS technology. Although NVMs can cut down leakage power, achieve low footprint and allow compute capability along with storage, they suffer from new sources of variability. We review the noise sources associated with NVMs and describe resilience enhancement techniques for both memory and computing. We also present security applications where noise and variability is desirable.","PeriodicalId":383056,"journal":{"name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"170 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121622296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Total Ionizing Dose Effects by alpha irradiation on circuit performance and SEU tolerance in thin BOX FDSOI process 辐照总电离剂量对薄盒FDSOI工艺电路性能和SEU耐受性的影响
Takashi Yoshida, Kazutoshi Kobayashi, J. Furuta
{"title":"Total Ionizing Dose Effects by alpha irradiation on circuit performance and SEU tolerance in thin BOX FDSOI process","authors":"Takashi Yoshida, Kazutoshi Kobayashi, J. Furuta","doi":"10.1109/IOLTS.2019.8854439","DOIUrl":"https://doi.org/10.1109/IOLTS.2019.8854439","url":null,"abstract":"Total ionizing dose (TID) effect is a phenomenon that threatens the reliability of transistors under high-radiation environments. TID is caused by radiation-induced trapped holes in oxide insulator. We evaluated the effects of TID on fully-depleted silicon on insulator (FDSOI) and bulk processes by measuring frequency of a ring oscillator (RO) and single event upset tolerance of flip flops (FFs). On the bulk process, TID induced Vth shift of nMOSFET, leads to increase of the RO frequency. On the FDSOI process, IR drop induced by large amount of leakage current flowing above buried oxide (BOX) layer decreases RO frequency. We also demonstrated that TID effects recovers by thermal annealing.","PeriodicalId":383056,"journal":{"name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115023534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement 从单次长期直流测量中复制交流应力/恢复的NBTI紧凑建模
Takumi Hosaka, S. Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi
{"title":"Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement","authors":"Takumi Hosaka, S. Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi","doi":"10.1109/IOLTS.2019.8854421","DOIUrl":"https://doi.org/10.1109/IOLTS.2019.8854421","url":null,"abstract":"In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on the reaction-diffusion (tn) and hole-trapping (log(t)) theories. A single shot of DC stress and recovery data is utilized to express duty cycle dependence of NBTI degradation and recovery. Parameter fitting is proceeded by considering that the amount of recovery cannot be larger than stress degradation. The proposed model successfully replicates stress and recovery with various duty cycles.","PeriodicalId":383056,"journal":{"name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"157 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115592626","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Development of FF Circuits for Measures Against Power Supply Noise 抗电源噪声FF电路的研制
Y. Miura, Miyuki Inoue, Yuya Kinoshita
{"title":"Development of FF Circuits for Measures Against Power Supply Noise","authors":"Y. Miura, Miyuki Inoue, Yuya Kinoshita","doi":"10.1109/IOLTS.2019.8854447","DOIUrl":"https://doi.org/10.1109/IOLTS.2019.8854447","url":null,"abstract":"Power supply noise such as IR-drop affects the operation of memory elements. The authors have shown that FF circuits also caused bit-flip errors which are similar to those in SRAMs. In addition, the authors clarified that the basic problem of the error occurrence is structures themselves of conventional FF circuits. In this paper, new FF circuits that are countermeasures for bit-flip errors caused by power supply noise are proposed. The effectiveness of proposed FFs was verified by using circuit simulation and their performances were evaluated.","PeriodicalId":383056,"journal":{"name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121778791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Methodology for Tradeoffs between Performance and Lifetimes of Integrated Circuits 集成电路性能与寿命的权衡方法
D. Weyer, F. Wolff, C. Papachristou, Steve Clay
{"title":"Methodology for Tradeoffs between Performance and Lifetimes of Integrated Circuits","authors":"D. Weyer, F. Wolff, C. Papachristou, Steve Clay","doi":"10.1109/IOLTS.2019.8854437","DOIUrl":"https://doi.org/10.1109/IOLTS.2019.8854437","url":null,"abstract":"Integrated Circuits (IC) are typically designed based on tradeoffs among performance, power and cost. Designers perceive electromigration as a failure mechanism or as a sign-off rule rather than as an additional tradeoff parameter. This paper describes a design methodology to perform tradeoffs driven by lifetime concerns due to electromigration.","PeriodicalId":383056,"journal":{"name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125375455","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
[IOLTS 2019 Title page] [IOLTS 2019标题页]
{"title":"[IOLTS 2019 Title page]","authors":"","doi":"10.1109/iolts.2019.8854443","DOIUrl":"https://doi.org/10.1109/iolts.2019.8854443","url":null,"abstract":"","PeriodicalId":383056,"journal":{"name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130265524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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