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Optical Fabrication and Testing最新文献

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Methods of Cleaning Optical Surfaces 光学表面的清洁方法
Optical Fabrication and Testing Pub Date : 1900-01-01 DOI: 10.1364/oft.1990.jtud1
Martha D. M. Hammer
{"title":"Methods of Cleaning Optical Surfaces","authors":"Martha D. M. Hammer","doi":"10.1364/oft.1990.jtud1","DOIUrl":"https://doi.org/10.1364/oft.1990.jtud1","url":null,"abstract":"A variety of methods for cleaning optical surfaces have been developed. substrate, coating, temperature, accessibility and circumstance all effect the selection of the optimum approach for cleaning of these optical components. A survey of several of the programs within the Hughes Aircraft Company, El Segundo Optical Engineering and Manufacturing facility, has turned up a broad range of cleaning techniques each individually tailored to the program specific requirements.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127754631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Rock and Roll Polishing: A New Process for Precise Optical Surface Polishing 摇滚抛光:一种精密光学表面抛光新工艺
Optical Fabrication and Testing Pub Date : 1900-01-01 DOI: 10.1364/oft.1998.omd.4
J. Sasián, Michael B. North-Morris
{"title":"Rock and Roll Polishing: A New Process for Precise Optical Surface Polishing","authors":"J. Sasián, Michael B. North-Morris","doi":"10.1364/oft.1998.omd.4","DOIUrl":"https://doi.org/10.1364/oft.1998.omd.4","url":null,"abstract":"The precise polishing of optical surfaces is an important technology in the optics industry. We present a new polishing process that we call Rock and Roll polishing. This new process has the feature that it can be used to polish precise aspheric surfaces, axially and non-axially symmetric, can be scaled to polish several surfaces in parallel, and it is inexpensive.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133113522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Grating interferometer for metrology of transparent flats 透明平面计量用光栅干涉仪
Optical Fabrication and Testing Pub Date : 1900-01-01 DOI: 10.1364/oft.1996.owc.3
P. D. de Groot
{"title":"Grating interferometer for metrology of transparent flats","authors":"P. D. de Groot","doi":"10.1364/oft.1996.owc.3","DOIUrl":"https://doi.org/10.1364/oft.1996.owc.3","url":null,"abstract":"Transparent flats are difficult to measure because of the reflections from the front and back surfaces of the flat. The metrology is even more difficult if the surface deformations are too large for conventional testing, as is often the case for plastic hard disk blanks, flat panel displays and silicon wafers. This paper describe an interferometer that successfully separates the front and back surface reflections while working at an equivalent wavelength of 12μm, thus solving both problems with one system.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"201 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115710533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Economics of Traditional Versus CNC Lens Fabrication 传统与CNC透镜制造的经济对比
Optical Fabrication and Testing Pub Date : 1900-01-01 DOI: 10.1364/oft.1996.ofa.1
R. Wiederhold
{"title":"The Economics of Traditional Versus CNC Lens Fabrication","authors":"R. Wiederhold","doi":"10.1364/oft.1996.ofa.1","DOIUrl":"https://doi.org/10.1364/oft.1996.ofa.1","url":null,"abstract":"Summary not available.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123346008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Precision Flat Polishing Of Lithium Niobate 铌酸锂的精密平面抛光
Optical Fabrication and Testing Pub Date : 1900-01-01 DOI: 10.1364/oft.1996.ofb.4
J. Seckold
{"title":"Precision Flat Polishing Of Lithium Niobate","authors":"J. Seckold","doi":"10.1364/oft.1996.ofb.4","DOIUrl":"https://doi.org/10.1364/oft.1996.ofb.4","url":null,"abstract":"Lithium niobate (LiNbO3) is a man-made, birefringent, electro-optically active crystal. We have used LiNbO3 in the fabrication of 75mm diameter, thin, solid Fabry-Perot etalons [1], and 50mm diameter birefringent plates for a Lyot filter. The tight tolerances on the transmitted wavefront for these components require that the material be of extremely high quality and that the surfaces be polished flat to λ/30, or better. Cutting and grinding of LiNbO3 presents no problems, since diamond cutting tools and conventional, loose, abrasive grinding can be used, but precision polishing requires special techniques.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121778013","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Subsurface Damage in Optical Materials: Origin, Measurement and Removal 光学材料的亚表面损伤:起源、测量和去除
Optical Fabrication and Testing Pub Date : 1900-01-01 DOI: 10.1364/oft.1988.wc1
P. Hed, D. Edwards, Janet B. Davis
{"title":"Subsurface Damage in Optical Materials: Origin, Measurement and Removal","authors":"P. Hed, D. Edwards, Janet B. Davis","doi":"10.1364/oft.1988.wc1","DOIUrl":"https://doi.org/10.1364/oft.1988.wc1","url":null,"abstract":"The detection, measurement and removal of subsurface damage is a major effort of the LLNL Optical Sciences and Engineering Group. We will describe and show examples of three methods we are currently using to detect and measure the depth of damage in glasses and crystalline materials: taper polishing and etching, constancy of chemical etch rate, and small specimen fracture. In addition, results will be given to show that the depth of damage can often be approximated from the surface roughness and Young's modulus.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"277 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122709236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 48
Non-Linear Effects in Optical Surface Metrology 光学表面测量中的非线性效应
Optical Fabrication and Testing Pub Date : 1900-01-01 DOI: 10.1364/oft.1988.tha7
E. Church, S. Feng, P. Takacs
{"title":"Non-Linear Effects in Optical Surface Metrology","authors":"E. Church, S. Feng, P. Takacs","doi":"10.1364/oft.1988.tha7","DOIUrl":"https://doi.org/10.1364/oft.1988.tha7","url":null,"abstract":"This paper examines non-linear effects which appear in the measurement of surface topography by phase-shifting interference microscopy due to the non-linear relationship between the measured profile, Zm(x), and the true profile, Zt(x). To lowest order this is where P(x) is the point-spread function of the measurement. In an ideal system P(x) = δ(x), the non-linear functions Arg and Exp cancel, and Zm(x) = Zt(x). In real systems, however, P(x) has a finite width which upsets this proportionality. In earlier studies we developed comprehensive models for P(x) by comparing optical and mechanical measurements of smooth surfaces [1,2]. Here we use these models to explore the nature and magnitudes of the non-linear effects which arise in the measurement of rough deterministic and random surfaces for which the linearization of Eq. 1 is not possible. This is done both analytically and via Monte-Carlo simulations.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125134372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Some Results from an Absolute Calibration for LIGO LIGO绝对校准的一些结果
Optical Fabrication and Testing Pub Date : 1900-01-01 DOI: 10.1364/oft.1996.owc.4
R. Bourgeois, J. Magner, H. Stahl
{"title":"Some Results from an Absolute Calibration for LIGO","authors":"R. Bourgeois, J. Magner, H. Stahl","doi":"10.1364/oft.1996.owc.4","DOIUrl":"https://doi.org/10.1364/oft.1996.owc.4","url":null,"abstract":"We present the results from a full-aperture calibration of an interferometer for the LIGO program. Measurements reproduce predictions to better than 0.001 rms over 200 mm. Comparisons will be made with published algorithms.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125522237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Balancing cost with completeness: Specifying optics for the National Ignition Facility 平衡成本与完整性:为国家点火装置指定光学器件
Optical Fabrication and Testing Pub Date : 1900-01-01 DOI: 10.1364/oft.1996.owa.3
D. Aikens, R. E. English
{"title":"Balancing cost with completeness: Specifying optics for the National Ignition Facility","authors":"D. Aikens, R. E. English","doi":"10.1364/oft.1996.owa.3","DOIUrl":"https://doi.org/10.1364/oft.1996.owa.3","url":null,"abstract":"During the second half of the 1990's, the fabrication technologies used to make large, precision glass optics will continue to undergo profound changes, motivated by increased accuracy in metrology, increased requirements of precision, and decreasing production costs. Livermore intends to continue to benefit from these advances in its construction of the National Ignition Facility. In order to do so cost effectively, however, it is necessary to generate specifications which balance the requirements for precision with the desire to contain costs. Key to this is to specify as precisely and simply as possible what is required, balanced with the minimum necessary metrology and certification.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125946486","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Maximum Entropy Analysis of Dynamic Light Scattering Signals 动态光散射信号的最大熵分析
Optical Fabrication and Testing Pub Date : 1900-01-01 DOI: 10.1364/oft.1988.tha11
F. Laeri, André Noack
{"title":"Maximum Entropy Analysis of Dynamic Light Scattering Signals","authors":"F. Laeri, André Noack","doi":"10.1364/oft.1988.tha11","DOIUrl":"https://doi.org/10.1364/oft.1988.tha11","url":null,"abstract":"Glass transition temperatures of thin polymer coatings (similar to the coating of a magnetic storage disc) on alumina substrates have been evaluated with dynamic light scattering methods. At this temperature the correlation time of the thermodynamical fluctuations in the polymer increases and so the spectrum of the dynamic light scattering signal changes accordingly. In practise only partial knowledge of the autocorrelation function exists, usually based on a finite series of data samples taken in a finite intervall. In the common analysis the autocorrelation function is set zero for all lags for which no estimate exists or the missing data is replaced by the already measured data of the intervall. Both procedures of course can not lead to correct autocorrelation functions or spectra. Maximum entropy methods can give the most unbiased estimates of the missing data and so lead to the \"best possible\" autocorrelation function/power spectra obtainable from such a limited data set.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129994997","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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