{"title":"Rate theory of radiation-induced conductivity of fluoroethylene propylene (FEP)","authors":"B. Gross, H. von Seggern, D. Berkley","doi":"10.1109/CEIDP.1982.7726534","DOIUrl":"https://doi.org/10.1109/CEIDP.1982.7726534","url":null,"abstract":"With the widespread use of dielectric materials in high-radiation environments the behavior of the radiation-induced conductivity of dielectrics has acquired considerable importance. Numerous authors have investigated the dielectric response to short, intense bursts of radiation. The long-time behavior of the induced conductivity of insulators determines the amount of charge build-up which has been observed in polymeric materials covering space satellites exposed to electronic radiation found in space [1].","PeriodicalId":301436,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1982","volume":"51 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122846236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The computation of an electrostatic field","authors":"J. Tomcfk","doi":"10.1109/CEIDP.1982.7726549","DOIUrl":"https://doi.org/10.1109/CEIDP.1982.7726549","url":null,"abstract":"The programs MESH and SIMU have been written in FORTRAN to compute the electrostatic fields of plane and axisymmetric electrode systems in the absence of space charges. These programs are fast and accurate enough for the majority of practical cases.","PeriodicalId":301436,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1982","volume":"179 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116143662","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
E. Sacher, J. Klemberg-Sapieha, H. Schreiber, M. Wertheimer
{"title":"Plasma-polymerized organosilicon films for use in electronic circuit technology","authors":"E. Sacher, J. Klemberg-Sapieha, H. Schreiber, M. Wertheimer","doi":"10.1109/CEIDP.1982.7726525","DOIUrl":"https://doi.org/10.1109/CEIDP.1982.7726525","url":null,"abstract":"Plasma techniques have become widely accepted in the semiconductor industry for a range of applications. These can conveniently be divided into two broad categories, namely 1. plasma deposition, and 2. plasma etching.","PeriodicalId":301436,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1982","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124264472","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The growth of water trees in dry and steah cured polyethylene at 1.9 MV/m, 50Hz, and their influence on cable life in the stress range 15 to 4MV/m","authors":"R. Naybour","doi":"10.1109/CEIDP.1982.7726588","DOIUrl":"https://doi.org/10.1109/CEIDP.1982.7726588","url":null,"abstract":"Water tree growth in polyethylene has been extensively investigated but the long term life in wet environments remains uncertain. The vast majority of previous work has involved exposure to water at stresses higher than the operating stress and tests to breakdown at stresses considerably above the service stress. This paper describes work to determine the water tree growth characteristics at the service stress and also to investigate cable life at stresses as low as twice service stress. Two types of cross linked polyethylene (XLPE) insulated cable were used, one processed in a dry gaseous atmosphere, the other processed in the conventional steam atmosphere.","PeriodicalId":301436,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1982","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114274270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Abdolall, H. Orton, M. W. Reynolds, B. Robert, R. Kennedy, B. Dayman
{"title":"Some physicochemical aspects of water trees","authors":"K. Abdolall, H. Orton, M. W. Reynolds, B. Robert, R. Kennedy, B. Dayman","doi":"10.1109/CEIDP.1982.7726586","DOIUrl":"https://doi.org/10.1109/CEIDP.1982.7726586","url":null,"abstract":"Some physicochemical aspects of water trees are investigated using far infrared and molecular probes. The results strongly indicate that water treeing is due to changes in the material properties of the insulation involving breakdown of the polymer chains.","PeriodicalId":301436,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1982","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134642752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis of pressure-wave methods for the non-destructive determination of spatial charge or field distributions in homogeneous dielectrics","authors":"R. Gerhard-Multhaupt","doi":"10.1109/CEIDP.1982.7726514","DOIUrl":"https://doi.org/10.1109/CEIDP.1982.7726514","url":null,"abstract":"Detailed knowledge of the electric charge or field distribution in the bulk of dielectrics is necessary for the understanding of charge-storage and charge-transport phenomena. The most successful techniques for the experimental determination of spatial charge or field distributions in dielectrics, are based on the transit of a compression wave through the sample [1-6]. In the present study, the basic equations for pressure-pulse and pressure-step experiments are derived from first principles. The pressure dependence of the relative permittivity ε is investigated, and the influence of this dependence on the signal amplitude is calculated for nonpolar and for polar dielectrics. The response equations for pressure-step, pressure-pulse and arbitrary pressure-profile experiments are calculated.","PeriodicalId":301436,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1982","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116208501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Testing the resistance of polyethylene to water trees","authors":"S. Nunes, M. Shaw, S. Shaw, R. Weiss","doi":"10.1109/CEIDP.1982.7726587","DOIUrl":"https://doi.org/10.1109/CEIDP.1982.7726587","url":null,"abstract":"For the past decade, water trees have been a subject of great interest to the utility industry. These unpredictable defects are perplexing in that while it has been rather easy to define the growth requirements of trees in insulation systems, it has been difficult to determine the effects of environmental parameters on the rate of tree growth.","PeriodicalId":301436,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1982","volume":"93 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131927354","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Y. Kusama, M. Ito, S. Okada, Y. Nakase, K. Yoshida
{"title":"Effect of a simulated LOCA testing period on durabilities of insulating and jacketing materials for reactor cables","authors":"Y. Kusama, M. Ito, S. Okada, Y. Nakase, K. Yoshida","doi":"10.1109/CEIDP.1982.7726538","DOIUrl":"https://doi.org/10.1109/CEIDP.1982.7726538","url":null,"abstract":"In the typical examples of LOCA (loss-of-coolant-accident) simulation, presented by IEEE Std 323-1974, the test period was estimated to be three months for BWR and one year for PWR. We studied test conditions which were expected to influence the deterioration of elastomeric materials used in a nuclear reactor, such as heating or cooling rate in the first transient part of a LOCA profile, dose rate effect, and effect of oxygen in the LOCA environment. Studies have progressed since 1979 in JAERI to verify an adequacy of qualification testing method. In this report, we present the effects of an exposure length in a simulated LOCA environment on the degradation of insulating and jacketing materials for reactor cables. In addition, the effect of temperature on the degradation rate of these materials during the cooling phase after a LOCA which follows the first transient phase.","PeriodicalId":301436,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1982","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132088904","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Resistivity of ultra drawn polyvinylidene fluoride","authors":"A. J. Bur","doi":"10.1109/CEIDP.1982.7726527","DOIUrl":"https://doi.org/10.1109/CEIDP.1982.7726527","url":null,"abstract":"Previous measurements from this laboratory showed that there is a significant difference in the electrical breakdown strength and resistivities of mechanically oriented and unoriented PVDF [1]. Unoriented samples not only had low breakdown strength (0.5 MV/cm) but also had resistivities which were an order of magnitude or more less than the resistivities of the mechanically oriented samples. Although we have not measured the breakdown strength for oriented PVDF, we have observed that it is high enough to permit the application of poling fields as high as 2.5 MV/cm at room temperature for one minute.","PeriodicalId":301436,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1982","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127510443","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The DC conductivity of poly(vinylidene fluoride) films","authors":"E. Sacher","doi":"10.1109/CEIDP.1982.7726521","DOIUrl":"https://doi.org/10.1109/CEIDP.1982.7726521","url":null,"abstract":"Poly(vinylidene flouride), PVDF, has recently attained commercial importance because, when oriented and poled, it becomes both piezo- and pyroelectric [1]. Yet, when determination of the DC conductivity is required over a temperature range, it is this same pyroelectricity which interferes, virtually precluding the determination of the DC conductivity in this material.","PeriodicalId":301436,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1982","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126515088","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}