2019 3rd International Conference on Circuits, System and Simulation (ICCSS)最新文献_第6页

Simulation and Calculation Method of Total Ionizing Dose Radiation Resistance of Aerospace Components based on in-Orbit Data 基于在轨数据的航天部件总电离剂量辐射抗力仿真与计算方法

2019 3rd International Conference on Circuits, System and Simulation (ICCSS) Pub Date : 2019-06-01 DOI: 10.1109/CIRSYSSIM.2019.8935615

He Lv, Hongwei Zhang, B. Mei, Yi Sun, Qingkui Yu

{"title":"Simulation and Calculation Method of Total Ionizing Dose Radiation Resistance of Aerospace Components based on in-Orbit Data","authors":"He Lv, Hongwei Zhang, B. Mei, Yi Sun, Qingkui Yu","doi":"10.1109/CIRSYSSIM.2019.8935615","DOIUrl":"https://doi.org/10.1109/CIRSYSSIM.2019.8935615","url":null,"abstract":"In this paper, a simulation method for the total ionizing dose resistance of aerospace components based on in-orbit empirical data is presented. Firstly, according to the overall layout of the whole satellite, a three-dimensional equivalent model of internal radiation shielding is established. Then, combined with the space radiation model of the earth radiation belt and the orbit and flight time of the whole satellite, dose-depth curves are given to calculate the transport capacity of particles through different material thicknesses. Finally, based on ray tracing and Monte Carlo simulation method, the satellite is completed by FASTRAD software. The three-dimensional quantitative calculation of internal radiation dose gives the specific anti-total dose radiation capability of components. In this paper, a three-dimensional equivalent model of radiation shielding in satellite is used to calculate the cumulative radiation dose of components. Through this method, the specific index of total ionizing dose radiation resistance of on-orbit empirical data device can be given, which is convenient for the device to continue to be used in other models, and provides an important guarantee for reducing ground radiation resistance verification test, saving cost and shortening the quality assurance period of aerospace devices in the future.","PeriodicalId":367267,"journal":{"name":"2019 3rd International Conference on Circuits, System and Simulation (ICCSS)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125213223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}