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Capacitance Spectroscopy of Semiconductors最新文献

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An Introduction to Capacitance Spectroscopy in Semiconductors 半导体电容光谱学导论
Capacitance Spectroscopy of Semiconductors Pub Date : 2018-07-06 DOI: 10.1201/B22451-1
Jian V. Li, J. Heath
{"title":"An Introduction to Capacitance Spectroscopy in Semiconductors","authors":"Jian V. Li, J. Heath","doi":"10.1201/B22451-1","DOIUrl":"https://doi.org/10.1201/B22451-1","url":null,"abstract":"","PeriodicalId":308289,"journal":{"name":"Capacitance Spectroscopy of Semiconductors","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124730334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Probing Dielectric Constant at the Nanoscale with Scanning Probe Microscopy 扫描探针显微镜在纳米尺度上探测介电常数
Capacitance Spectroscopy of Semiconductors Pub Date : 2018-07-06 DOI: 10.1201/B22451-13
L. Fumagalli, G. Gomila
{"title":"Probing Dielectric Constant at the Nanoscale with Scanning Probe Microscopy","authors":"L. Fumagalli, G. Gomila","doi":"10.1201/B22451-13","DOIUrl":"https://doi.org/10.1201/B22451-13","url":null,"abstract":"","PeriodicalId":308289,"journal":{"name":"Capacitance Spectroscopy of Semiconductors","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121351214","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Deep-Level Transient Spectroscopy 深层瞬态光谱学
Capacitance Spectroscopy of Semiconductors Pub Date : 2018-07-06 DOI: 10.1201/B22451-3
J. Lauwaert, S. Khelifi
{"title":"Deep-Level Transient Spectroscopy","authors":"J. Lauwaert, S. Khelifi","doi":"10.1201/B22451-3","DOIUrl":"https://doi.org/10.1201/B22451-3","url":null,"abstract":"","PeriodicalId":308289,"journal":{"name":"Capacitance Spectroscopy of Semiconductors","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129285924","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Microwave Impedance Microscopy 微波阻抗显微镜
Capacitance Spectroscopy of Semiconductors Pub Date : 2018-07-06 DOI: 10.1201/B22451-15
Yong-Tao Cuia, E. Y. Ma
{"title":"Microwave Impedance Microscopy","authors":"Yong-Tao Cuia, E. Y. Ma","doi":"10.1201/B22451-15","DOIUrl":"https://doi.org/10.1201/B22451-15","url":null,"abstract":"","PeriodicalId":308289,"journal":{"name":"Capacitance Spectroscopy of Semiconductors","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126244694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Comparison of Capacitance Spectroscopy for PV Semiconductors PV半导体电容光谱的比较
Capacitance Spectroscopy of Semiconductors Pub Date : 2018-07-06 DOI: 10.1201/B22451-8
A. Halverson
{"title":"Comparison of Capacitance Spectroscopy for PV Semiconductors","authors":"A. Halverson","doi":"10.1201/B22451-8","DOIUrl":"https://doi.org/10.1201/B22451-8","url":null,"abstract":"","PeriodicalId":308289,"journal":{"name":"Capacitance Spectroscopy of Semiconductors","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127923743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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