{"title":"Data reduction to |Fhkl\u0000 | values","authors":"A. L. Bail","doi":"10.1107/97809553602060000950","DOIUrl":"https://doi.org/10.1107/97809553602060000950","url":null,"abstract":"","PeriodicalId":338076,"journal":{"name":"International Tables for Crystallography","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125274916","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Selected applications of Rietveld analysis in the aluminium industry","authors":"F. Feret","doi":"10.1107/97809553602060000980","DOIUrl":"https://doi.org/10.1107/97809553602060000980","url":null,"abstract":"","PeriodicalId":338076,"journal":{"name":"International Tables for Crystallography","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129599911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Materials for energy storage and conversion","authors":"M. A. Rodríguez","doi":"10.1107/97809553602060000977","DOIUrl":"https://doi.org/10.1107/97809553602060000977","url":null,"abstract":"","PeriodicalId":338076,"journal":{"name":"International Tables for Crystallography","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134172805","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Specimen preparation","authors":"P. Whitfield, A. Huq, J. Kaduk","doi":"10.1107/97809553602060000945","DOIUrl":"https://doi.org/10.1107/97809553602060000945","url":null,"abstract":"","PeriodicalId":338076,"journal":{"name":"International Tables for Crystallography","volume":"209 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133178176","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Use of CIF for powder diffraction data","authors":"B. Toby","doi":"10.1107/97809553602060000965","DOIUrl":"https://doi.org/10.1107/97809553602060000965","url":null,"abstract":"","PeriodicalId":338076,"journal":{"name":"International Tables for Crystallography","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122635270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Zeolites","authors":"L. B. McCusker, Christian Baerlocher","doi":"10.1107/97809553602060000961","DOIUrl":"https://doi.org/10.1107/97809553602060000961","url":null,"abstract":"","PeriodicalId":338076,"journal":{"name":"International Tables for Crystallography","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133711088","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Two-dimensional powder diffraction","authors":"B. He","doi":"10.1107/97809553602060000940","DOIUrl":"https://doi.org/10.1107/97809553602060000940","url":null,"abstract":"Two-dimensional X-ray diffraction, also referred to as 2D powder diffraction, covers X-ray diffraction applications with a 2D detector and corresponding data reduction and analysis. A two-dimensional diffraction pattern contains abundant information about the atomic arrangement, microstructure and defects of a solid or liquid material. In recent years, use of two-dimensional detectors has dramatically increased in academic research and various industries. When a 2D detector is used for X-ray powder diffraction, the diffraction cones are intercepted by the area detector and the X-ray intensity distribution on the sensing area is converted to a 2D diffraction pattern. A 2D diffraction pattern contains far more information than a conventional diffraction pattern, and therefore demands a special data-collection strategy and data-evaluation algorithms. This chapter covers the basic concepts and recent progress in two-dimensional X-ray diffraction theory and technologies, including geometry conventions, X-ray source and optics, two-dimensional detectors, and diffraction-data interpretation, and various applications, such as phase identification, texture, stress, crystallinity and crystallite-size analysis.","PeriodicalId":338076,"journal":{"name":"International Tables for Crystallography","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127887083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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