1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century最新文献_第9页

QSI's integrated diagnostics toolset QSI的集成诊断工具集

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century Pub Date : 1997-09-22 DOI: 10.1109/AUTEST.1997.633654

Sagarmay Deb, K. Pattipati, R. Shrestha

引用次数: 63

Applying software process to Virtual Instrument based test program set development 应用软件流程开发基于虚拟仪器的测试程序集

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century Pub Date : 1997-09-22 DOI: 10.1109/AUTEST.1997.633610

D. Rabe, J. Miller

{"title":"Applying software process to Virtual Instrument based test program set development","authors":"D. Rabe, J. Miller","doi":"10.1109/AUTEST.1997.633610","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633610","url":null,"abstract":"Virtual Instrument (VI) based test program development systems, as exemplified by National Instruments' LabVIEW, provide very powerful design capture fools that allow the test program set (TPS) developer to rapidly prototype test strategies. As usual, in great power lies danger. In this case the danger is the ease of which VIs are reused. While code reuse is a desired feature, unintentional modifications to common VIs, name clashes, and library corruption are all potential headaches resulting from uncontrolled changes to VIs stored in shared libraries. Undetected \"Spontaneous Upgrades\" to library components can ruin a maintainer's day when the program loads with broken wires. Developing quality software requires software quality. This paper provides recommended practices to address the Key Practice Areas (KPAs) defined in the Software Engineering Institute's (SEI) Capability Maturity Model (CMM) in the context of TPS development in LabVIEW. Repository management procedures such as check-in check-out and change tracking and documentation are described.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126017045","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Integrating manufacturing test strategy with manufacturing production strategy 整合制造测试策略与制造生产策略

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century Pub Date : 1997-09-22 DOI: 10.1109/AUTEST.1997.633651

R. Mahoney

{"title":"Integrating manufacturing test strategy with manufacturing production strategy","authors":"R. Mahoney","doi":"10.1109/AUTEST.1997.633651","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633651","url":null,"abstract":"The foundation of what is known as agile competition is beginning to unfold. Rather than offering the customer a plethora of different options from which to choose, the customer works with the producer to arrive at solutions to the customer's specific problem. Information and services become a significant part of the product sold. Agile competition represents a significant departure from the lean manufacturing environments that exist today. The economics of production will no longer be defined in terms of being the low cost producer. What has emerged is on inescapable evolution to high-mix, low-volume manufacturing. An effective and efficient test strategy is critical to profitably meeting the responsiveness and delivery performance challenges of a dynamic agile, high-mix, low-volume electronics manufacturing environment. Test strategy objectives must align in on integrated way with the overall objectives established at the highest level of a manufacturing organization. In this regard, a manufacturing operations model is a competitive imperative. A manufacturing operations model will greatly assist management in gaining a better understanding of problems and serve as a focal point for systematic discussion of objectives and alternatives. Fundamental to the establishment of a sound manufacturing test strategy is the measurement of and understanding of the relevant dimensions of flexibility and complexity. Reductions in complexity coupled with increased flexibility (e.g., mix, volume) can offer competitive advantages in cost, quality, responsiveness and delivery performance for a high-mix low-volume electronics manufacturer. Various test strategy choices and the relevant issues pertaining to their use will be presented for the different types of manufacturing environments that con be encountered.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129135321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

AUTOTESTCON 1997 GDE systems 437th AW Guidance and Control success story AUTOTESTCON 1997 GDE系统第437 AW制导和控制成功的故事

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century Pub Date : 1997-09-22 DOI: 10.1109/AUTEST.1997.633548

W. Allen, S. Larue, T. Saindon

引用次数: 0

The Common Munitions BIT Reprogramming Equipment: a management update 通用弹药BIT重新编程设备:管理更新

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century Pub Date : 1997-09-22 DOI: 10.1109/AUTEST.1997.633616

S. Preiss, A. Mirabile

引用次数: 0

Software reuse for hydraulic component test stands: a case study 液压元件试验台的软件重用:一个案例研究

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century Pub Date : 1997-09-22 DOI: 10.1109/AUTEST.1997.633691

R. Rutkowski

引用次数: 0

Development of a high speed data acquisition system based on LabVIEW(R) and VXI(R) 基于LabVIEW(R)和VXI(R)的高速数据采集系统的开发

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century Pub Date : 1997-09-22 DOI: 10.1109/AUTEST.1997.633633

R.L. Deichert, D. Burris, J. Luckemeyer

{"title":"Development of a high speed data acquisition system based on LabVIEW(R) and VXI(R)","authors":"R.L. Deichert, D. Burris, J. Luckemeyer","doi":"10.1109/AUTEST.1997.633633","DOIUrl":"https://doi.org/10.1109/AUTEST.1997.633633","url":null,"abstract":"The collection of high speed, multi-channel test data in a VXI environment can be challenging, especially when the number of input channels is large and data processing is required for analysis of the test data. This paper describes a data acquisition system which was designed to acquire performance data on the Minuteman III MK12/W62 Re-entry Vehicle Nuclear Weapon Sub-System, as the Sub-System is functionally tested in a simulated flight test environment. The testing requires the simultaneous measurement of 53 channels of digital and analog data with a cumulative data capture rate of 100 kHz. The data is used to evaluate the reliability of the test specimen, using a post-processing algorithm. To further complicate the acquisition and post-test processing, the signals under measurement are interrelated in that some signals act as triggering events for other signals. The solution presented in this paper is a VXI-based data acquisition instrument operating with a PC running a LabVIEW(R) application while using an MXI interface for data transfer between the VXI and PC buses. The software element of this system uses a uniquely developed data analysis tool. The analysis tool, named Data Score/sup TM/, is programmed in a scripting language to allow test engineers the ability to define signal interrelations and data processing algorithms. The graphical user interface provides a flexible ability to view either post-test or archived data.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115472448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 11

CEDS alternatives: a commercial off the shelf approach to the organizational and intermediate level engine testing and diagnostics CEDS替代方案:用于组织和中级发动机测试和诊断的商业现成方法

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century Pub Date : 1997-09-22 DOI: 10.1109/AUTEST.1997.633679

W. A. Stanley

引用次数: 0

Military automatic test systems acquisition-the Navy Requirements Officer perspective 军用自动测试系统的获取——海军需求官的观点

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century Pub Date : 1997-09-22 DOI: 10.1109/AUTEST.1997.633627

S. Paul, C. Davis

引用次数: 0

Aircraft Stores Interface Manual (ASIM) adopts Paperless Information Technology 飞机库房界面手册(ASIM)采用无纸化信息技术

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century Pub Date : 1997-09-22 DOI: 10.1109/AUTEST.1997.633547

J.A.G. Rochin, A. Roderick

引用次数: 0