NAECON 2014 - IEEE National Aerospace and Electronics Conference最新文献_第4页

Optimized fingerprint generation using unintentional emission radio-frequency distinct native attributes (RF-DNA) 利用非故意发射射频固有属性(RF-DNA)优化指纹生成

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045829

Randall D. Deppensmith, Samuel J. Stone

引用次数: 9

S-band radar based on Lyrtech Software Defined Radio 基于 Lyrtech 软件无线电的 S 波段雷达

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045847

Siyang Cao, Yuan F. Zheng, R. Ewing

引用次数: 1

Double-density dual-tree wavelet-based polarimetry analysis 基于双密度双树小波的偏振分析

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045789

K. Harrity, Soundararajan Ezekiel, A. Bubalo, Erik Blasch, M. Alford

{"title":"Double-density dual-tree wavelet-based polarimetry analysis","authors":"K. Harrity, Soundararajan Ezekiel, A. Bubalo, Erik Blasch, M. Alford","doi":"10.1109/NAECON.2014.7045789","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045789","url":null,"abstract":"For the past two decades, the Discrete Wavelet Transformation (DWT) has been successfully applied to many fields. For image processing applications, the DWT can produce non-redundant representations of an input image with greater performance than other wavelet methods. Further, the DWT provides a better spatial and spectral localization of image representation, capable of revealing smaller changes, trends, and breakdown points that classical methods often miss. However, the DWT has its own limitations and disadvantages such as lack of shift invariance. That is, if the input signal or image is shifted, then the wavelet coefficients will exacerbate that shift. The DWT also lacks the ability to represent directional cases. The Double Density Dual-Tree Discrete Wavelet Transformation (D3TDWT) is a relatively new and enhanced version of the DWT with two scaling functions and four distinct wavelets designed in such a way that one pair of wavelets is offset with another pair so that the first pair lies in between the second. In this paper, we propose a D3TDWT polarimetry analysis method to analyze Long Wave Infrared (LWIR) polarimetry imagery to discriminate objects such as people and vehicles from background clutter. The D3TDWT method can be applied to a wide range of applications such as change detection, shape extraction, target recognition, and simultaneous tracking and identification.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114956331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

No-reference blur metric using double-density and dual-tree two-dimensional wavelet transformation 无参考模糊度量使用双密度和双树二维小波变换

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045787

Soundararajan Ezekiel, K. Harrity, Erik Blasch, A. Bubalo

{"title":"No-reference blur metric using double-density and dual-tree two-dimensional wavelet transformation","authors":"Soundararajan Ezekiel, K. Harrity, Erik Blasch, A. Bubalo","doi":"10.1109/NAECON.2014.7045787","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045787","url":null,"abstract":"Over the past decade the digital camera has become widely available in many devices such as cell phones, computers, etc. Therefore, the perceptual quality of digital images is an important and necessary requirement to evaluate digital images. To improve the quality of images captured with camera, we must identify and measure the artifacts that cause blur within the images. Blur is mainly caused by pixel intensity due to multiple sources. The most common types of blurs are known as object motion, defocus, and camera motion. In the last two decades, the discrete wavelet transformation (DWT) has become a cutting-edge technology in the signal and image processing field for such applications as denoising. The disadvantage of the DWT is that it is not able to directly observe blur coefficients. In this paper, we propose a novel framework for a blur metric for an image. Our approach is based on the double-density dual tree two dimensional wavelet transformations (D3TDWT) which simultaneously processes the properties of both the double-density DWT and dual tree DWT. We also utilize gradient to evaluate blurring artifacts and measure the image quality.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"275 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114651884","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

A numerical examination of the diffraction properties of profiled beam transmission through binary apertures and random phase screens using fresnel-kirchhoff diffraction theory 用菲涅耳-基尔霍夫衍射理论数值研究了异形光束通过二元孔径和随机相屏的衍射特性

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045819

Monish R. Chatterjee, Fathi H. A. Mohamed

{"title":"A numerical examination of the diffraction properties of profiled beam transmission through binary apertures and random phase screens using fresnel-kirchhoff diffraction theory","authors":"Monish R. Chatterjee, Fathi H. A. Mohamed","doi":"10.1109/NAECON.2014.7045819","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045819","url":null,"abstract":"Propagation of uniform and profiled electromagnetic beams through apertures with binary amplitude transmission and random phase distributions at the far field (Fraunhofer limit) is investigated, and simulation results based on two approaches, (a) using the Fresnel-Kirchhoff diffraction integral directly, and (b) using a split step propagation concept whereby the aperture or phase screen is placed at an arbitrary location along the propagation path, are applied separately and compared. Results for uniform, Gaussian and Bessel profile beams propagating through a variety of binary apertures are examined and compared with analytical predictions wherever feasible. A power spectrum density of the modified von Karman spectrum (MVKS) model is also used to describe a planar aperture as a random phase distribution. This approach is prompted by the problem of electromagnetic propagation through a turbulent medium. Simulation results are limited to the diffraction intensity calculation of the intensity in the far-field or Fraunhofer regime evaluated in the in the transverse (image) plane. Additional examples, including diffraction through thin sinusoidal amplitude grating and far-field diffraction following propagation through a random phase screen for profiled input beams are also presented. These results, derived serendipitously while examining turbulent propagation, provide insight into the mechanisms of diffraction through variable apertures, beam profiles and medium characteristics. It should therefore be of interest to the study in general of near-and far-field diffraction of electromagnetic waves taken as a whole.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114682182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

No-reference multi-scale blur metric 无参考多尺度模糊度量

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045786

K. Harrity, Soundararajan Ezekiel, M. Ferris, Maria Cornacchia, Erik Blasch

{"title":"No-reference multi-scale blur metric","authors":"K. Harrity, Soundararajan Ezekiel, M. Ferris, Maria Cornacchia, Erik Blasch","doi":"10.1109/NAECON.2014.7045786","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045786","url":null,"abstract":"In recent years, digital cameras have been widely used for image capturing. These devices are equipped in cell phones, laptops, tablets, webcams, etc. Image quality is an important characteristic for any digital image analysis. Historically, techniques to assess image quality for these mobile products require a standard image to be used as a reference image. In this case, Root Mean Square Error and Peak Signal to Noise Ratio can be employed to measure the quality of the images. However, these methods are not valid if there is no reference image. Recent studies show that a Contourlet is a multi-scale transformation - which is an extension of two dimensional wavelet transformations - that can operate on an image at different noise levels without a reference image. In this paper, we develop a no-reference blur metric for digital images based on edges and noises in images. In our approach, a Contourlet transformation is applied to the blurred image, which applies a Laplacian Pyramid and Directional Filter Banks to get various image representations. The Laplacian Pyramid is a difference of Gaussian Pyramids between two consecutive levels. At each level in the Gaussian Pyramid, an image is smoothed with two Gaussians of different sizes then subtracted, subsampled and the input image is decomposed into directional sub-bands of images. Directional filter banks are designed to capture high frequency components representing directionality of the images which is similar to detailed coefficient in wavelet transformation. We focus on blur-measuring for each level and directions at the finest level of images to assess the image quality. Using the ratio of blur pixels to total pixels, we compare our results, which require no reference image, to standard full-reference image statistics. The results demonstrate that our proposed no reference metric has an increasing relationship with the blurriness of an image and is more sensitive to blur than the correlation full-reference metric.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132783949","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Novel composite film of Ag-Si to develop an infrared (8–14 um) detector 新型Ag-Si复合薄膜用于研制红外(8-14 μ m)探测器

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045844

Moussa Souare, C. Bates, C. Papachristou, R. Ewing

引用次数: 0

Super-resolution imaging by arrays of high-index spheres embedded in transparent matrices 在透明矩阵中嵌入高折射率球体阵列的超分辨率成像

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045775

K. Allen, Navid Farahi, Yangcheng Li, N. Limberopoulos, D. Walker, A. Urbas, V. Astratov

引用次数: 30

Scaled carbon-ionogel supercapacitors for electronic circuits 电子电路用碳离子凝胶超级电容器

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045778

Leland Smith, G. Leung, Jonathan Lau, B. Kolasa, R. Burkholder, Michael Jack, B. Dunn, C. O. Chui

引用次数: 1

Hardware trojan state detection for analog circuits and systems 模拟电路和系统的硬件木马状态检测

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI: 10.1109/NAECON.2014.7045837

Yen-Ting Wang, Qianqian Wang, Degang Chen, R. Geiger

引用次数: 11