X-Ray Nanoimaging: Instruments and Methods V最新文献

Front Matter: Volume 11839 封面:第11839卷

X-Ray Nanoimaging: Instruments and Methods V Pub Date : 2021-10-13 DOI: 10.1117/12.2606446

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Recent progress in precision mirror optics for synchrotron-based x-ray microscopy 同步辐射x射线显微镜精密反射光学研究进展

X-Ray Nanoimaging: Instruments and Methods V Pub Date : 2021-08-06 DOI: 10.1117/12.2606066

K. Yamauchi

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Attosecond chronoscopy on solids 固体的阿秒时镜

X-Ray Nanoimaging: Instruments and Methods V Pub Date : 2021-08-05 DOI: 10.1117/12.2606067

R. Kienberger

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Dynamic x-ray detectors for high-energy-density experiments in high density 高能密度实验用动态x射线探测器

X-Ray Nanoimaging: Instruments and Methods V Pub Date : 2021-08-05 DOI: 10.1117/12.2606068

S. Nagel

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Fast multi-scale x-ray imaging 快速多尺度x射线成像

X-Ray Nanoimaging: Instruments and Methods V Pub Date : 2021-08-01 DOI: 10.1117/12.2596477

C. Rau, D. Batey, A. Bodey, S. Cipiccia, Peng Li, S. Marathe, M. Storm, G. Das, R. Ziesche

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Development of a user-friendly time resolved scanning transmission x-ray microscope at the Advanced Light Source 先进光源下用户友好的时间分辨扫描透射x射线显微镜的研制

X-Ray Nanoimaging: Instruments and Methods V Pub Date : 2021-08-01 DOI: 10.1117/12.2595552

H. Ohldag, T. Feggeler, D. Shapiro, Y. Kumar, G. Portman, E. Norum, A. Butko

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Hard x-ray nano-XANES and implementation deep learning tools for multi-modal chemical imaging 硬x射线纳米xanes和实现多模态化学成像的深度学习工具

X-Ray Nanoimaging: Instruments and Methods V Pub Date : 2021-08-01 DOI: 10.1117/12.2599526

A. Pattammattel, R. Tappero, Y. Chu, M. Ge, D. Gavrilov, Xiaojing Huang, Hanfei Yan

引用次数: 1

X-ray tomography reconstruction with machine learning: a study focusing on accuracy and fidelity 机器学习的x射线断层扫描重建:一项关注准确性和保真度的研究

X-Ray Nanoimaging: Instruments and Methods V Pub Date : 2021-08-01 DOI: 10.1117/12.2594344

Jiayong Zhang, M. Ge, Thomas Flynn, S. Mittal

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引用次数: 0

Reconstruction with nonrigid alignment in tomography and 3D ptychography 在断层摄影和三维平面摄影中使用非刚性对齐重建

X-Ray Nanoimaging: Instruments and Methods V Pub Date : 2021-08-01 DOI: 10.1117/12.2594889

Viktor V. Nikitin, V. Andrade, D. Gursoy, F. Carlo

引用次数: 0

Image-based wavefront measurement for full-field x-ray microscopy 基于图像的全视野x射线显微镜波前测量

X-Ray Nanoimaging: Instruments and Methods V Pub Date : 2021-08-01 DOI: 10.1117/12.2595026

Yuto Tanaka, S. Matsuyama, Takato Inoue, Nami Nakamura, J. Yamada, Y. Kohmura, M. Yabashi, K. Omote, T. Ishikawa, K. Yamauchi

引用次数: 0