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Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics最新文献

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Computerized image analysis of dielectric breakdown phenomena in polyethylene 聚乙烯介质击穿现象的计算机图像分析
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1984-06-01 DOI: 10.1109/TEI.1984.298757
J. Groeger
{"title":"Computerized image analysis of dielectric breakdown phenomena in polyethylene","authors":"J. Groeger","doi":"10.1109/TEI.1984.298757","DOIUrl":"https://doi.org/10.1109/TEI.1984.298757","url":null,"abstract":"Improvements in sample preparation methods are very important to the analysis of all the dielectric breakdown phenomena present in polyethylene insulated cables. Computerized image analysis affords a method of automatically scanning a sample to count trees, voids, and inclusions. This method is absolute whereas most other methods currently used rely on the measurement of small numbers of samples. Tree size distributions have been found to be very heavily weighted in the size range of 1 µm to 10 µm. This size range is commonly ignored with presently used staining and observation methods.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1984-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124963232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Equipment for the energy measurement of partial discharges 局部放电能量测量设备
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1984-06-01 DOI: 10.1109/TEI.1984.298752
G. Garcia, B. Fallou
{"title":"Equipment for the energy measurement of partial discharges","authors":"G. Garcia, B. Fallou","doi":"10.1109/TEI.1984.298752","DOIUrl":"https://doi.org/10.1109/TEI.1984.298752","url":null,"abstract":"The energy dissipated by partial discharges (PD) can be estimated from the UiQi. It has been described a particular device able to deal with such a calculation using a correlator unit. With gas chromatography analysis a satisfactory correlation was available between the degradation products of liquid (oil) or solid (pressboard) insulation and the energy of PD.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"2 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1984-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113999041","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Charge injection and transport in a lossy capacitor stressed by a Marx generator 马克思发生器应力下损耗电容器中的电荷注入和输运
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1984-06-01 DOI: 10.1109/TEI.1984.298742
M. Zahn
{"title":"Charge injection and transport in a lossy capacitor stressed by a Marx generator","authors":"M. Zahn","doi":"10.1109/TEI.1984.298742","DOIUrl":"https://doi.org/10.1109/TEI.1984.298742","url":null,"abstract":"Injected charge of density q and mobility μ increases the effective ohmic conductivity π to π + | qμ | where q is time and space dependent. Then, open circuit decay curves at moderate voltages can show a dielectric relaxation time that decreases with increasing voltage while at very high voltages the open circuit decay curves can be non-exponential. Such anomalous behavior has been measured in highly purified water1 and would be present in any material with enough net charge to distort the electric field. A drift dominated conduction model is used to solve for the electric field and charge density distributions and the terminal voltage-current behavior of a lossy capacitor where one electrode injects charge. The capacitor is connected to a Marx capacitor bank so that the injected charge decreases as the Harx voltage decays, the decay rate in turn being in part determined by the injected charge.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1984-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116011295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effects of hydrostatic pressure on electric discharge and treeing properties in polyethylene 静水压力对聚乙烯放电和成树性能的影响
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411511
H. Xie, D. Tu, K. Kao
{"title":"Effects of hydrostatic pressure on electric discharge and treeing properties in polyethylene","authors":"H. Xie, D. Tu, K. Kao","doi":"10.1109/ICSD.1983.7411511","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411511","url":null,"abstract":"Internal discharge and electrical treeing in polymers involve the presence of voids or the creation of low-density channels at high fields to provide a favourable condition for impact ionization. A great deal of experimental evidence indicates that polyethylene contains a high density of microvoids with the sizes varying from less than 1 µm to larger than 10 µm. The microvoids may not be the direct cause of electric discharge, but they may be the source to initiate the formation of low-density channels which in turn initiate the formation of trees. The long-term deterioration in polymers is generally associated with the formation of trees. The purpose of this paper is to present some new results in support of the model that the creation of low-density channels under high fields is the prelude of the formation of trees based on the pressure dependence of electric discharge and treeing properties in polyethylene.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114981186","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The effects of dc prestress on switching surge breakdown phenomena in solid dielectrics 直流预应力对固体介质中开关浪涌击穿现象的影响
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411531
T. Eish
{"title":"The effects of dc prestress on switching surge breakdown phenomena in solid dielectrics","authors":"T. Eish","doi":"10.1109/ICSD.1983.7411531","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411531","url":null,"abstract":"The anomalous breakdown voltage of solid dielectrics increases with the dc voltage prestress when the polarity of the superimposed switching surge voltage and dc voltage are the same.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"105 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115438310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Examination of failed cross-linked polyethylene insulated cables 失效交联聚乙烯绝缘电缆的检验
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411514
J. Groeger, K. Mio, D. Damon, J. Tanaka
{"title":"Examination of failed cross-linked polyethylene insulated cables","authors":"J. Groeger, K. Mio, D. Damon, J. Tanaka","doi":"10.1109/ICSD.1983.7411514","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411514","url":null,"abstract":"Many of the cross-linked polyethylene underground distribution cables removed from service contain visible halos. In an attempt to understand the nature of these halos and to determine what role, if any, they play in the failure mechanism of these cables, characterizations by a variety of means have been initiated. Some of these preliminary results are hereby reported.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121272461","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Kinetics of ionic migration and relaxation in anodic oxide films 阳极氧化膜中离子迁移和弛豫动力学
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411479
V. Parkhutik, V.I. Shershulskij, V. Labunov
{"title":"Kinetics of ionic migration and relaxation in anodic oxide films","authors":"V. Parkhutik, V.I. Shershulskij, V. Labunov","doi":"10.1109/ICSD.1983.7411479","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411479","url":null,"abstract":"Anodic oxide films (AOF) grown on the surface of metals and semiconductors are widely used in various spheres of technology. Although such well-known features of AOF as space charge accumulation, electret effect, thermal instability etc. have attracted much research, their real nature is far from being clearly understood.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"2013 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127345831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Breakdown phenomena in heterogenous insulation systems 非均质绝缘系统中的击穿现象
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411547
B. Sharma
{"title":"Breakdown phenomena in heterogenous insulation systems","authors":"B. Sharma","doi":"10.1109/ICSD.1983.7411547","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411547","url":null,"abstract":"Dielectric breakdown In solids is important phenomena and it is only indicative value. For design purpose proof voltage value should be taken. Because of complex mechanism of breakdown the values differ in thickness inspite of all the parameters being same.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125155918","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High mobility states in polymeric dielectrics: A search by internal photoemission 聚合物电介质中的高迁移率态:内部光电发射的研究
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411493
H. Neff, P. Pfluger, H. Zeller
{"title":"High mobility states in polymeric dielectrics: A search by internal photoemission","authors":"H. Neff, P. Pfluger, H. Zeller","doi":"10.1109/ICSD.1983.7411493","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411493","url":null,"abstract":"Most models of intrinsic dielectric breakdown are based on a “hot” electron mechanism such as avalanche formations by impact ionization. Surprisingly no direct experimental information about the processes which control hot electron properties in polymeric dielectrics is available. As an example, polyethylene (PE) is considered. PE has a band gap of the order of 10 eV and a breakdown field of the order of 10<sup>7</sup> V/cm, which requires a mean free path of the order of 100 Å or a mobility of the order of 100 cm<sup>2</sup>/Vsec for carrier multiplication. This is compatible with the band parameters of PE but at odds with the observed mobilities of 10<sup>−11</sup> – 10<sup>−4</sup> cm<sup>2</sup>/Vsec. <sup>(1)</sup>","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128419751","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Photoinjection from metal electrode into plasma-polymerized thin films: Studies of energy structure 从金属电极光注入等离子体聚合薄膜:能量结构的研究
Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1983-07-04 DOI: 10.1109/ICSD.1983.7411486
J. Tyczkowski, M. Kryszewski
{"title":"Photoinjection from metal electrode into plasma-polymerized thin films: Studies of energy structure","authors":"J. Tyczkowski, M. Kryszewski","doi":"10.1109/ICSD.1983.7411486","DOIUrl":"https://doi.org/10.1109/ICSD.1983.7411486","url":null,"abstract":"The photoinjection investigation reported here show that the width of the transport gap is the same in all films studied and is equal to ca. 6.3 eV. It has also been found that the transport band for holes /responsible for the dark conductivity of these films [12] / is made up of a series of vibration bands separated from one another by a few tenths of an eV.","PeriodicalId":299528,"journal":{"name":"Proceedings of First International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128715839","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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