{"title":"Systems integration using CASE tool development software","authors":"R. E. Brown, R. Stan","doi":"10.1109/NAECON.1996.517746","DOIUrl":"https://doi.org/10.1109/NAECON.1996.517746","url":null,"abstract":"System integration refers to combining some or all of the functionality of two or more software and/or database systems. This differs from systems interfacing which refers to linking the functionality of two or more systems via another system component specifically designed for that purpose. Systems integration implies making two or more systems work as one system and not necessarily to make multiple systems work in tandem. This paper advocates the advantages of using CASE tool development software for systems integration activities. It also addresses other beneficial software project management data which is created as a result.","PeriodicalId":332694,"journal":{"name":"Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131817579","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Functional testability measures based on information flow","authors":"Yulong Shao","doi":"10.1109/NAECON.1996.518052","DOIUrl":"https://doi.org/10.1109/NAECON.1996.518052","url":null,"abstract":"To measure testability of circuits precisely is one of the important problems in digital system testing. This paper presents a method based on information flow to measure the testability of circuits. Digital circuits can be described by an information processing system. The testability measure is defined in terms of information flow across the digital circuit. Its value can be obtained by means of logic simulation software. For those circuits that contain many modules, the testability measure can be obtained by means of special operations among them. A corresponding example is demonstrated. Another example for testability measure is calculated and its results are compared with those previously obtained. The features of the method presented in this paper are described.","PeriodicalId":332694,"journal":{"name":"Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133351694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Detection of spot target in infrared clutter with morphological filter","authors":"Li Jicheng, Shen Zhengkang, Lan Tao","doi":"10.1109/NAECON.1996.517633","DOIUrl":"https://doi.org/10.1109/NAECON.1996.517633","url":null,"abstract":"The morphological filters are a class of nonlinear signal processing algorithms, which have been applied extensively to computer vision, image processing, and more recently target detection. This paper presents a morphology-based algorithm for spot target detection in IR clutter. The algorithm utilizes a prior knowledge of target size to suppress background clutter and remove noise. The experimental results show that the approach can detect spot target in the presence of clutter for low signal-to-noise ratio (SNR). The probability of detection and false alarm is presented as ROC curves for sky, ground and sea clutter background.","PeriodicalId":332694,"journal":{"name":"Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132776396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis of conical microstrip antennas with uniform substrate","authors":"S. Chai, Demiao Yao, N. Yuan","doi":"10.1109/NAECON.1996.517654","DOIUrl":"https://doi.org/10.1109/NAECON.1996.517654","url":null,"abstract":"A new conical microstrip antenna with uniform substrate is investigated. The far field radiation patterns of wraparound microstrip antennas mounted on such a structure are studied theoretically. The patches are replaced by equivalent magnetic currents which are obtained from a cylindrical microstrip antenna under a hypothesis based on cavity model theory. The radiation fields are then determined using the model expansion technique in spherical coordinate system. Results for a wrap-around antenna of half-wavelength in width excited by TM/sub 01/ are given. They are verified accurate and efficient.","PeriodicalId":332694,"journal":{"name":"Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128886513","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Autofocusing of (inverse) synthetic aperture radar for motion compensation","authors":"H.M.J. Cantalloube, C. Nahum","doi":"10.1109/NAECON.1996.517663","DOIUrl":"https://doi.org/10.1109/NAECON.1996.517663","url":null,"abstract":"Ground imaging from an airborne synthetic aperture radar (SAR) and conversely aircraft imaging from a ground based radar (ISAR) require the knowledge of the motion of the antenna relative to the target, with an accuracy of a fraction of the wavelength upon a time span of seconds. This information is not necessarily directly available from navigation/tracking data and must be recovered from the radar data itself using the technique well known as autofocus. The approach described in this paper divides the problem into two time scales. The fast disturbances (antenna vibrations, tracking noise) of the motion with respect to the nominal trajectory are handled before range compression by the complex valued correlation technique. The slow disturbances (inertial drifts, error accumulation) are handled by a frame drift-like technique, derived from image sequence analysis. As side effect, this method may also provide alternative techniques for moving target detection and for accurate odometry (measure of the ground speed of the carrier aircraft).","PeriodicalId":332694,"journal":{"name":"Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115631984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Eliminate impulsive noise according to its performance in optic fiber baseband transmission system","authors":"Mingchun Li, Z. Li","doi":"10.1109/NAECON.1996.517735","DOIUrl":"https://doi.org/10.1109/NAECON.1996.517735","url":null,"abstract":"In EM environment, impulsive noise may be introduced through optical terminals. The BER formulas which enable determination of the biexponential noise amplitude distribution, are derived. The results show that match median filter (MMF) enable one to eliminate the impulsive noise.","PeriodicalId":332694,"journal":{"name":"Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124267771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Advances in signal processing technology for electronic warfare","authors":"J. P. Stephens","doi":"10.1109/NAECON.1996.517627","DOIUrl":"https://doi.org/10.1109/NAECON.1996.517627","url":null,"abstract":"The denial of effective communications by enemy forces during hostile military operations has been a primary concern for military commanders since the inception of radio communications on the battlefield before World War II. Since then, the electromagnetic environment has been in a constant state of evolution toward more sophisticated jam-resistant and convert forms of modulation. The thrust of this paper focuses on developments in the theory and algorithms for detection, characterization, and exploitation of advanced waveforms using new mathematical signal processing tools introduced within the past decade. Specifically, quadratic time-frequency signal representations, wavelet transforms, and cyclostationary signal processing are introduced. This overview demonstrates the importance of these advanced techniques in a clear and concise manner. Applications and future research activities are described in this significant area that is gaining much attention in a variety of technical fields.","PeriodicalId":332694,"journal":{"name":"Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996","volume":"324 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124294920","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Performance analysis and simulation of optical direct detection FSK and DPSK systems","authors":"S. Majumder, M. Alam","doi":"10.1109/NAECON.1996.517724","DOIUrl":"https://doi.org/10.1109/NAECON.1996.517724","url":null,"abstract":"A detailed computer simulation of optical FSK and DPSK transmission systems is carried out with the direct detection receivers using Mach-Zehnder interferometer (MZI). The performance degradation of the systems due to the combined effect of the fiber chromatic dispersion and receiver noise is evaluated. The simulation results show that the DPSK system is less sensitive to fiber chromatic dispersion and for a dispersion penalty of 1 dB, the maximum allowable fiber length is around 80 km for FSK and 250 km for DPSK using a dispersion index of 0.05.","PeriodicalId":332694,"journal":{"name":"Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123603817","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Brekka, V. Maksimović, C. Picardal, K. Iftekharuddin
{"title":"Risk management and systems engineering discipline","authors":"L. Brekka, V. Maksimović, C. Picardal, K. Iftekharuddin","doi":"10.1109/NAECON.1996.517748","DOIUrl":"https://doi.org/10.1109/NAECON.1996.517748","url":null,"abstract":"An effective risk management model for complex programs requires: (1) integrated treatment of the potential technical, schedule, and cost impacts of risks; (2) full participation of the program manager, system engineer, and program control manager in the identification, assessment, mitigation and tracking of risks; (3) early identification of risks by the engineering staff, with checks by program control, the program manager, and outside experts; and (4) consideration of program options in terms of how they support the client's overall program. The model has been introduced on space and defense programs, and has been found to represent an extension of good systems engineering, modified by additional input from program management and program control. For small programs, the model has been found implicitly in use by small teams driven by systems engineering principles. For large programs, risk management is more difficult to effectively implement unless those programs are structured around smaller teams, such as integrated product teams. When dealing with integrated product teams, the model must be applied at two levels: (1) within each team, and (2) at the program level to deal with the interaction of those teams. Guidelines are presented for the implementation of risk management within teams and at the program level of large programs. The model applies to both hardware and software programs.","PeriodicalId":332694,"journal":{"name":"Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125962634","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Modeling and simulation trends and J-MASS technology","authors":"W. McQuay","doi":"10.1109/NAECON.1996.517707","DOIUrl":"https://doi.org/10.1109/NAECON.1996.517707","url":null,"abstract":"The Air Force envisions an integrated, common modeling and simulation (M&S) environment that will be accessed by analysts, warfighters, developers, and testers supporting the range of Air Force tasks, from determining requirements through conducting operations. This paper summarizes trends in the new vision for M&S and in the simulation technology that can be employed to implement the simulation systems of the future. Joint M&S standards will provide key advanced technologies for future simulation applications. The Joint Modeling and Simulation System (J-MASS) is a key ingredient in these new technologies and is envisioned as the modeling system for the development, acquisition, and test and evaluation process.","PeriodicalId":332694,"journal":{"name":"Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126111615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}