{"title":"Probing Dielectric Constant at the Nanoscale with Scanning Probe Microscopy","authors":"L. Fumagalli, G. Gomila","doi":"10.1201/B22451-13","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":308289,"journal":{"name":"Capacitance Spectroscopy of Semiconductors","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Capacitance Spectroscopy of Semiconductors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/B22451-13","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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