J. Quero, Antonio Luque, Luis Castañer, Angel Rodríguez, Adrian Ionescu, Montserrat Fernández-Bolaños, Lorenzo Faraone, John M. Dell
{"title":"MEMS Devices","authors":"J. Quero, Antonio Luque, Luis Castañer, Angel Rodríguez, Adrian Ionescu, Montserrat Fernández-Bolaños, Lorenzo Faraone, John M. Dell","doi":"10.1201/9781315218441-13","DOIUrl":"https://doi.org/10.1201/9781315218441-13","url":null,"abstract":"Jenoptik has the knowledge and tools to perform detailed design and analysis for a variety of microelectro-mechanical systems (MEMS) devices. An important MEMS technology that can be used in many industries is the scanning two-axis tilt mirror. There are several major benefits of JENOPTIK tilt mirrors. First, the electrostatically generated tilt angle is analog as opposed to “on-off”. Second, most competing products have holes in the mirror surface as a result of processing requirements, Jenoptik devices have no holes in the mirror surface, allowing for a better reflection of all incident light. Finally, low voltages are required for actuation, a total of less than 70 volts is required for the full 3 degrees of tilt with less voltage is required for less tilt deflection.","PeriodicalId":354437,"journal":{"name":"Fundamentals of Industrial Electronics","volume":"244 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123300725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Computational Methods in Node and Loop Analyses","authors":"Stephen M. Haddock, J. Irwin","doi":"10.1201/9781315218441-3","DOIUrl":"https://doi.org/10.1201/9781315218441-3","url":null,"abstract":"","PeriodicalId":354437,"journal":{"name":"Fundamentals of Industrial Electronics","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131795506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Signal Processing","authors":"J. Heinen, R. Niederjohn","doi":"10.1201/9781315218441-25","DOIUrl":"https://doi.org/10.1201/9781315218441-25","url":null,"abstract":"","PeriodicalId":354437,"journal":{"name":"Fundamentals of Industrial Electronics","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116464548","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Laplace Transforms","authors":"D. S. Nelson","doi":"10.1201/9781315218441-7","DOIUrl":"https://doi.org/10.1201/9781315218441-7","url":null,"abstract":"","PeriodicalId":354437,"journal":{"name":"Fundamentals of Industrial Electronics","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121051411","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Physical Phenomena Used in Sensors","authors":"Tiantian Xie, B. Wilamowski","doi":"10.1201/B10602-15","DOIUrl":"https://doi.org/10.1201/B10602-15","url":null,"abstract":"","PeriodicalId":354437,"journal":{"name":"Fundamentals of Industrial Electronics","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124216290","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Frequency Response and Bode Diagrams","authors":"T. F. Schubert, E. Kim","doi":"10.1201/B10602-8","DOIUrl":"https://doi.org/10.1201/B10602-8","url":null,"abstract":"","PeriodicalId":354437,"journal":{"name":"Fundamentals of Industrial Electronics","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114751150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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