2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)最新文献

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Accelerated life testing of packaging box under multiple environmental stresses 多种环境应力下包装盒的加速寿命试验
Shuaishuai Zhao, Jie Zhou, K. Peng
{"title":"Accelerated life testing of packaging box under multiple environmental stresses","authors":"Shuaishuai Zhao, Jie Zhou, K. Peng","doi":"10.1109/ICRMS.2016.8050086","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050086","url":null,"abstract":"To evaluate the life of a packaging box, accelerated life testing was conducted under multiple environmental stresses. Based on the potential failure mode and mechanism, sensitive stresses were determined in accelerated life testing. The method of events compression and increasing stress levels was used for accelerated life testing based on the life profile of packaging box. The test included an environmental aging test, a random vibration test, a fork transport test, an artificial dismounting test, a declivitous impact test, and a rotating edge drop test. The standard timing test statistical scheme was used to evaluate the life of packaging box. The results indicate that the lowest confidence limit of the life of a packaging box life is 9.94 year under 80% confidence level.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126017896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Software reliability growth model of reactor protection system based on ratio analysis of critical faults 基于临界故障比率分析的电抗器保护系统软件可靠性增长模型
Chao Guo, Shuqiao Zhou, Duo Li
{"title":"Software reliability growth model of reactor protection system based on ratio analysis of critical faults","authors":"Chao Guo, Shuqiao Zhou, Duo Li","doi":"10.1109/ICRMS.2016.8050120","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050120","url":null,"abstract":"The application of digital instrumentation and control systems in Nuclear Power Plants (NPPs) provides a series of advantages, but it also raises challenges in the reliability analysis of safety-critical systems in the NPPs. Software testing is one of the most significant processes to assure software reliability, and the safety-critical systems of NPPs are sensitive to the severity of software faults, especially the critical faults that infect the system function greatly. Previous software reliability models related to the analysis of fault severity were mostly based on the assumption of different severities. In this paper, the fault severity data collected during the software test process were used for modeling the test process with a Software Reliability Growth Model based on a non-homogeneous Poisson process. The mean value function was derived by considering the ratios of critical and non-critical faults and was named as “Ratio of Critical-Faults model” (RCF model). The fault data collected while developing the safety-critical system were used to validate this model. According to the analysis, RCF model had fitting abilities similar to that of the Goel-Okumoto model and Inflection S-shaped model whereas the prediction effect of the RCF model was better than that of these two models, especially when little data were collected, which could be used to determine the release time of the software.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131438640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Area method used in the evaluation of resilience implementation approaches in system of systems 用面积法评价系统的弹性实施方法
Xing Pan, Yanjing Yang, Zhuo Jiang, Ye Lin
{"title":"Area method used in the evaluation of resilience implementation approaches in system of systems","authors":"Xing Pan, Yanjing Yang, Zhuo Jiang, Ye Lin","doi":"10.1109/ICRMS.2016.8050163","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050163","url":null,"abstract":"System of systems (SoS), like transportation systems and combat systems, is integrated by a set of independently operating systems that interact with each other to provide an end-to-end capability, which cannot be achieved by individual systems. Resilience is the ability of an SoS to recover to a desired performance level after disruptive events. Even though many measures have been proposed to evaluate resilience, there is no one general metric that can be used in all situations. Given that what we actually need is the performance process with time, this paper presents an area method to evaluate resilience by calculating the area below the performance curve after disruption. Meanwhile, we propose the SoS operating time, combined with the area method, to identify which of the recovered performance levels and the recovery speeds is more important according to different situations. Finally, the proposed research enables us to evaluate resilience implementation approaches and select the best one.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"82 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131624913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Reliability simulation analysis of satellite products 卫星产品可靠性仿真分析
Taibin Hu, Xiao Xiong
{"title":"Reliability simulation analysis of satellite products","authors":"Taibin Hu, Xiao Xiong","doi":"10.1109/ICRMS.2016.8050128","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050128","url":null,"abstract":"The reliability simulation modeling and analysis of satellite products were studied in this paper. In order to increase the reliability of satellite system, the important products can be design with redundancy structure. Reliability modeling is the basis for satellite reliability engineering. The function and configuration of satellite system is more and more complex, traditional reliability modeling method such as RBD is not applicable. Reliability simulation method can apply to complex system. The reliability simulation method and the basic steps are studied firstly. General reliability simulation models for most products are given, including serial model, parallel model, standby redundancy, voting model. Research is mainly focused on the reliability simulation methods of complex satellite products, such as ring redundancy for TWTAs, more than one redundancy form for gyroscopes, and more than one logic relationship for momentum wheels. Finally, reliability simulation result curves of one satellite system are given as an example.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130400885","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A model-driven testing framework based on requirement for embedded software 基于嵌入式软件需求的模型驱动测试框架
Haishen Lei, Yichen Wang
{"title":"A model-driven testing framework based on requirement for embedded software","authors":"Haishen Lei, Yichen Wang","doi":"10.1109/ICRMS.2016.8050100","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050100","url":null,"abstract":"Based on hardware and software integration testing and model driven testing binding requirements, we propose a model based on the needs of embedded software driver initial framework to analyze and identify the needs of embedded systems hardware and software object creation object interaction model, then the model analysis and testing constraints and on the basis of test scenarios, and then establish MARTE model test requirements, test cases accordingly converted into XML model, obtain the initial set of test cases through model transformation algorithm and model checking, and finally the use of intelligent algorithms to obtain objective test set. Expectations for increasing demand for embedded software in line with the degree of automation of the verification process, the verification and running on the target machine's software to achieve high-level functions and needs consistency.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"187 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132584171","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
The mechanism of cyclic stress enhanced oxidation in monocrystalline silicon microstructures 单晶硅微结构中循环应力增强氧化的机理
Man Zhang, J. Tao, Yun-An Zhang, Bin Liu
{"title":"The mechanism of cyclic stress enhanced oxidation in monocrystalline silicon microstructures","authors":"Man Zhang, J. Tao, Yun-An Zhang, Bin Liu","doi":"10.1109/ICRMS.2016.8050090","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050090","url":null,"abstract":"Researchers have conducted extensive research on the fatigue mechanism of silicon microstructures. But the key step in some mechanisms that localized oxide can thicken at high stress concentration sites after fatigue failure lacks support. Based on the Deal-Grove model of the thermal oxidation of silicon, we have proposed a chemical kinetics principle of cyclic stress enhanced oxidation: Tension can promote the diffusion of oxygen and the reaction of silicon and oxygen. Compression can damage the silica. Oxygen atoms are delivered to interior layers gradually and react with silicon to generate silica under cyclic stress. So the oxide layer grows thicker.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130513045","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Response surface method and reliability calculation based on the generating function method 响应面法和基于生成函数法的可靠度计算
K. Sun, Jinyu Zhou
{"title":"Response surface method and reliability calculation based on the generating function method","authors":"K. Sun, Jinyu Zhou","doi":"10.1109/ICRMS.2016.8050124","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050124","url":null,"abstract":"The generating function method is an important tool for the structural reliability analysis and performance assessment of multi-state systems. However, no corresponding solving method is available for implicit limited state functions. Therefore, a response surface method based on the generating function method is proposed, and its reliability is calculated. This method is improved based on the classical response surface method by using the present most dangerous point (minimum) of fitting the limited state function obtained as the design point and the expansion point of the next iteration, making the expansion point closer to the failure surface, enhancing the approximate precision of the limited state function near the failure surface, and providing a feasible way for calculating the system reliability in a highly precise manner with the generating function method of non-uniform discretization. Examples are provided to demonstrate that the new method improves the convergence rate and calculation accuracy and reduces the iterative and cumulative error.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121776676","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Reliability assessment based on Bayesian networks for full authority digital engine control systems 基于贝叶斯网络的全授权数字发动机控制系统可靠性评估
Naixin Li, Zhong Lu, Jia Zhou
{"title":"Reliability assessment based on Bayesian networks for full authority digital engine control systems","authors":"Naixin Li, Zhong Lu, Jia Zhou","doi":"10.1109/ICRMS.2016.8050158","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050158","url":null,"abstract":"Full Authority Digital Engine Control (FADEC) systems are widely used in commercial aircraft engines nowadays and system reliability has an important effect on the safety of aircraft operation. A reliability analysis framework is proposed in this study. Bayesian networks (BNs) are used to obtain the reliability function of the system which is able to analyze FADEC systems in the continuous time domain. A practical FADEC system is provided to illustrate the effectiveness of our formalism. Compared with others, this formalism can analyze systems in the continuous time domain, and a multi-state characteristic can be described. The result shows that our BN based formalism is a powerful tool for reliability analysis of FADEC systems.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130361959","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Degradation process and lifetime evaluation of repairable and non-repairable systems subject to random shocks 随机冲击下可修与不可修系统的退化过程与寿命评估
Shuyang Guo, Yufeng Sun, Guangyan Zhao, Zhiwei Chen
{"title":"Degradation process and lifetime evaluation of repairable and non-repairable systems subject to random shocks","authors":"Shuyang Guo, Yufeng Sun, Guangyan Zhao, Zhiwei Chen","doi":"10.1109/ICRMS.2016.8050038","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050038","url":null,"abstract":"This paper studies the degradation process of mechanical systems which are composed of multiple sub-systems which have been subjected to continuous wear and random shocks. We have developed a new mathematical model of series systems and established the function curve of each sub-system's degradation over time to evaluate the system's lifetime. Previous research mainly focused on simple non-repairable systems with multiple sub-systems which suffered from independent degradation processes, and held the view that systems can normally work only when the total degradation of each sub-system is less than the threshold level. This new model extends previous research by considering both a non-repairable system and a repairable system subject to multiple degradation processes, and these two types of systems will also fail when the degradation of the overall system is greater than the threshold level. The model is demonstrated on a specific example by means of Monte-Carlo simulation.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124512661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Reliability assessment of electric energy data collector 电能数据采集器可靠性评估
Feng Lin, J. Shao, Jianguo Miao, Jian Wu
{"title":"Reliability assessment of electric energy data collector","authors":"Feng Lin, J. Shao, Jianguo Miao, Jian Wu","doi":"10.1109/ICRMS.2016.8050092","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050092","url":null,"abstract":"Being instrumental in electric energy data collection for energy data collection and supervisory systems, the reliability of an electric energy collector not only affects the reliability of the system, but also directly influences users' satisfaction. With the objective of addressing the problem of reliability assessment of an electric energy data collector, the failure mechanism of the data collector was first identified, followed by a cyclical acceleration method, which includes a sub test known as step stress test. Based on the exponential distribution of the fault time of the electrical energy collector, the Gamma distribution was assumed as the prior distribution and a multilevel Bayesian no-failure data statistical analysis method was used to calculate the average life span of the collector using the experimental data. Further, we adopted the Arrhenius equation under temperature stress and the activation energy value of electronic products to calculate the reliable life expectancy of the electrical energy collector under the normal operating temperatures. Additionally, this method is suitable for other electric energy data collectors as the main structure and working principle are similar.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121277628","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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