H. Miwa, S. Wada, Y. Yokoyama, M. Nakamura, T. Ohta, T. Maeda, M. Yoshida, H. Miyazawa, N. Akiyama, K. Miyazawa, J. Murata, A. Endoh
{"title":"A 17ns 4Mb BICMOS DRAM","authors":"H. Miwa, S. Wada, Y. Yokoyama, M. Nakamura, T. Ohta, T. Maeda, M. Yoshida, H. Miyazawa, N. Akiyama, K. Miyazawa, J. Murata, A. Endoh","doi":"10.1109/ISSCC.1991.689062","DOIUrl":"https://doi.org/10.1109/ISSCC.1991.689062","url":null,"abstract":"","PeriodicalId":360958,"journal":{"name":"1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116647365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Impending Crisis In Analog Test","authors":"D. Hester","doi":"10.1109/ISSCC.1991.689075","DOIUrl":"https://doi.org/10.1109/ISSCC.1991.689075","url":null,"abstract":"","PeriodicalId":360958,"journal":{"name":"1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124850609","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Technologies For Ultra-low-power Memory","authors":"J. Weisenstein, N. Lu, M. Winston","doi":"10.1109/ISSCC.1991.689125","DOIUrl":"https://doi.org/10.1109/ISSCC.1991.689125","url":null,"abstract":"","PeriodicalId":360958,"journal":{"name":"1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123681306","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Y. Oowaki, K. Tsuchida, Y. Watanabe, D. Takashima, M. Ohta, H. Nakano, S. Watanabe, A. Nitayama, F. Horiguchi, K. Ohuchi, F. Masuoka, H. Hara
{"title":"A 33ns 64Mb DRAM","authors":"Y. Oowaki, K. Tsuchida, Y. Watanabe, D. Takashima, M. Ohta, H. Nakano, S. Watanabe, A. Nitayama, F. Horiguchi, K. Ohuchi, F. Masuoka, H. Hara","doi":"10.1109/ISSCC.1991.689087","DOIUrl":"https://doi.org/10.1109/ISSCC.1991.689087","url":null,"abstract":"","PeriodicalId":360958,"journal":{"name":"1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129580957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
N. Ohtsuka, J. Miyamoto, K. Imamiya, N. Tomita, Y. Iyama, S. Mori, Y. Ohshima, N. Arai, Y. Kaneko, E. Salkagami, K. Yoshikawa, S. Tanaka
{"title":"A 62ns 16Mb CMOS EPROM With Address Transition Detection Technique","authors":"N. Ohtsuka, J. Miyamoto, K. Imamiya, N. Tomita, Y. Iyama, S. Mori, Y. Ohshima, N. Arai, Y. Kaneko, E. Salkagami, K. Yoshikawa, S. Tanaka","doi":"10.1109/ISSCC.1991.689152","DOIUrl":"https://doi.org/10.1109/ISSCC.1991.689152","url":null,"abstract":"","PeriodicalId":360958,"journal":{"name":"1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130935486","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Sweha, R. Alexis, G. Canepa, P. Dang, H. Dun, K. Frary, L. Gee, S. Guliani, P. Hazen, D. Leak, R. Melcher, C. Park, H. Pon, M. Reitsma, R. Rozman, P. Saraswat, G. Sery, K. Tedrow, C. Webber
{"title":"A 29ns 8Mb EPROM With Dual Reference-column ATD Sensing","authors":"S. Sweha, R. Alexis, G. Canepa, P. Dang, H. Dun, K. Frary, L. Gee, S. Guliani, P. Hazen, D. Leak, R. Melcher, C. Park, H. Pon, M. Reitsma, R. Rozman, P. Saraswat, G. Sery, K. Tedrow, C. Webber","doi":"10.1109/ISSCC.1991.689153","DOIUrl":"https://doi.org/10.1109/ISSCC.1991.689153","url":null,"abstract":"","PeriodicalId":360958,"journal":{"name":"1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133558056","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 16b Oversampling CODEC With Filtering DSP","authors":"T. Okamoto, Y. Maruyama, K. Hinooka, A. Yukawa","doi":"10.1109/ISSCC.1991.689070","DOIUrl":"https://doi.org/10.1109/ISSCC.1991.689070","url":null,"abstract":"","PeriodicalId":360958,"journal":{"name":"1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"1124 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133588428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A CMOS Fourth-order 14b 500k-sample/s Sigma-delta ADC Converter","authors":"F. O. Eynde, G. Yin, W. Sansen","doi":"10.1109/ISSCC.1991.689064","DOIUrl":"https://doi.org/10.1109/ISSCC.1991.689064","url":null,"abstract":"","PeriodicalId":360958,"journal":{"name":"1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"359 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115186691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}