Trans. I R E Prof. Group Electron. Comput.最新文献

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High density digital recording system 高密度数字记录系统
Trans. I R E Prof. Group Electron. Comput. Pub Date : 1952-12-01 DOI: 10.1109/IREPGELC.1952.6499401
J. Potter, P. Michel
{"title":"High density digital recording system","authors":"J. Potter, P. Michel","doi":"10.1109/IREPGELC.1952.6499401","DOIUrl":"https://doi.org/10.1109/IREPGELC.1952.6499401","url":null,"abstract":"The numerous economic uses of magnetic recording today bear witness to the scope and quality of the development in recent years on the media, transducers, kinematics, circuits, and systems involved.","PeriodicalId":304144,"journal":{"name":"Trans. I R E Prof. Group Electron. Comput.","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1952-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123933742","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
An automatic cruise control computer for long range aircraft 用于远程飞机的自动巡航控制计算机
Trans. I R E Prof. Group Electron. Comput. Pub Date : 1952-12-01 DOI: 10.1109/IREPGELC.1952.6499399
J. R. Shull
{"title":"An automatic cruise control computer for long range aircraft","authors":"J. R. Shull","doi":"10.1109/IREPGELC.1952.6499399","DOIUrl":"https://doi.org/10.1109/IREPGELC.1952.6499399","url":null,"abstract":"This paper presents a qualitative discussion of present manual cruise control techniques and a proposed automatic cruise control system for long range military aircraft. A mechanization of the cruise control computer and its operation are described, and a comparison of the automatic system operation with current manual techniques is presented. Although the application of the cruise control computer to long range military aircraft in particular is discussed, the principles in general would apply to long range commercial aircraft as well.","PeriodicalId":304144,"journal":{"name":"Trans. I R E Prof. Group Electron. Comput.","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1952-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123120559","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A computer for flaw plotting 用于缺陷绘图的计算机
Trans. I R E Prof. Group Electron. Comput. Pub Date : 1952-12-01 DOI: 10.1109/IREPGELC.1952.6499402
Noel B. Braymer
{"title":"A computer for flaw plotting","authors":"Noel B. Braymer","doi":"10.1109/IREPGELC.1952.6499402","DOIUrl":"https://doi.org/10.1109/IREPGELC.1952.6499402","url":null,"abstract":"Ultrasonic vibrations provide the only known physical means for the non-destructive examination of thick sections of dense materials. The basic method is simple; the equipment is relatively inexpensive, and there is no hazard to operating personnel. Ultrasonics will not completely supplant the older, established techniques of radiographic, magnetic, or dye inspection methods, but it will do inspection jobs which cannot be done by any of these methods. The most commonly used ultrasonic inspection method at the present time is the “contact” method, where the transducer is pressed directly against the surface of the part to be inspected. This is not a method readily adapted to mechanized scanners. The mechanized scanner proceeds in an orderly manner, and avoids the repetitive scanning generally required by the manual method to assure complete coverage.","PeriodicalId":304144,"journal":{"name":"Trans. I R E Prof. Group Electron. Comput.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1952-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131080475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Static-dynamc design of flip-flop circuits 触发器电路的静动态设计
Trans. I R E Prof. Group Electron. Comput. Pub Date : 1952-12-01 DOI: 10.1109/IREPGELC.1952.6499395
C. L. Wanlass
{"title":"Static-dynamc design of flip-flop circuits","authors":"C. L. Wanlass","doi":"10.1109/IREPGELC.1952.6499395","DOIUrl":"https://doi.org/10.1109/IREPGELC.1952.6499395","url":null,"abstract":"The following investigation on flip-flop circuits was originally undertaken to determine if a reliable flip-flop circuit could be designed to operate from a low supply voltage using tubes that are presently available and in production. The reason for designing the circuit to operate from a low supply voltage is to reduce the required power consumption of such information storage devices to a minimum and to provide a low d-c level output. The low d-c level output voltages of the two stable states of the circuit and the low flip-flop power dissipation enables an entire computer to operate from one regulated power supply rather than the numerous regulated supplies required by most computers. The low power dissipation is also essential since the reliability of germanium diodes and other heat sensitive components is greatly increased as their operating temperature is decreased.","PeriodicalId":304144,"journal":{"name":"Trans. I R E Prof. Group Electron. Comput.","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1952-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127091952","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Applications of CRC-105 decimal digital differential analyzer CRC-105十进制数字差分分析仪的应用
Trans. I R E Prof. Group Electron. Comput. Pub Date : 1952-12-01 DOI: 10.1109/IREPGELC.1952.6499396
E. Weiss
{"title":"Applications of CRC-105 decimal digital differential analyzer","authors":"E. Weiss","doi":"10.1109/IREPGELC.1952.6499396","DOIUrl":"https://doi.org/10.1109/IREPGELC.1952.6499396","url":null,"abstract":"In the two years since the first digital differential analyzer was put in operation, it has been the complexity of filling and operating such machines, rather than any difficulty in coding them for a problem, that has constituted the main impediment to convenience and efficiency in their use. In filling some hundred-odd binary digits, one at a time, for each integrator information, the possibility of error is great. For instance, let us look at the binary number","PeriodicalId":304144,"journal":{"name":"Trans. I R E Prof. Group Electron. Comput.","volume":"138 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1952-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133130445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Correction [to "Symbolic Programming" by N. Rochester] 修正[N. Rochester的“符号编程”]
Trans. I R E Prof. Group Electron. Comput. Pub Date : 1900-01-01 DOI: 10.1109/IREPGELC.1953.6499406
{"title":"Correction [to \"Symbolic Programming\" by N. Rochester]","authors":"","doi":"10.1109/IREPGELC.1953.6499406","DOIUrl":"https://doi.org/10.1109/IREPGELC.1953.6499406","url":null,"abstract":"","PeriodicalId":304144,"journal":{"name":"Trans. I R E Prof. Group Electron. Comput.","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115689498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Review section 评论部分
Trans. I R E Prof. Group Electron. Comput. Pub Date : 1900-01-01 DOI: 10.1109/IREPGELC.1954.6499449
H. D. Huskey
{"title":"Review section","authors":"H. D. Huskey","doi":"10.1109/IREPGELC.1954.6499449","DOIUrl":"https://doi.org/10.1109/IREPGELC.1954.6499449","url":null,"abstract":"","PeriodicalId":304144,"journal":{"name":"Trans. I R E Prof. Group Electron. Comput.","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126793824","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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