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2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE最新文献

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Design of a Marx Generator for HEMP filter evaluation taking account of parasitic effect of components 考虑元件寄生效应的HEMP滤波器评价Marx发生器的设计
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE Pub Date : 2016-11-10 DOI: 10.1109/EMCEUROPE.2016.7739191
He Jiang, Jiafeng Zhou, Yi Huang, Yuxuan Zeng, J. Humphries, Qian Xu, Chaoyun Song, Lei Xing, Zhouxiang Fei, Jan Nalborczyk
{"title":"Design of a Marx Generator for HEMP filter evaluation taking account of parasitic effect of components","authors":"He Jiang, Jiafeng Zhou, Yi Huang, Yuxuan Zeng, J. Humphries, Qian Xu, Chaoyun Song, Lei Xing, Zhouxiang Fei, Jan Nalborczyk","doi":"10.1109/EMCEUROPE.2016.7739191","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2016.7739191","url":null,"abstract":"This paper introduces the design of a Marx Generator that can generate high attitude pulses up to 25 kV and 2.5 kA. The pulses have a wave shape representative of that used to test High-altitude ElectroMagnetic (HEMP) filters against the pulse current injection (PCI) requirements. The rise time is 20 ns and the pulse width is 230 ns on a 10 Ω resistor. In the design, it was found that parasitic effect of circuit components could significantly affect the performance of the generator. This is mainly because the pulse width is very narrow and its frequency spectrum is very wideband. The high-frequency circuit models of the components used in the generator were obtained by calculation and optimization, and then further verified by experiment. The verified circuit models were then used to design the three-stage generator. The measured performance agrees very well with the simulated one using the proposed circuit models.","PeriodicalId":299239,"journal":{"name":"2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121733412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Runaway energy meters due to conducted electromagnetic interference 电能表因传导电磁干扰失控
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE Pub Date : 2016-09-08 DOI: 10.1109/EMCEUROPE.2016.7739298
F. Leferink, C. Keyer, Anton Melentjev
{"title":"Runaway energy meters due to conducted electromagnetic interference","authors":"F. Leferink, C. Keyer, Anton Melentjev","doi":"10.1109/EMCEUROPE.2016.7739298","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2016.7739298","url":null,"abstract":"More often consumers are complaining about the energy bill after the conventional electromechanical meter has been replaced by an electronic, or static, energy meter. Active infeed converters for photo-voltaic systems are a known source for interference to static meters. To investigate the root cause experiments on static meters have been performed in a controlled lab environment. Three-phase meters showed large deviations of more than 250% and -46%. After dismantling it was revealed that the meters with the positive deviation used a Rogowski coil current sensor. The meter with a Hall effect-based current sensor gave the -46% deviation.","PeriodicalId":299239,"journal":{"name":"2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126801293","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Protection strategy against IEMI for wireless communication infrastructures 无线通信基础设施对IEMI的保护策略
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE Pub Date : 2016-09-08 DOI: 10.1109/EMCEUROPE.2016.7739189
S. van de Beek, M. Stojilovic, N. Mora, M. Rubinstein, Farhad Rachidi-Haeri, F. Leferink
{"title":"Protection strategy against IEMI for wireless communication infrastructures","authors":"S. van de Beek, M. Stojilovic, N. Mora, M. Rubinstein, Farhad Rachidi-Haeri, F. Leferink","doi":"10.1109/EMCEUROPE.2016.7739189","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2016.7739189","url":null,"abstract":"In this paper, we present a methodology for estimating the protection levels of critical equipment against IEMI. We apply the method to a wireless communication infrastructure, but it can be applied to any critical infrastructure. The required protection levels that need to be implemented are determined by analyzing the susceptibility of the victim, and the threat level associated with a specific IEMI scenario. Based on the required protection levels, possible protection strategies are identified and the associated costs are evaluated. The total cost includes the monetary cost and the costs related to loss of performance. The method we present can be used for a quantitative comparison between different protection techniques in terms of monetary cost. The method is applied to develop a strategy for protecting a wireless receiver from damage due to in-band interference using an RF limiter. We also analyze the loss in performance due to the installation of a limiter. It is shown that the noise figure degradation is linearly dependent on the insertion loss of the limiter.","PeriodicalId":299239,"journal":{"name":"2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121425127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Comparison of active levelling and pre-calibrating/substitution method for radiated immunity testing of large equipment 大型设备辐射抗扰度试验中主动调平法与预校准/替代法的比较
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE Pub Date : 2016-09-08 DOI: 10.1109/EMCEUROPE.2016.7739200
Dwi Mandaris, S. Cakir, O. Sen, María Jiménez Lorenzo, Daniel López Sanz, Marek Svoboda, P. Hamouz, F. Leferink
{"title":"Comparison of active levelling and pre-calibrating/substitution method for radiated immunity testing of large equipment","authors":"Dwi Mandaris, S. Cakir, O. Sen, María Jiménez Lorenzo, Daniel López Sanz, Marek Svoboda, P. Hamouz, F. Leferink","doi":"10.1109/EMCEUROPE.2016.7739200","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2016.7739200","url":null,"abstract":"Radiated susceptibility tests have originally been performed using the so-called leveling method: a field strength sensor is put in front or on top of the equipment under test and the power towards the antenna is changed until the required level is achieved. Since computers became available for controlling test equipment the pre-calibration, or substitution, method became more popular. From a metrology point of view this is also a standard method but the leveling method is still preferred in some standards. The advantages and disadvantages of the methods are described in terms of the testing of very large equipment. Measurements were carried out with large and small equipment and the result shows that the methods are applicable for different purposes; Active leveling is more suitable for small EUT in closer distance while the pre-calibration is the established and preferred method for large equipment.","PeriodicalId":299239,"journal":{"name":"2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132054135","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Optimizing capacitor placement in EMI-filter using back annotation of 3D field coupling parameters in circuit models 利用电路模型中三维场耦合参数的反向注释优化emi滤波器中电容的布置
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE Pub Date : 2016-09-08 DOI: 10.1109/EMCEUROPE.2016.7739225
N. Moonen, F. Buesink, F. Leferink
{"title":"Optimizing capacitor placement in EMI-filter using back annotation of 3D field coupling parameters in circuit models","authors":"N. Moonen, F. Buesink, F. Leferink","doi":"10.1109/EMCEUROPE.2016.7739225","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2016.7739225","url":null,"abstract":"To reduce common mode(CM) and differential mode(DM) interference, a DM/CM integrated filter is often required to reduce the level of interference. This paper will show coupling from a Common Mode Choke(CMC) into Cx capacitors can decrease the DM-filtering performance significantly at high frequencies. By retrieving equivalent circuit parameters from a 3D EM field simulation of the components, and include these parameters in the circuit simulator, an optimal capacitor orientation is determined. The optimized placement results in a 15 dB improvement between 5 MHz and 200 MHz.","PeriodicalId":299239,"journal":{"name":"2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116746087","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Evaluation of the loading effect on the optically modulated scatterer 光调制散射体负载效应的评价
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE Pub Date : 2016-09-07 DOI: 10.1109/EMCEUROPE.2016.7739303
A. E. Sowa, R. Vogt-Ardatjew
{"title":"Evaluation of the loading effect on the optically modulated scatterer","authors":"A. E. Sowa, R. Vogt-Ardatjew","doi":"10.1109/EMCEUROPE.2016.7739303","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2016.7739303","url":null,"abstract":"In this paper, the evaluation of the loading effect in the Optically Modulated Scatterer has been presented. A chosen location in the vicinity of a pyramidal absorber has been analyzed. The loading effect as a function of the distance between the scatterer and the absorber has been investigated. Moreover, the loading effect vs. the scatterer size has been analyzed. The results obtained can be useful for assessment of the probe influence on the measured field.","PeriodicalId":299239,"journal":{"name":"2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127518218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
EN50561-3: Not an EMC standard, but an unacceptable licence to cause interference EN50561-3:不是EMC标准，而是不可接受的干扰许可
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE Pub Date : 2016-09-07 DOI: 10.1109/EMCEUROPE.2016.7739282
F. Leferink, A. Alcaras, Jaap Schuurmans, Maarten Appelman
{"title":"EN50561-3: Not an EMC standard, but an unacceptable licence to cause interference","authors":"F. Leferink, A. Alcaras, Jaap Schuurmans, Maarten Appelman","doi":"10.1109/EMCEUROPE.2016.7739282","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2016.7739282","url":null,"abstract":"The EN 50561-3, a power line communication standard, has been published. It allows very high interference levels, and is neglecting the allocation of the very high frequency band 30 MHz-87.5 MHz, which is mainly assigned to military communication. It is shown that these communication systems are severely degraded, in our experiment a reduction of performance of 44 dB was measured. The military personal who are, especially after recent terrorist attacks and the following lockdowns, active in our cities to safeguard the citizens are dependant of the use of the very high frequency communication systems, and they will be very seriously hampered when using then communication systems. It is shown that the EN 50561-3 and the power line communication systems are violating the essential requirements of the European EMC Directive.","PeriodicalId":299239,"journal":{"name":"2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130352379","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Mains power synchronous conducted noise measurement in the 2 to 150 kHz band 市电同步传导噪声测量在2至150khz波段
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE Pub Date : 2016-09-07 DOI: 10.1109/EMCEUROPE.2016.7739266
C. Keyer, F. Buesink, F. Leferink
{"title":"Mains power synchronous conducted noise measurement in the 2 to 150 kHz band","authors":"C. Keyer, F. Buesink, F. Leferink","doi":"10.1109/EMCEUROPE.2016.7739266","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2016.7739266","url":null,"abstract":"When testing large stationary equipment for EMC compliance, on-site testing is often the only option. In case of a fixed mains connection, use of an artificial mains network is problematic. Within In the framework of an European Research project on EMI testing of large installations, research has been performed on the performance of new and existing alternative methods. While researching existing solutions, several devices were found that served to monitor events on live mains connections. A lot of research is going on in the 2 to 150 kHz band as proper civil emission standards are lacking here and manufacturers apparently-deliberately-select the switching frequency of their power converters in this range in addition, most modern power input circuits are diode bridges followed by electrolytic capacitors, creating mains frequency synchronous interference. One of these methods involves using a high-pass filtered adapter using a commercially available common-mode coil as transformer to measure mains carried noise safely.","PeriodicalId":299239,"journal":{"name":"2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130119742","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Proficiency testing for conducted immunity with a new round robin test device 使用新的循环测试装置进行传导免疫能力测试
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE Pub Date : 2016-09-07 DOI: 10.1109/EMCEUROPE.2016.7739174
Emrah Tas, S. Cakir, M. Çetintaş, P. Hamouz, Thomas Isbring, M. Kokalj, Daniel Lopez, U. Lundgren, Dwi Mandaris, B. Pinter, Martin Poříz, M. Pous, F. Pythoud, O. Sen, Ferran Silva, Marek Svoboda, Braise Trincaz, Dongsheng Zhao
{"title":"Proficiency testing for conducted immunity with a new round robin test device","authors":"Emrah Tas, S. Cakir, M. Çetintaş, P. Hamouz, Thomas Isbring, M. Kokalj, Daniel Lopez, U. Lundgren, Dwi Mandaris, B. Pinter, Martin Poříz, M. Pous, F. Pythoud, O. Sen, Ferran Silva, Marek Svoboda, Braise Trincaz, Dongsheng Zhao","doi":"10.1109/EMCEUROPE.2016.7739174","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2016.7739174","url":null,"abstract":"Last year, a new round robin test device was proposed for inter-laboratory comparisons in conducted immunity testing according to IEC 61000-4-6[1]. The device has recently been successfully evaluated among all EMRP Project partners. The device is able to confirm or to deny the testing capability of a laboratory by recording a full set of parameters. The device is now ready for deployment as the first commercial proficiency testing device for conducted immunity.","PeriodicalId":299239,"journal":{"name":"2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134056415","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Time-frequency diversity for solving e deadlock in defining interference levels in power lines 在电力线中定义干扰电平时解决死锁的时频分集
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE Pub Date : 2016-09-07 DOI: 10.1109/EMCEUROPE.2016.7739209
I. Setiawan, C. Keyer, F. Buesink, F. Leferink
{"title":"Time-frequency diversity for solving e deadlock in defining interference levels in power lines","authors":"I. Setiawan, C. Keyer, F. Buesink, F. Leferink","doi":"10.1109/EMCEUROPE.2016.7739209","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2016.7739209","url":null,"abstract":"Communication loss in Power Line Telecommunication (PLT) caused by conducted electromagnetic interferences (EMI) is conventionally mitigated by replacing, changing, disconnecting or even by installing new equipment which means high cost. A different approach which uses information of cyclic short-time interference as a tool to replace the hardware approach is proposed in this paper. The concept uses time and frequency domain information simultaneously which has advantages over the approach that uses frequency only by trying to control the permitted level of spectral interference. The proposed concept will allow setting of dynamic levels for conducted electromagnetic interference requirements to enable PLT technology development.","PeriodicalId":299239,"journal":{"name":"2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"36 21","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133086672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
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