The mechanism of cyclic stress enhanced oxidation in monocrystalline silicon microstructures

Man Zhang, J. Tao, Yun-An Zhang, Bin Liu
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Abstract

Researchers have conducted extensive research on the fatigue mechanism of silicon microstructures. But the key step in some mechanisms that localized oxide can thicken at high stress concentration sites after fatigue failure lacks support. Based on the Deal-Grove model of the thermal oxidation of silicon, we have proposed a chemical kinetics principle of cyclic stress enhanced oxidation: Tension can promote the diffusion of oxygen and the reaction of silicon and oxygen. Compression can damage the silica. Oxygen atoms are delivered to interior layers gradually and react with silicon to generate silica under cyclic stress. So the oxide layer grows thicker.
单晶硅微结构中循环应力增强氧化的机理
研究人员对硅微结构的疲劳机理进行了广泛的研究。但在某些机制中,局部氧化在疲劳破坏后高应力集中部位增厚的关键步骤缺乏支持。基于硅热氧化的Deal-Grove模型,我们提出了循环应力增强氧化的化学动力学原理:张力可以促进氧的扩散和硅氧的反应。压缩会损坏二氧化硅。氧原子逐渐进入内层,在循环应力作用下与硅反应生成二氧化硅。所以氧化层变厚了。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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