2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)最新文献_第7页

Design and measurement of /spl mu/A leakage current EMI filter /spl mu/A漏电流EMI滤波器的设计与测量

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236675

L. Carmody, V. Ungvichian

引用次数: 1

The importance of failure-criteria definition in immunity testing 失效准则定义在抗扰度测试中的重要性

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236574

T. Braxton

引用次数: 1

Progress on the development of standards and recommended practices for CEM computer modeling and code validation CEM计算机建模和代码验证的标准和推荐实践的发展进展

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236613

A. Drozd

引用次数: 15

Shielding effectiveness studies of rectangular enclosures with apertures against EM fields with arbitrary angles of incidence and polarizations 矩形孔罩对任意入射角和极化电磁场的屏蔽效果研究

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236593

Z. Ali Khan, C. Bunting

引用次数: 2

Modeling issues for full-wave numerical EMI simulation 全波电磁干扰数值模拟的建模问题

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236617

M. Cracraft, X. Ye, Chen Wang, S. Chandra, J. Drewniak

引用次数: 2

Optical magnetic field sensing with a loop antenna element doubly-loaded with electro-optic crystals 双载电光晶体的环形天线元件的光磁场传感

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236638

E. Suzuki, T. Miyakawa, H. Ota, K. Arai, R. Sato

引用次数: 11

Printed circuit board EMI source mechanisms 印刷电路板电磁干扰源机制

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236553

T. Hubing

引用次数: 33

Radiated emission field perturbations due to accessories used in the FAR environment at 2, 10 & 18 GHz 2、10和18 GHz远端环境中使用的附件造成的辐射发射场扰动

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236686

E. Blankenship, M. Chase

{"title":"Radiated emission field perturbations due to accessories used in the FAR environment at 2, 10 & 18 GHz","authors":"E. Blankenship, M. Chase","doi":"10.1109/ISEMC.2003.1236686","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236686","url":null,"abstract":"Radiated emission measurements are usually performed in a facility that meets the Normalized Site Attenuation (NSA) requirements of standards such as CISPR 22 and ANSI C63.4. These standards allow alternative sites such as a fully anechoic room (FAR) for preliminary measurements before final measurements are taken in an open area test site (OATS). The NSA requirements for both these test environments are evaluated in the absence of necessary accessories, such as the table on which test samples must be supported. Additionally, the standards offer only vague guidance on the materials and construction methods used to build the test accessories. We believe this allows uncertainty to enter the measurement environment that is uncharacterized. This paper reports on measurements of these effects at 2, 10 and 18 GHz, and highlights additional facility and antenna interactions and table materials and shapes vis-a-vis their impacts upon measured electric fields. The paper reviews briefly our proposed technique for measuring the far-field signal perturbations that result from inserting test accessories into the common environments encountered in measuring ITE products using the standard noted above.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"300 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132763476","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Analysis on the standing wave method in free space using spectral domain approach 用谱域方法分析自由空间驻波方法

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236703

T. Tamada, N. Ishii, M. Miyakawa

引用次数: 3

Effects of skewing output driver switching on the electromagnetic emission 偏斜输出驱动开关对电磁发射的影响

2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236598

B. Deutschmann, G. Winkler, R. Jungreithmair

{"title":"Effects of skewing output driver switching on the electromagnetic emission","authors":"B. Deutschmann, G. Winkler, R. Jungreithmair","doi":"10.1109/ISEMC.2003.1236598","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236598","url":null,"abstract":"In today's high speed designs we often have to deal with clock rates in the GHz range and rise and fall times in the order of a few pico seconds. At these speeds it can no longer be assumed that a design is immune to parasitic effects. A lot of problems originate from high speed signals as they cause high electromagnetic emissions. These high emissions may lead to serious degradations to the electromagnetic compatibility of an electronic system. In this paper, the reduction of the electromagnetic emissions by skewing CMOS output driver is described. This technique is explained in detail and it is shown how skewing can be used to reduce ground bounce as well as the ringing of an integrated circuit. Using the TEM-cell method (IEC 61967-2), the radiated electromagnetic emissions of an EMC test chip was measured. It is shown that preventing the output drivers from switching simultaneously reduces the radiated electromagnetic emission. As most of the electronic systems designers are interested in the reduction of the electromagnetic emission of their designs it is also shown how this technique can be used to reduce the emission of an electronic system. For this purpose an EMC test printed circuit board was designed and the effects of skewing on its electromagnetic emission are described.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"212 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134338516","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6