2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII )最新文献_第5页

An n-MOSFET Layout with Multi-Finger Z Gate for Radiation Tolerance 具有多指Z栅极的n-MOSFET辐射容限布局

2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII ) Pub Date : 2022-07-22 DOI: 10.1109/ICKII55100.2022.9983548

Chan Shan, Y. Liu, Huan Chen, Dong-yang Huo, Tian-rong Xu

引用次数: 0

Natural Gas Load Forecasting Based on Improved Genetic Algorithm and BP Neural Network 基于改进遗传算法和BP神经网络的天然气负荷预测

2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII ) Pub Date : 2022-07-22 DOI: 10.1109/ICKII55100.2022.9983572

Yihan Tang

引用次数: 0

User Interface Exploration of Facial Feedback Systems for Massively Multiplayer Online Role-playing Games 面向大型多人在线角色扮演游戏的面部反馈系统的用户界面探索

2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII ) Pub Date : 2022-07-22 DOI: 10.1109/ICKII55100.2022.9983550

Xu-Chao Guo, Chien-Wen Cheng

{"title":"User Interface Exploration of Facial Feedback Systems for Massively Multiplayer Online Role-playing Games","authors":"Xu-Chao Guo, Chien-Wen Cheng","doi":"10.1109/ICKII55100.2022.9983550","DOIUrl":"https://doi.org/10.1109/ICKII55100.2022.9983550","url":null,"abstract":"The Facial Feedback Systems, the game system designed in this study, makes it easy for players to interact with others through facial capture in massively multiplayer online role-playing games (MMORPGs). Through the system, players’ facial expressions can be fed back to the game characters’ faces in real-time.The Facial Feedback Systems proposed in this study will be applied to the researcher’s proprietary MMORPG. Through a computer camera and microphone, players transmit their facial expressions and voices to the MMORPG, and their in-game characters will simultaneously make the same expressions and voices as the players.In this experiment, the subject players will experience the functions and interface of the Facial Feedback Systems in the MMORPG and fill out questionnaires. The questionnaire results will be analyzed, and interviews will be performed to evaluate the players’ true feelings about the Facial Feedback Systems’ functions and interface in the game, so as to examine the possibility of introducing the Facial Feedback Systems into MMORPGs in the future, identifies its most accepted use among players, and suggests its design for multiplayer games.","PeriodicalId":352222,"journal":{"name":"2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII )","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132966271","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Unstructured Text Data Rule Generalization in Attribute-Oriented Induction 面向属性归纳法中的非结构化文本数据规则泛化

2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII ) Pub Date : 2022-07-22 DOI: 10.1109/ICKII55100.2022.9983603

Yi-Ning Tu, Cheng-Yi Kuo

{"title":"Unstructured Text Data Rule Generalization in Attribute-Oriented Induction","authors":"Yi-Ning Tu, Cheng-Yi Kuo","doi":"10.1109/ICKII55100.2022.9983603","DOIUrl":"https://doi.org/10.1109/ICKII55100.2022.9983603","url":null,"abstract":"With the advancement of science and technology, algorithms for data mining are constantly being introduced but most of the algorithms focus on solving the problem of how to reduce the dimension of variables. Nowadays, the amount of data is accumulating and increasing rapidly, and how to compress the amount of data becomes an important topic. Attribute-oriented induction (AOI) is a method of longitudinally compressing data. At present, there are many derivative methods to solve the problem of multi-value-attributes and ordered data. However, few researchers have focused on unstructured text data. Nowadays, the most common way to process text data for classification and induction is to use Latent Dirichlet Allocation (LDA) and generate attributes of the topic. However, the attributes of the topic do not consider whether they exist or not a potential hierarchical relationship. As the topics of text data are hierarchical, we focus on unstructured data such as comment content, transform the comment content into concept datasets, and use AOI to construct a reasonable hierarchical concept. Through induction cost, the final level of induction is determined, too. Finally, the induction rate of the topics generated by the LDA and AOI methods is evaluated to solve the problem of data compression with multiple events and hierarchical relationships among concepts.","PeriodicalId":352222,"journal":{"name":"2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII )","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122678673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Various Frequency Control Methods for Wind Turbines: Theory and Simulation 风力发电机的各种频率控制方法:理论与仿真

2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII ) Pub Date : 2022-07-22 DOI: 10.1109/ICKII55100.2022.9983571

Yuan-Kang Wu, Cheng-Liang Huang

引用次数: 0

Using Deep Learning for Apartment Complex Closed-Circuit Television System 深度学习在公寓综合闭路电视系统中的应用

2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII ) Pub Date : 2022-07-22 DOI: 10.1109/ICKII55100.2022.9983583

Hao-Hsuan Tseng

引用次数: 0

Identification and Classification of Diabetic Foot Ulcers by Deep Neural Networks: A Comparative Study 用深度神经网络识别和分类糖尿病足溃疡的比较研究

2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII ) Pub Date : 2022-07-22 DOI: 10.1109/ICKII55100.2022.9983553

Suma Sailaja Nakka, B. Chakraborty, Takahisa M. Sanada, Weilun Wang, G. Chakraborty

{"title":"Identification and Classification of Diabetic Foot Ulcers by Deep Neural Networks: A Comparative Study","authors":"Suma Sailaja Nakka, B. Chakraborty, Takahisa M. Sanada, Weilun Wang, G. Chakraborty","doi":"10.1109/ICKII55100.2022.9983553","DOIUrl":"https://doi.org/10.1109/ICKII55100.2022.9983553","url":null,"abstract":"Automatic analysis of the Diabetic Foot Ulcer (DFU) wound using computer based methods is becoming important with the rapid development of image-based machine learning and deep learning algorithms. In this work, identification and classification of diabetic wounds have been studied utilizing several deep neural network models, and their performances have been compared. Simulation experiments have been done utilizing the DFUC2021 data set, containing labeled images of four classes: normal class, infection only class, ischemia only class, both (infection and ischemia) class. The final dataset of DFUC2021 comprises 15,683 DFU images in total, with 5955 training images, 5734 testing images, and 3994 unlabeled DFU patches. A few deep network model architectures, such as VGG16, VGG19, ResNet50, ResNet101, and EfficientNetB0 which were pretrained have been utilized for the study. Initially, the original data set was used for training and classification in which the classes are not balanced. Data augmentation has been utilized as a means of oversampling to equalize all the samples in all the classes. The performance study has been done by comparing the values of precision, accuracy, recall, F1 score values, and computational time for the networks utilizing original and augmented datasets and a comparative analysis is reported.","PeriodicalId":352222,"journal":{"name":"2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII )","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125942841","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Calculation of Pressure in Interrupter of SF6 Circuit Breaker Using Lattice Boltzmann Method 用点阵玻尔兹曼法计算SF6断路器断流压力

2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII ) Pub Date : 2022-07-22 DOI: 10.1109/ICKII55100.2022.9983606

J. Cui, Qili Sun, Junmin Zhang

引用次数: 0

Influence of Y2O3 Doped HfO2 High-k Films on Electrical Properties of MOS and MIM Devices Y2O3掺杂HfO2高k薄膜对MOS和MIM器件电性能的影响

2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII ) Pub Date : 2022-07-22 DOI: 10.1109/ICKII55100.2022.9983564

Chih-Feng Yen, Yu-Ya Huang, Shen-Hao Tsao, Shih-Hao Lin, Chun‐Hu Cheng

{"title":"Influence of Y2O3 Doped HfO2 High-k Films on Electrical Properties of MOS and MIM Devices","authors":"Chih-Feng Yen, Yu-Ya Huang, Shen-Hao Tsao, Shih-Hao Lin, Chun‐Hu Cheng","doi":"10.1109/ICKII55100.2022.9983564","DOIUrl":"https://doi.org/10.1109/ICKII55100.2022.9983564","url":null,"abstract":"Y<inf>2</inf>O<inf>3</inf> doped HfO<inf>2</inf> high-k films were successfully fabricated on P-type and N-type doped Si substrates by liquid phase deposition (LPD) for metal-oxide-semiconductor (MOS) and metal-insulator-metal (MIM) capacitors. The effects of doping different molar concentrations of Y<inf>2</inf>O<inf>3</inf> and nitrogen annealing on the electrical properties of HfO<inf>2</inf> thin films were investigated, too. According to the experimental results, the HfO<inf>2</inf> film doped with Y<inf>2</inf>O<inf>3</inf> (5 mol%) had a high capacitance density and low leakage current. The improvement of defects at low-temperature deposited films was achieved by using nitrogen annealing at 600°C. The oxide capacitance of the MOS capacitor is 127 pF, approaching the ideal flat-band voltage of -0.53 V, small hysteresis flat band voltage of 0.093 V, and low leakage current density of 3.78 × 10-5 A/cm2 at +5 V. The capacitance density of MIM capacitors at 1 MHz is 2.98 fF/µm2, small relatively quadratic voltage coefficient of capacitance (VCC) of -517.96 ppm/V2, and leakage current density 1.12 × 10-2 A/cm2 at +3 V. Therefore, Y<inf>2</inf>O<inf>3</inf> doped HfO<inf>2</inf> films can be applied in MOSFET, radio frequency, and mixed-signal integrated circuits as a promising candidate to replace SiO<inf>2</inf>.","PeriodicalId":352222,"journal":{"name":"2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII )","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134469000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

VLSI Implementation of RISC MCU with In-Circuit Debugger 基于在线调试器的RISC单片机VLSI实现

2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII ) Pub Date : 2022-07-22 DOI: 10.1109/ICKII55100.2022.9983595

Mao-Hsu Yen, Cheng-Hao Tsou, Ssu-Chi Lin, Che-Wei Chang, Yih-Hsia Lin, Yuan-Fu Ku, Chi-Lin Chiang

{"title":"VLSI Implementation of RISC MCU with In-Circuit Debugger","authors":"Mao-Hsu Yen, Cheng-Hao Tsou, Ssu-Chi Lin, Che-Wei Chang, Yih-Hsia Lin, Yuan-Fu Ku, Chi-Lin Chiang","doi":"10.1109/ICKII55100.2022.9983595","DOIUrl":"https://doi.org/10.1109/ICKII55100.2022.9983595","url":null,"abstract":"A VLSI architecture of the NTOU_LF1826 MCU with an ICD (In-Circuit Debugger) is proposed in this study. We use Verilog HDL (Hardware Description Language) to construct the Soft IP of the NTOU_LF1826 RISC MCU with ICD architecture and go through emulation verification under ModelSim environment. Altera DE10 board and ICD software platform are used to verify the FPGA results. Furthermore, by using the Cell-Based design flow and Taiwan Semiconductor Research Institute (TSRI) EDA cloud platform, VLSI implementation of the RISC MCU under the TSMC 0.18 µm CMOS technology reveal that the size is 1190 × 1190 μm and clock rate is 100 MHz. The two main parts of the NTOU_LF1826 MCU with ICD, the hardware and software are presented in this study. For software, we develop an ICD in-circuit debugger that allows users to observe internal registers immediately. In terms of hardware, we provide two modes, Debug and Run. Under Run mode, the MCU processes as usual, while under Debug mode, the in-circuit debugger has functions such as Reset, Step Into, Step Over, Read Register, and Write Register, five main functions. Communication of software and hardware is conducted by using the SPI (Serial Peripheral Interface) protocol. NTOU_LF1826 MCU has Run mode as default to properly execute programs. Therefore, the proposed NTOU_LF1826 RISC MCU VLSI architecture and integrated development environment enable users to easily use the RISC MCU.","PeriodicalId":352222,"journal":{"name":"2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII )","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130284065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0