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1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)最新文献

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Dynamic front-end accessory loading control system for laboratory vehicle simulation 实验室车辆前端附件动态加载控制系统仿真
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) Pub Date : 1998-08-24 DOI: 10.1109/AUTEST.1998.713450
G. L. Tuggle
{"title":"Dynamic front-end accessory loading control system for laboratory vehicle simulation","authors":"G. L. Tuggle","doi":"10.1109/AUTEST.1998.713450","DOIUrl":"https://doi.org/10.1109/AUTEST.1998.713450","url":null,"abstract":"The ability to simulate customer usage accurately in the laboratory during the design process is important to the rapid and cost effective development of world-class automotive powertrain packages. The key in early laboratory powertrain development is the need to accurately simulate torque consumption characteristics of the front-end accessories. The Dynamic FEAD loading control system provides the test engineer with the control of the air-conditioning compressor clutch, air-conditioning discharge and suction pressures, power-steering pump pressure and temperature, and alternator current. It is a portable system that is easy to install and operate. The system is the product of an intensive development project to identify the appropriate system requirements and a control system design to properly addresses the wide spectrum of dynamic loads encountered during vehicle operation. This paper describes the fundamental system design, host integration, and the current automotive testing applications.","PeriodicalId":367253,"journal":{"name":"1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115223788","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Prototyping a diagnostic interface 诊断界面原型设计
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) Pub Date : 1998-08-24 DOI: 10.1109/AUTEST.1998.713457
J. Sheppard, W. Simpson
{"title":"Prototyping a diagnostic interface","authors":"J. Sheppard, W. Simpson","doi":"10.1109/AUTEST.1998.713457","DOIUrl":"https://doi.org/10.1109/AUTEST.1998.713457","url":null,"abstract":"The ARI is planning to prototype several potential interface implementations related to TPS transportability and interoperability. For the diagnostic interface, examination of available commercial standards has identified only one viable candidate-IEEE Std 1232, AI-ESTATE (Artificial Intelligence Exchange and Service Tie to All Test Environments) and its component standards. In this paper, we will discuss how to apply the AI-ESTATE standards to satisfy the diagnostic interface requirements for an ARI prototype.","PeriodicalId":367253,"journal":{"name":"1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127382116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Building hardware-independent test systems with IVI 用IVI构建独立于硬件的测试系统
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) Pub Date : 1998-08-24 DOI: 10.1109/AUTEST.1998.713472
J. Pasquarette
{"title":"Building hardware-independent test systems with IVI","authors":"J. Pasquarette","doi":"10.1109/AUTEST.1998.713472","DOIUrl":"https://doi.org/10.1109/AUTEST.1998.713472","url":null,"abstract":"Interchangeable Virtual Instrument (IVI) drivers are an exciting new technology that enables test engineers to reuse their test programs with different instruments. IVI drivers are based on VXIplug&play technology, so users of LabVIEW, LabWindows/CVI, Visual Basic, Visual C++, and any other programming environments capable of calling DLL-based VXIplug&play-style drivers can use IVI drivers. This paper outlines the theory, tools, and mechanisms involved in using these tools to build a hardware-independent test system.","PeriodicalId":367253,"journal":{"name":"1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128205073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Automated test pattern generation for VHDL codes of VLSI chips VLSI芯片VHDL代码的自动测试模式生成
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) Pub Date : 1998-08-24 DOI: 10.1109/AUTEST.1998.713514
K. Dobson, E. S. Brooks
{"title":"Automated test pattern generation for VHDL codes of VLSI chips","authors":"K. Dobson, E. S. Brooks","doi":"10.1109/AUTEST.1998.713514","DOIUrl":"https://doi.org/10.1109/AUTEST.1998.713514","url":null,"abstract":"Summary form only given, as follows. This paper introduces a methodology for automated test pattern generation (ATPG) for VHDL codes of VLSI chips. A VHDL specification of a VLSI chip can be modeled as a data flow graph based EFSM (Extended Finite State Machine). The EFSM model is then checked for any of the three types of defined consistencies. Techniques available for finite state machines (FSM) testing can then be used to generate test patterns for the consistent EFSM model (with all inconsistencies detected and removed). Algorithms are being developed and coded for detection and removal of inconsistencies and for optimized test pattern generation for the consistent EFSM. Examples are used to introduce and explain the processes, algorithms and tools used in this project.","PeriodicalId":367253,"journal":{"name":"1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129638321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The hidden crisis in test effectiveness 测试有效性的隐性危机
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) Pub Date : 1998-08-24 DOI: 10.1109/AUTEST.1998.713421
J. Scully
{"title":"The hidden crisis in test effectiveness","authors":"J. Scully","doi":"10.1109/AUTEST.1998.713421","DOIUrl":"https://doi.org/10.1109/AUTEST.1998.713421","url":null,"abstract":"The sophistication and complexity of avionic, and other, prime systems has been growing at a pace that has not been matched by commensurate improvements in test technology. The result is NFF (no fault found) and other test effectiveness deficiencies that will soon, if they have not already, reach crisis levels. This pending crisis is all the more serious because it tends to be hidden by a variety of technical, administrative and commercial factors that often mask the real problems, and that sometimes even hinder the measures needed to correct them. Corrective action requires recognition of the true nature of test effectiveness deficiencies, the paradigms and processes with which they are associated, and the changes required to keep pace with modern prime system technology, maintenance requirements and safety objectives.","PeriodicalId":367253,"journal":{"name":"1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121465557","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Portable maintenance aid instrument pack (PIP) 便携式维修辅助工具包(PIP)
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) Pub Date : 1998-08-24 DOI: 10.1109/AUTEST.1998.713452
M. Gooding, S. DeSantis
{"title":"Portable maintenance aid instrument pack (PIP)","authors":"M. Gooding, S. DeSantis","doi":"10.1109/AUTEST.1998.713452","DOIUrl":"https://doi.org/10.1109/AUTEST.1998.713452","url":null,"abstract":"Flight line component false removals are costly and add to the logistics tail of every weapon system. VXI offers opportunity to consolidate test needs into a user-friendly application that can significantly reduce flight line false removal rates. VXI has grown substantially in applications from testing in the lab to field support of weapon systems. Early criticism of VXI came that it was only intended for lab or depot environments. Recently, developers have been taking on the challenge of extending VXI use into field environments. This paper addresses false removals, describes a VXI test system approach, and describes the challenges of creating an enclosure for COTS VXI instruments that protect them from very harsh flight-line environmental extremes. This effort was accomplished for the RAH-66 Comanche Helicopter program, and has created two working prototypes.","PeriodicalId":367253,"journal":{"name":"1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114880575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
The Year 2000 impact on automated testing 2000年对自动化测试的影响
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) Pub Date : 1998-08-24 DOI: 10.1109/AUTEST.1998.713513
Wanda Eaken, G. Hitt
{"title":"The Year 2000 impact on automated testing","authors":"Wanda Eaken, G. Hitt","doi":"10.1109/AUTEST.1998.713513","DOIUrl":"https://doi.org/10.1109/AUTEST.1998.713513","url":null,"abstract":"Both the US military and industry rely on automatic testing to verify the quality of manufacture and repair. Many testers still rely on computers designed and manufactured in the early 1980's. This includes systems using embedded controllers. Year 2000 problems can surface in computer operating systems, compilers, test programs, and in embedded systems. Until the impact of the Y2K \"bug\" is addressed, the risk of test program failure is unknown in most legacy automatic test systems. Problems may include embedded controllers in proprietary designs, old operating systems, and unique test program code. This paper addresses the potential problem areas in automatic testing, and suggests an approach for determining the best course of action. In order to evaluate the impact, a complete systems inventory must be done to identify all potential sources of problems. Little attention has been paid to the legacy automated test systems and the potential impact of the Y2K problem on such systems. Although newer systems are less likely to be affected no one can be sure until a complete inventory and test has been accomplished.","PeriodicalId":367253,"journal":{"name":"1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115806583","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The fault recording and reporting method 故障记录和上报方法
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) Pub Date : 1998-08-24 DOI: 10.1109/AUTEST.1998.713480
M. Sudolsky
{"title":"The fault recording and reporting method","authors":"M. Sudolsky","doi":"10.1109/AUTEST.1998.713480","DOIUrl":"https://doi.org/10.1109/AUTEST.1998.713480","url":null,"abstract":"The patent-pending Fault Recording and Reporting Method uses a large amount of diverse information output from various line-replaceable units (LRUs) and other components of the aircraft during a mission through bulk storage on electronic media. After the aircraft lands, the electronic media are removed, accessed by an appropriate apparatus, and presented in a format that can be read with a personal computer (PC). This information provides the user, typically a service technician, with information relating to the aircraft's flight; specifically, various fault indications provided by LRUs and other components. From this information, the service technician can determine whether or not a fault indication recorded during the flight is a legitimate fault requiring removal of the affected LRU or component for further diagnostic testing. The method significantly reduces incidents of no-fault-found (NFF) diagnostic test results and saves labor hours that would otherwise be spent testing properly operating LRUs and components. The method minimizes on-aircraft data interpretations, rendering unnecessary on-board maintenance processors and technicians for LRU troubleshooting.","PeriodicalId":367253,"journal":{"name":"1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131820845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Testing tomorrow's fire control systems today 今天测试明天的火控系统
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) Pub Date : 1998-08-24 DOI: 10.1109/AUTEST.1998.713424
K. Bates, R. James
{"title":"Testing tomorrow's fire control systems today","authors":"K. Bates, R. James","doi":"10.1109/AUTEST.1998.713424","DOIUrl":"https://doi.org/10.1109/AUTEST.1998.713424","url":null,"abstract":"Military Electro-Optic fire control systems have evolved greatly over the years and continue to do so. The pace of evolution has sped up, due to the lower cost of purchasing upgraded sensor systems vs. the higher cost of buying all new tanks, ships, or aircraft. The evolution of fire control systems themselves drive a required evolution to their optical test systems, which must have a 4/spl times/ to 10/spl times/ greater precision. The newest fire control systems, many still in the drawing stages, have 2/sup nd/ and 3/sup rd/ generation FLIRs/DLIRs, coaxial FLIR/laser systems, as well as much improved laser rangefinder/designator systems. Additionally, many of the newer systems are going to EYESAFE laser wavelengths which carry another set of requirements. This paper discusses the requirements for testing current and future systems. We shall show the paradigm shift required for such testing and a production E-O test system which is already testing some of tomorrow's fire control systems today.","PeriodicalId":367253,"journal":{"name":"1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129382200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
ATLAS2000 object oriented programming capabilities ATLAS2000面向对象编程能力
1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) Pub Date : 1998-08-24 DOI: 10.1109/AUTEST.1998.713432
E. Hudis, A. Greenspan
{"title":"ATLAS2000 object oriented programming capabilities","authors":"E. Hudis, A. Greenspan","doi":"10.1109/AUTEST.1998.713432","DOIUrl":"https://doi.org/10.1109/AUTEST.1998.713432","url":null,"abstract":"The IEEE SCC20 committee on Test and Diagnostics for Electronic Systems in concert with Department of Defense Automatic Test System Research and Development integrated Project Team (ARI) is developing the next generation of ATLAS lest language. The ATLAS2000 development is aimed to redress many of the criticisms heaped upon ATLAS and also to introduce newer and proven capabilities into the ATLAS language. This will allow the effective applications and use of ATLAS into the 21/sup st/ century. This paper addresses one of the many improvements being inserted into ATLAS, specifically the addition of object-oriented extensions. Through this effort, the language developers intend to provide test program developers with the power and effectiveness of the object-oriented programming paradigm/technique. This paper presents the approach of the ATLAS 2000 developer to include the requirements for the object-oriented methodology within ATLAS 2000. It also provides an indication of the new robustness and extensibility of the ATLAS 2000 language.","PeriodicalId":367253,"journal":{"name":"1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130760967","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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