Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004.最新文献_第9页

Single board impedance analyzer and transient analysis of QCR sensor response 单板阻抗分析仪及QCR传感器响应的瞬态分析

Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004. Pub Date : 2004-08-23 DOI: 10.1109/FREQ.2004.1418569

R. Schaefer, S. Doerner, R. Lucklum, P. Hauptmann

引用次数: 7

Measurements of the viscosity tensor components of langatate 语言酯粘度张量分量的测量

Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004. Pub Date : 2004-08-23 DOI: 10.1109/FREQ.2004.1418537

G. Mansfeld, S. Alekseev, I. Kotelyanskii, V. V. Kludzin, Yu. V. Pisarevskiĭ, N. Polzikova, V. Veretin

引用次数: 1

Development of thin film getters for assuring high reliability and long lifetime to crystal oscillators 为保证晶体振荡器的高可靠性和长寿命而研制的薄膜吸收体

Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004. Pub Date : 2004-08-23 DOI: 10.1109/FREQ.2004.1418544

M. Amiotti, M. Moraja, A. Conte

引用次数: 3

Lattice damages in quartz crystal blanks influence on the resonator properties and on the X-ray measurement 石英晶体坯中晶格损伤对谐振腔性质和x射线测量的影响

Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004. Pub Date : 2004-08-23 DOI: 10.1109/FREQ.2004.1418437

E. Seydel, H. Berger, G. Hildebrandt, H. Bradaczek

引用次数: 2

A fast analysis of vibrations of crystal plates for resonator design applications 用于谐振器设计的晶体板振动的快速分析

Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004. Pub Date : 2004-08-23 DOI: 10.1109/FREQ.2004.1418527

Ji Wang, Wenhua Zhao, Tingshan Bian

引用次数: 8

Materials property dependence of the effective electromechanical coupling coefficient of thin film bulk acoustic resonators 薄膜体声谐振器有效机电耦合系数对材料特性的依赖性

Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004. Pub Date : 2004-08-23 DOI: 10.1109/FREQ.2004.1418422

Qingming Chen, Tongying Shun, Qing-Ming Wang

{"title":"Materials property dependence of the effective electromechanical coupling coefficient of thin film bulk acoustic resonators","authors":"Qingming Chen, Tongying Shun, Qing-Ming Wang","doi":"10.1109/FREQ.2004.1418422","DOIUrl":"https://doi.org/10.1109/FREQ.2004.1418422","url":null,"abstract":"The input electric impedance, Z/sub /spl omega//, for a three-layer (electrode/piezoelectric film/electrode) and a four layer (electrode/piezoelectric film/electrode/substrate) thin film bulk acoustic wave resonator, is derived by a one-dimensional transfer matrix method to describe the thin film resonator behavior, especially the effect of electrode and substrate layers on resonator properties. Based on the impedance spectra, the effective coupling coefficient, k/sub eff//sup 2/, of a thin film resonator can be evaluated with respect to the resonator structure and thin film properties. The calculation results for both AlN and PZT thin film resonators reveal that the mechanical Q factor of the thin film piezoelectric material has a significant effect on the k/sub eff//sup 2/ of the device. k/sub eff//sup 2/ decreases with the increase of the mechanical quality factor, Q, and reaches a stable value when the Q value is sufficiently high. k/sub eff//sup 2/ is also dependent on the thickness and material properties of the electrode and substrates. For a specific electrode material, a maximum value can be obtained at an appropriate electrode/piezoelectric layer thickness ratio. The frequency temperature stability of thin film resonators is also evaluated with respect to the resonator structure and material properties.","PeriodicalId":369162,"journal":{"name":"Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004.","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117024079","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Methodology of design of electronic circuit oscillators for QCM sensors in liquid media 液体介质中QCM传感器电路振荡器的设计方法

Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004. Pub Date : 2004-08-23 DOI: 10.1109/FREQ.2004.1418570

L. Rodríguez-Pardo, J. Fariña, C. Gabrielli, H. Perrot, R. Brendel

引用次数: 8

The method for integrating FBAR with circuitry on CMOS chip 在CMOS芯片上集成FBAR与电路的方法

Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004. Pub Date : 2004-08-23 DOI: 10.1109/FREQ.2004.1418520

Po-Hsun Sung, C. Fang, P. Chang, Y. Chin, Pei-Yen Chen

引用次数: 16

A MEMS-based quartz resonator technology for GHz applications 一种基于mems的GHz应用石英谐振器技术

Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004. Pub Date : 2004-08-23 DOI: 10.1109/FREQ.2004.1418425

F. P. Stratton, D. Chang, D. Kirby, R. Joyce, T. Hsu, R. Kubena, Y. Yong

引用次数: 42

Cylindrical distributed Bragg reflector resonators with extremely high Q-factors 具有极高q因子的圆柱形分布布拉格反射腔

Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004. Pub Date : 2004-08-23 DOI: 10.1109/FREQ.2004.1418462

M. Tobar, J. Hartnett, J. Le Floch, D. Cros

{"title":"Cylindrical distributed Bragg reflector resonators with extremely high Q-factors","authors":"M. Tobar, J. Hartnett, J. Le Floch, D. Cros","doi":"10.1109/FREQ.2004.1418462","DOIUrl":"https://doi.org/10.1109/FREQ.2004.1418462","url":null,"abstract":"A simple non-Maxwellian method is presented that allows the approximate solution of all the dimensions of a multilayered dielectric TE/sub 0qp/ mode cylindrical resonant cavity that constitutes a distributed Bragg reflection (DBR) resonator. The analysis considers an arbitrary number of alternating dielectric and free space layers of cylindrical geometry enclosed by a metal cylinder. The layers may be arranged axially, radially or both. Given only the aspect ratio of the cavity, the desired frequency and the dielectric constants of the material layers, the relevant dimensions are determined from only a set of simultaneous equations, and iterative techniques are not required. The formulas were verified using rigorous method of lines (MoL) calculations, and previously published experimental work. We show that the simple approximation gives dimensions close to the values of the optimum Bragg reflection condition determined by the rigorous analysis. The resulting solution is more compact with a higher Q-factor when compared to other reported cylindrical DBR structures. This is because, unlike previous analyses, it properly takes into account the effect of the aspect ratio on the Bragg anti-resonance condition along the z-axis of the resonator. By properly taking the aspect ratio into account, we show that the thickness of the Bragg reflectors is equivalent to the thickness of plane wave Bragg reflectors (or quarter wavelength plates). Thus it turns out that the sizes of the reflectors are related to the free space propagation constant, rather than the propagation constant in the z direction.","PeriodicalId":369162,"journal":{"name":"Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004.","volume":"198 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124445853","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2