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2020 Conference on Precision Electromagnetic Measurements (CPEM)最新文献

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Small mass realization in the new SI 小批量实现在新的SI
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191882
D. Haddad, P. Abbott, L. Chao, E. Mulhern, F. Seifert, S. Schlamminger, Z. Kubarych, D. Newell
{"title":"Small mass realization in the new SI","authors":"D. Haddad, P. Abbott, L. Chao, E. Mulhern, F. Seifert, S. Schlamminger, Z. Kubarych, D. Newell","doi":"10.1109/CPEM49742.2020.9191882","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191882","url":null,"abstract":"On November 16 2018, about 60 countries met in Versailles, France and voted to redefine the System of Units(SI) based on seven defining reference constants. Since May 20 2019, the unit of mass is realized based on three fundamental reference constants: the Planck constant $h$, the speed of light $c$, and the unperturbed ground state hyperfine transition frequency of the cesium 133 atom $Deltanu_{Cs}$. With this new definition of the unit of mass, scientists at the National Institute of Standards and Technology (NIST) realized masses in the range of 0.05 kg to 0.20 kg directly on the NIST primary realization, and compared the results to the traditional work-down. This abstract shows the advantage and the improvement in the measurement uncertainty of mass in the small range that was only possible after the redefinition.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128487799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Measurement Uncertainty of Beam Parameters Induced by Imbalances of Amplitude and Phase for Antenna Array 天线阵幅相不平衡引起的波束参数测量不确定度
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191714
Ke Liu, Xin Bian, Shaohua Wang, Haining Zhao
{"title":"Measurement Uncertainty of Beam Parameters Induced by Imbalances of Amplitude and Phase for Antenna Array","authors":"Ke Liu, Xin Bian, Shaohua Wang, Haining Zhao","doi":"10.1109/CPEM49742.2020.9191714","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191714","url":null,"abstract":"Antenna Array's Beamforms would be influenced by the imbalances of amplitude and phase in all channels. Monte Carlo Method (MCM) was adopted to simulate the beamforming pattern's variations induced by amplitude variations, phase variations and the both, respectively. Linear 8-element array beamforming with a series of amplitude variations and phase variations were simulated. An 8x8 butler matrix was also designed and used to synthesize beams. Results indicated that channels' phase variations affect the main lobe angle greatly than amplitude variations. The standard uncertainty of synthesized main lobe angle were less than 1° when the phase variation is 11.2°.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115911982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
AC Voltage Measurements in UME Kibble Balance UME基布天平中的交流电压测量
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191793
H. Ahmedov, R. Orhan, B. Korutlu, Özlen Tuncel
{"title":"AC Voltage Measurements in UME Kibble Balance","authors":"H. Ahmedov, R. Orhan, B. Korutlu, Özlen Tuncel","doi":"10.1109/CPEM49742.2020.9191793","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191793","url":null,"abstract":"Kibble Balance operating in National Metrology Institute of Turkey poses the advantage of testing Faraday's Law of Induction and Ampere's Law of Force in a single phase. Apart from many distinctive advantages of single phase measurement scheme, there is a tolerable disadvantage: AC Faraday's voltage induced by an oscillating magnet across the ends of the coil and DC voltage induced by a current passing through the coil should be measured simultaneously with high precision. DC voltage measurements are carried out by using traditional methods. AC voltage measurements, on the other hand, are performed by following the new dynamic-based measurement procedure developed in order to achieve a relative uncertainty of about some part of a billion.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116397898","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Welcome 欢迎
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/cpem49742.2020.9191908
E. Safra
{"title":"Welcome","authors":"E. Safra","doi":"10.1109/cpem49742.2020.9191908","DOIUrl":"https://doi.org/10.1109/cpem49742.2020.9191908","url":null,"abstract":"Welcome to the Joint NCSLI/CPEM 2020 virtual conference. The conference was initially scheduled to take place at the Gaylord Rockies Hotel and Convention Center in Aurora (near Denver), Colorado, USA from August 24 to August 28, 2020. Due to the COVID-19 pandemic and the travel restrictions in place at the time of the conference, the meeting was switched entirely to a virtual platform. The 2020 virtual conference contains two distinct technical programs, one for the NCSLI annual workshop and symposium and one for CPEM 2020. The CPEM technical program includes 241 contributions from 639 authors and co-authors. All presentations were granted a virtual oral presentation, consisting of a pre-recorded video that is available on-demand to all registered attendees. The CPEM presentations are grouped in 32 virtual sessions that will remain accessible until summer 2021. We would like to thank all the members of the technical program committee (TPC), the session chairs, and the extended paper guest editors for their major contributions to the CPEM 2020 program success.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115376388","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
CPEM Virtual Technical Program 虚拟技术程序
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/cpem49742.2020.9191782
{"title":"CPEM Virtual Technical Program","authors":"","doi":"10.1109/cpem49742.2020.9191782","DOIUrl":"https://doi.org/10.1109/cpem49742.2020.9191782","url":null,"abstract":"","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114102183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
New Generation Multijunction Thermal Converters at Sandia National Laboratories 桑迪亚国家实验室新一代多结热转换器
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191864
R. Johnson-Wilke, Aaron Meyrick, J. Dominguez, Karl Lukes, J. Stanford, S. Cular, Edward O'Brien
{"title":"New Generation Multijunction Thermal Converters at Sandia National Laboratories","authors":"R. Johnson-Wilke, Aaron Meyrick, J. Dominguez, Karl Lukes, J. Stanford, S. Cular, Edward O'Brien","doi":"10.1109/CPEM49742.2020.9191864","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191864","url":null,"abstract":"Multijunction thermal converters are routinely used at many primary standards laboratories for ac voltage measurements and calibrations. After nearly two decades of inactivity, the Primary Standards Laboratory at Sandia National Laboratories has reestablished the process of fabricating silicon based multijunction thermal converters. Initial results indicate the devices perform similarly to devices fabricated circa 2001 with ac-dc differences of less than $2 mu mathrm{V}/mathrm{V}$ over the frequency range of 20 Hz to 20 kHz. From 20 kHz to 1 MHz, the ac-dc difference was higher, but remained below $200 mu mathrm{V}/mathrm{V}$. In addition to presenting these results, new design considerations, such as high-resistivity substrates for high-frequency applications, are discussed.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"194 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114432909","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design of the Kibble balance for the QEMMS QEMMS基布尔天平的设计
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191852
R. Marangoni, D. Haddad, F. Seifert, L. Chao, J. Pratt, D. Newell, S. Schlamminger
{"title":"Design of the Kibble balance for the QEMMS","authors":"R. Marangoni, D. Haddad, F. Seifert, L. Chao, J. Pratt, D. Newell, S. Schlamminger","doi":"10.1109/CPEM49742.2020.9191852","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191852","url":null,"abstract":"The design status of the Kibble balance for the Quantum Electro-Mechanical Metrology Suite is provided. The balance is being developed with the objective to obtain a simple and robust design while performing high precision measurements. Aspects related to the vacuum vessel and balance mechanism are described. This includes some design information and simulation results.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"170 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122020489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Photodiode Calibration Comparison between Electro-Optic Sampling and Heterodyne Measurements up to 75 GHz 光电二极管校准比较电光采样和外差测量高达75 GHz
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191871
A. Feldman, J. Jargon, T. Dennis, P. Hale
{"title":"Photodiode Calibration Comparison between Electro-Optic Sampling and Heterodyne Measurements up to 75 GHz","authors":"A. Feldman, J. Jargon, T. Dennis, P. Hale","doi":"10.1109/CPEM49742.2020.9191871","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191871","url":null,"abstract":"We present the comparison of a photodiode's measured frequency response calibrated with an electro-optic sampling system and a heterodyne system up to 75 GHz, along with the systems' respective 95% confidence intervals. A brief description of each system and its known sources of uncertainties are provided. The two systems agree to within their respective uncertainties at most frequencies.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"AES-23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126556318","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Frequency-Domain Sampling Theorem-based Harmonic Phasor Estimator 基于频域采样定理的谐波相量估计
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191910
Lei Chen, Wei Zhao, Dongfang Zhao, Songling Huang
{"title":"Frequency-Domain Sampling Theorem-based Harmonic Phasor Estimator","authors":"Lei Chen, Wei Zhao, Dongfang Zhao, Songling Huang","doi":"10.1109/CPEM49742.2020.9191910","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191910","url":null,"abstract":"So far, an accurate and applicable harmonic phasor estimator for power system monitoring is still missing. To address this problem, this paper proposes a harmonic phasor estimator based on the frequency-domain sampling theorem. Dynamic harmonic phasors are modeled by complex exponential functions. Simulation tests show that the proposed method is more accurate and more applicable than the sinc interpolation functions-based algorithm. A theoretical analysis is also presented to discuss the harmonic phasor estimation errors under ideal conditions.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123698809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Deposition of tantalum nitride films as the absorption load resistor for microwave power standard chips 氮化钽薄膜作为微波功率标准芯片吸收负载电阻的沉积
2020 Conference on Precision Electromagnetic Measurements (CPEM) Pub Date : 2020-08-01 DOI: 10.1109/CPEM49742.2020.9191712
Jian Chen, Jinjin Li, Huifang Gao, Yingqian Gao, Zheng Liu, Q. Zhong, Y. Zhong, Xiaolong Xu, Xueshen Wang
{"title":"Deposition of tantalum nitride films as the absorption load resistor for microwave power standard chips","authors":"Jian Chen, Jinjin Li, Huifang Gao, Yingqian Gao, Zheng Liu, Q. Zhong, Y. Zhong, Xiaolong Xu, Xueshen Wang","doi":"10.1109/CPEM49742.2020.9191712","DOIUrl":"https://doi.org/10.1109/CPEM49742.2020.9191712","url":null,"abstract":"Tantalum nitride (TaN) thin films with wide resistivity range, low temperature coefficient of resistance and high stability have been widely used as the microwave absorption load resistance for microwave power sensor chips. TaN films on Si/SiO2 substrates were synthesized using a DC reaction magnetron sputtering process at 1.33 Pa with 20 cm3/min Ar and different flow rates of N2 and sputtering power. The deposition rate, resistivity and microstructure of TaN films were investigated.","PeriodicalId":373216,"journal":{"name":"2020 Conference on Precision Electromagnetic Measurements (CPEM)","volume":"235 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122448551","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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