发布求助
文献互助 智能选刊 最新文献

Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics最新文献

筛选
英文 中文
The significance of slow charge carriers for the inception of treeing 慢载流子对树形开始的意义
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411512
S. Gluchowski, J. Juchniewicz
{"title":"The significance of slow charge carriers for the inception of treeing","authors":"S. Gluchowski, J. Juchniewicz","doi":"10.1109/ICSD.1983.7411512","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411512","url":null,"abstract":"The results of these exploratory experiments show the plausibility of the idea linking the initial processes of electrical ageing, preceding the initiation of classical treeing, with the movement, energy transfer of slow charge carriers. Further investigations in this field are in progress.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121410162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Long term breakdown of polypropylene films 聚丙烯薄膜长期破裂
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411553
S. Chniba, R. Tobazéon
{"title":"Long term breakdown of polypropylene films","authors":"S. Chniba, R. Tobazéon","doi":"10.1109/ICSD.1983.7411553","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411553","url":null,"abstract":"Breakdown (BKD) is a very complex problem - and often a confusing one -. A great number of possible mechanisms of various origins (electrical, thermal, mechanical, etc …) has been proposed. In certain solids materials (for instance, semi-conductors) theoretical predictions are confirmed by experimental results and intrinsic BKD fields (independent of electrodes, gap, voltage shape and duration) can be evaluated. In solid insulators, it is difficult to assure that any single mechanism is uniquely responsible, especially in “long term” BKD (i.e. time duration extending from say 1s to months or years). There are the major problems of selection and engineering of insulators for long term use. The purpose of our work is to evaluate the physicochemical factors involved in such conditions. We used mainly polypropylene (PP) films dry, wetted or impregnated with different liquids, and life tests (voltage vs time: V-t curves) were performed under DC and AC voltage.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"7 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113939179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Thermal and electrical behaviour of stress relieving coatings 应力消除涂层的热电性能
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411500
R. I. Frame, D. Tedford
{"title":"Thermal and electrical behaviour of stress relieving coatings","authors":"R. I. Frame, D. Tedford","doi":"10.1109/ICSD.1983.7411500","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411500","url":null,"abstract":"(1) An evaluation of the material used for stress relief has been undertaken using TGA and isothermal methods which has shown the alkyd resin based sample to be more resilient to long-term thermal ageing.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133140265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Electrical breakdown in solid and liquid insulating materials 固体和液体绝缘材料的电击穿
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411526
E. Forster
{"title":"Electrical breakdown in solid and liquid insulating materials","authors":"E. Forster","doi":"10.1109/ICSD.1983.7411526","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411526","url":null,"abstract":"The study of electrical breakdown in insulators has historically followed the classical segregation of materials into gases, liquids and solids. Each of these three classes were investigated separately and independently of the others. Recent progress in the area of liquids has suggested that it might be useful to look for common features between liquid and solid breakdown. With the advent of sophisticated electro-optical techniques the development of streamers can now be followed in transparent liquids and similarities in their development and those observed by other techniques in polyimeric solids become evident. In the following sections an attempt is made to point out common features of the breakdown process in solids and liquids.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"145 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115472459","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Physico chemical and electric modifications of polyethylene terephatalate (PET films and yarns) treated by corona discharge 电晕放电处理的聚对苯二甲酸乙二醇酯(PET)薄膜和纱线的理化和电学改性
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411489
O. Demuth, F. Rouzbehi, M. Goldman, J. Amouroux
{"title":"Physico chemical and electric modifications of polyethylene terephatalate (PET films and yarns) treated by corona discharge","authors":"O. Demuth, F. Rouzbehi, M. Goldman, J. Amouroux","doi":"10.1109/ICSD.1983.7411489","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411489","url":null,"abstract":"The surface treatment of a yarn or a film of PET by corona discharge in a controlled atmosphere leads us to the physico-chemical modifications of the materials.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"6 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129294342","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Radiative-tunnel hopping diffusion of electrons over a system of F-centres in pre-breakdown electric fields in ionic crystals - theoretical approach 离子晶体中预击穿电场中电子在f中心系统上的辐射隧道跳变扩散-理论方法
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411480
A. Berezin
{"title":"Radiative-tunnel hopping diffusion of electrons over a system of F-centres in pre-breakdown electric fields in ionic crystals - theoretical approach","authors":"A. Berezin","doi":"10.1109/ICSD.1983.7411480","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411480","url":null,"abstract":"One can also compare these τ<inf>RTT</inf> 's with the rate of direct field ionization of an F'-centre. The theory developed in [8] gives for the characteristic ionization time of a particle trapped in a delta-well of the effective strength γ, the following order-of-magnitude estimate: equation where E<inf>0</inf> = 5.142 × 10<sup>9</sup> V/cm is an atomic unit of an electric field (equation). For E = 1 MV/cm and γ<sup>−1</sup> = 1.89 Å, eq. (6) gives a very large value τ<inf>ioniz</inf> ≃ 1.65 × 10<sup>19</sup> sec, i.e., direct ionization of F '-centre for these parameters is a very small effect. It should be noted, however, that eq. (6) is very sensitive to the values of γ<sup>−1</sup> and E and a moderate increase of E can make the direct field ionization comparable with inter-site RTT jumps considered above.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125343365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The role of electrodes in conduction and breakdown phenomena in solid dielectrics 电极在固体介质中传导和击穿现象中的作用
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411510
T. Lewis
{"title":"The role of electrodes in conduction and breakdown phenomena in solid dielectrics","authors":"T. Lewis","doi":"10.1109/ICSD.1983.7411510","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411510","url":null,"abstract":"It is hoped that further attention will be given to the molecular processes initiated at electrodes, since it is clear from examination of breakdown pathways that these are~in the early stages, both molecular in dimension and associated with neighbouring metal electrodes. The importance of considering the electrochemistry of the likely processes on a molecular scale cannot be overstressed. For too long macroscopic physical models have been employed to explain what must be processes of free-radical electrochemistry of an intense kind. The present contribution concentrates on the molecular ion states involved but much more needs to be known about charge transfer at interfaces, whether they be at the electrode boundaries or at interior interfaces within the polymeric dielectrics.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124839441","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Physical characterization of different dielectrics for thin film capacitors in gaAs MMIC's gaAs MMIC薄膜电容器中不同介质的物理特性
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411546
Y. Danto, A. Barrière, T. Girma, J. Pichon, P. Jay, C. Rumelhard
{"title":"Physical characterization of different dielectrics for thin film capacitors in gaAs MMIC's","authors":"Y. Danto, A. Barrière, T. Girma, J. Pichon, P. Jay, C. Rumelhard","doi":"10.1109/ICSD.1983.7411546","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411546","url":null,"abstract":"It is clear from this study that the geometry of a M.I.M. capacitor is important in determining the reliability of the component. The means of deposition used for the dielectrics is obviously not well suited to Si3N4, and indeed other of the dielectrics considered may show improved characteristics when deposited by other methods, for example anodic oxidation of Ta for Ta2O5 {1}. A continuation of this study will consider other types of deposited film, and together with more measurements of fundamental parameters involved, will aim to improve the understanding of the processes controlling the behaviour reported here.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127347110","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Low energy electron conduction in insulators 绝缘体中的低能电子传导
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411497
V. Dallacasa, C. Paracchini, G. Schianchi
{"title":"Low energy electron conduction in insulators","authors":"V. Dallacasa, C. Paracchini, G. Schianchi","doi":"10.1109/ICSD.1983.7411497","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411497","url":null,"abstract":"The electrical conduction due to trapped electrons with energy higher than the potential barrier (Poole-Frenkel effect) is claimed to take part in several materials /1/. Much less is known about the current due to electrons whose energy is lower than the trapping well. A classical model is here formulated to take into account such contribution and the theoretical results are compared with those experimentally obtained in CdF 2: Gd crystals.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114685334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The influence of polymer composition on the hygrothermal stability of the dielectric characteristics of epoxy resins 聚合物组成对环氧树脂介电特性湿热稳定性的影响
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411548
L. Egiziano, P. Orsini, A. Apicella, L. Nicolais, R. Tessieri
{"title":"The influence of polymer composition on the hygrothermal stability of the dielectric characteristics of epoxy resins","authors":"L. Egiziano, P. Orsini, A. Apicella, L. Nicolais, R. Tessieri","doi":"10.1109/ICSD.1983.7411548","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411548","url":null,"abstract":"The two classes of epoxy matrices, characterized by low and high crosslinking densities, have been hypothesized to craze on a microscopic level when exposed to relatively high temperatures (60–70°C) in moist environments.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130685584","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信
小红书