2015 Fifth International Conference on Advances in Computing and Communications (ICACC)最新文献

2.6 GHz Planar Dipole Antenna over High Impedance Surface 高阻抗表面上的2.6 GHz平面偶极子天线

2015 Fifth International Conference on Advances in Computing and Communications (ICACC) Pub Date : 2015-09-01 DOI: 10.1109/ICACC.2015.24

B. Rahul, V. A. Libi Mol, Biju Gopal, S. Prakash, C. Aanandan

引用次数: 0

Design Space Exploration of 14nm Gate All around MOSFET 围绕MOSFET的14nm栅极设计空间探索

2015 Fifth International Conference on Advances in Computing and Communications (ICACC) Pub Date : 2015-09-01 DOI: 10.1109/ICACC.2015.76

Rafeek Alas, K. Bailey

{"title":"Design Space Exploration of 14nm Gate All around MOSFET","authors":"Rafeek Alas, K. Bailey","doi":"10.1109/ICACC.2015.76","DOIUrl":"https://doi.org/10.1109/ICACC.2015.76","url":null,"abstract":"As semiconductor device geometry scales down, the Short Channel Effects (SCE) are dominating. To reduce the SCE, gate oxide thickness is reduced. This leads to increase in gate leakage current. To overcome the SCE and to control the gate leakage current, Gate All Around (GAA) structure is proposed with optimum values of fin dimensions and thickness of the gate oxide. The performance of GAA MOSFET with gate oxide HfO2 are simulated and compared with conventional gate oxide SiO2 for the same Effective Oxide Thickness (EOT) and fin dimensions. It has been shown here that the performance of the GAA structure with HfO2 as gate dielectric is comparable with the performance of the optimized GAA structure with the traditional SiO2 dielectric. According to International Technology Roadmap for Semiconductors (ITRS), the EOT for gate lengths below 9.7nm is less than 0.6nm. It becomes very difficult to maintain a thin interfacial layer of SiO2 of around 0.5nm along with High K such as HfO2, in turn it leads to increase in manufacturing complexity and cost. The threshold voltage gets affected as thickness of the gate oxide varies, but the proposed GAA structure has wrap around gate structure and thin fin width(height), which makes better electrostatic control over the channel, hence effect on the threshold voltage shift is nullified. All the simulations are performed using the 3D Sentaurus TCAD Device simulator. Here, we are concluding that proposed device structure has better performance over nominal structure with gate oxide HfO2.","PeriodicalId":368544,"journal":{"name":"2015 Fifth International Conference on Advances in Computing and Communications (ICACC)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117145041","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Design Defect Diagnosis in a Buggy Model of SPARC T1 Processor Using Random Test Program Generator 基于随机测试程序生成器的SPARC T1处理器bug模型设计缺陷诊断

2015 Fifth International Conference on Advances in Computing and Communications (ICACC) Pub Date : 2015-09-01 DOI: 10.1109/ICACC.2015.80

K. Brijmohan, Nutan Hegde, Lekha Pankaj

{"title":"Design Defect Diagnosis in a Buggy Model of SPARC T1 Processor Using Random Test Program Generator","authors":"K. Brijmohan, Nutan Hegde, Lekha Pankaj","doi":"10.1109/ICACC.2015.80","DOIUrl":"https://doi.org/10.1109/ICACC.2015.80","url":null,"abstract":"Verification has indisputably become the primary challenge today with recent industry studies estimating that half of all chips manufactured require one or more re-spins. Ideally the performance of the design should be verified for all possible circumstances under which it might be operated in the real world. Unfortunately, it requires a long time to generate and run test sequences. Under the time to market pressure, it is very time consuming to write all test programs manually. This brings about the necessity of developing a random test program generator (RTPG). Proposed RTPG is for verifying the SPARC processor architecture. The approach is in classifying general type of bugs that can get into the EXU unit of SPARC T1 processor design and introducing design defects in the RTL. Several defective models are developed covering the entire functional blocks in the EXU and several coverage models for the test cases run on the defective design were also developed. The direct and random test case generation is applied on the buggy model and various coverage reports are analyzed. This work tends to look back at the fact that verification is a process that is never truly complete. We understand that designs are error-prone and so, the objective of verification is to detect the errors. Yet, no one can really prove that the design is error-free.","PeriodicalId":368544,"journal":{"name":"2015 Fifth International Conference on Advances in Computing and Communications (ICACC)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127249616","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Microwave Sensor Antenna for Soil Moisture Measurement 用于土壤湿度测量的微波传感器天线

2015 Fifth International Conference on Advances in Computing and Communications (ICACC) Pub Date : 2015-09-01 DOI: 10.1109/ICACC.2015.92

A. S. Pathma Priyaa, Adil Mohammed, C. Ambili, N. S. Anusree, Anne Varghese Thekekara, R. Mohan, S. Mridula

引用次数: 6

A General Approach for Color Feature Extraction of Microorganisms in Urine Smear Images 尿液涂片图像中微生物颜色特征提取的一般方法

2015 Fifth International Conference on Advances in Computing and Communications (ICACC) Pub Date : 2015-09-01 DOI: 10.1109/ICACC.2015.44

Shaeez Usman Abdulla, Hridya T G, Vrinda V. Nair

引用次数: 3

Shot Boundary Detection Using Structural Similarity Index 基于结构相似指数的镜头边界检测

2015 Fifth International Conference on Advances in Computing and Communications (ICACC) Pub Date : 2015-09-01 DOI: 10.1109/ICACC.2015.94

Index Srilakshmi

{"title":"Shot Boundary Detection Using Structural Similarity Index","authors":"Index Srilakshmi","doi":"10.1109/ICACC.2015.94","DOIUrl":"https://doi.org/10.1109/ICACC.2015.94","url":null,"abstract":"Shot boundary detection (SBD) is the first step towards video indexing and content based video management. Due to availability of low cost storage media devices, and broadband data connection, digital videos are becoming widely used. However, the increasing availability of digital video has not been accompanied by an increase in its ease of accessibility. If we want to see a clip of interest, we have to sequentially browse through the video. This is an extremely time consuming and tedious process. So, accurate shot boundary detection plays vital role to organize video contents into meaningful parts for video scene analysis. A shot is defined as an unbroken sequence of frames taken from camera. Shot transitions can be either abrupt (cut) or gradual (fades, dissolves, wipes). In this paper, a new shot boundary detection (SBD) method is proposed using Structural SIMilarity (SSIM) Index. The abrupt cuts are identified using SSIM and gradual transitions(fades) are identified using standard deviation plot of the frames in the video. The proposed method only needs mean, standard deviation and co-variance of the frames as basic input parameters for detecting cuts and gradual transitions. The performance of the proposed method is comparable with that of the existing global and local histogram method for SBD.","PeriodicalId":368544,"journal":{"name":"2015 Fifth International Conference on Advances in Computing and Communications (ICACC)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123775674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Comparative Analysis on Surface Coil for 1.5T MRI Scanner 1.5T MRI扫描仪表面线圈的对比分析

2015 Fifth International Conference on Advances in Computing and Communications (ICACC) Pub Date : 2015-09-01 DOI: 10.1109/ICACC.2015.98

Abhay M. Morey, S. Bhujade, Tapas K. Bhuiya, S. Thakur, T. Pandey

引用次数: 1

Forecasting of Significant Wave Height Using Support Vector Regression 利用支持向量回归预测显著波高

2015 Fifth International Conference on Advances in Computing and Communications (ICACC) Pub Date : 2015-09-01 DOI: 10.1109/ICACC.2015.109

Ajeesh K, Chandra Paresh, Deka

引用次数: 4

Implementation of Block Diagonalization Type Precoding Algorithms for IEEE 802.11ac Systems 块对角化预编码算法在IEEE 802.11ac系统中的实现

2015 Fifth International Conference on Advances in Computing and Communications (ICACC) Pub Date : 2015-09-01 DOI: 10.1109/ICACC.2015.59

Ishhanie Majumdar

引用次数: 3

Triangular Patch Bandstop Filter for Wireless Communication Applications 用于无线通信的三角形贴片带阻滤波器

2015 Fifth International Conference on Advances in Computing and Communications (ICACC) Pub Date : 2015-09-01 DOI: 10.1109/ICACC.2015.70

M. Vikas, A. Harikrishnan, S. Mridula

引用次数: 0