2010 5th International Conference on Future Information Technology最新文献_第9页

Wavelets Based Facial Expression Recognition Using a Bank of Neural Networks 基于小波的神经网络面部表情识别

2010 5th International Conference on Future Information Technology Pub Date : 2010-05-21 DOI: 10.1109/FUTURETECH.2010.5482717

S. B. Kazmi, Qurat-ul Ain, M. Jaffar

引用次数: 23

A Flexible Electrode Driver Using 65 nm CMOS Process for 1024-Electrode Epi-Retinal Prosthesis 采用65纳米CMOS工艺的柔性电极驱动器用于1024电极视网膜假体

2010 5th International Conference on Future Information Technology Pub Date : 2010-05-21 DOI: 10.1109/FUTURETECH.2010.5482677

N. Tran, J. Yang, S. Bai, E. Skafidas, I. Mareels, D. Ng, M. Halpern

引用次数: 4

Staggered-TCP for Parallel Split-Sessions across Multiple Proxies in Heterogeneous Networks 异构网络中跨多个代理并行分裂会话的交错tcp

2010 5th International Conference on Future Information Technology Pub Date : 2010-05-21 DOI: 10.1109/FUTURETECH.2010.5482728

S. Zafar, Sana Jabbar, A. Akbar, N. M. Sheikh

引用次数: 0

Image Restoration Using Modified Hopfield Fuzzy Regularization Method 基于改进Hopfield模糊正则化方法的图像恢复

2010 5th International Conference on Future Information Technology Pub Date : 2010-05-21 DOI: 10.1109/FUTURETECH.2010.5482736

M. Bilal, M. Sharif, M. Jaffar, Ayyaz Hussain, A. M. Mirza

引用次数: 6

Analysis of SRAM Reliability under Combined Effect of NBTI, Process and Temperature Variations in Nano-Scale CMOS 纳米级CMOS中NBTI、工艺和温度变化联合作用下SRAM可靠性分析

2010 5th International Conference on Future Information Technology Pub Date : 2010-05-21 DOI: 10.1109/FUTURETECH.2010.5482682

Harwinder Singh, H. Mahmoodi

{"title":"Analysis of SRAM Reliability under Combined Effect of NBTI, Process and Temperature Variations in Nano-Scale CMOS","authors":"Harwinder Singh, H. Mahmoodi","doi":"10.1109/FUTURETECH.2010.5482682","DOIUrl":"https://doi.org/10.1109/FUTURETECH.2010.5482682","url":null,"abstract":"As dimensions of MOS devices have been scaled down, new reliability problems are coming into effect. One of these emerging reliability issues is aging effects which result in device performance degradation over time. NBTI (Negative biased temperature instability) is a well known aging phenomenon which is a limiting factor for future scaling of devices. NBTI results in the generation of trapped charges which cause Vt (threshold voltage) degradation of PMOS. It is observed that a sharp Vt shift occurs in just a few seconds after turning on the MOSFET. In nano-scale CMOS technologies, process (threshold voltage) and temperature variations are also crucial reliability concerns. On the other hand, NBTI itself is dependent on temperature and threshold voltage. In this paper, the combined effect of NBTI, process and temperature variations on the reliability of the 6T SRAM (Static Random Access Memory) in 32nm CMOS technology is analyzed. It is observed that: (1) Vt abruptly increases initially and afterwards Vt shift is very small, even for prolonged time; (2) Low Vt transistors age faster than high Vt transistors; and (3) NBTI Vt degradation is more significant at higher temperature. Along with these observations, we also quantified our results in terms of number of faulty cells in SRAM array. It is observed that: (1) number of faulty cells rises over time (8.2% rise in faulty cells for the inter-die nominal Vt chip over 2 years) due to SNM degradation; (2) rise in the number of faulty cells over time due to write failures under NBTI effect is practically negligible; (3) Leakage (in the worst case condition) and access time are not impacted by NBTI.","PeriodicalId":380192,"journal":{"name":"2010 5th International Conference on Future Information Technology","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126875773","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 23

Utility of Gestural Cues in Indexing Semantic Miscommunication 手势线索在语义误解索引中的应用

2010 5th International Conference on Future Information Technology Pub Date : 2010-05-21 DOI: 10.1109/FUTURETECH.2010.5482653

Masashi Inoue, M. Ogihara, Ryoko Hanada, N. Furuyama

{"title":"Utility of Gestural Cues in Indexing Semantic Miscommunication","authors":"Masashi Inoue, M. Ogihara, Ryoko Hanada, N. Furuyama","doi":"10.1109/FUTURETECH.2010.5482653","DOIUrl":"https://doi.org/10.1109/FUTURETECH.2010.5482653","url":null,"abstract":"In multimedia data analysis, automated indexing of conversational video is an emerging topic. One challenging problem in this topic is the recognition of higher-level concepts, such as emph{miscommunications} in conversations. While detecting these miscommunications is generally easy for the speakers as well as for observers, it is not currently understood which cues contribute to their detection and to what extent. We investigate the possibility of indexing the occurrence of miscommunications in psychotherapeutic face-to-face conversations from gestural patterns. The applicability of machine learning is investigated as a means of detecting miscommunication from gestural patterns observed in the conversations. Both simple and complex classifiers are constructed using different features taken from the gesture data. Both short-term and long-term effects are tested using different time window sizes. Also, two types of gestures, communicative and non-communicative, are considered. The experimental results suggest that there emph{does not exist a single gestural feature} that can explain the occurrence of semantic miscommunication. Another interesting finding is that gestural cues correlate more with long-term gestural patterns than short-term ones.","PeriodicalId":380192,"journal":{"name":"2010 5th International Conference on Future Information Technology","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125871919","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

A Trustable Software with a Dynamic Loop Control Mechanism 一种具有动态回路控制机制的可信赖软件

2010 5th International Conference on Future Information Technology Pub Date : 2010-05-21 DOI: 10.1504/IJITCC.2012.045805

Nalinrat Srirajun, P. Bhattarakosol, P. Tantasanawong, Sunyoung Han

引用次数: 2

Virtualization, Is It Worth It? A Technical, Financial and Economic Approach 虚拟化，值得吗?技术、财政和经济方法

2010 5th International Conference on Future Information Technology Pub Date : 2010-05-21 DOI: 10.1109/FUTURETECH.2010.5482713

Errol A. Blake, Victor A. Clincy

引用次数: 2

Distributed Space-Time Code for Amplify-and-Forward Cooperative Networks 扩和转发合作网络的分布式空时码

2010 5th International Conference on Future Information Technology Pub Date : 2010-05-21 DOI: 10.1109/FUTURETECH.2010.5482702

A. Al-nahari, F. A. Abd El-Samie, M. Dessouky

引用次数: 3

Decentralized Fault Detection and Management for Wireless Sensor Networks 无线传感器网络的分散故障检测与管理

2010 5th International Conference on Future Information Technology Pub Date : 2010-05-21 DOI: 10.1109/FUTURETECH.2010.5482679

K. Man, Chen Chen, D. Hughes

引用次数: 7