Image-based wavefront measurement for full-field x-ray microscopy

Abstract

A wavefront measurement method in the microscope (magnifying) geometry can help achieve the required high accuracy for deformable mirrors. This study proposes an image-based wavefront measurement method based on a series of images of a small area near the focus. In this method, phase retrieval calculation using multiple images is performed. A proof-of-concept experiment was performed using multilayer AKB mirrors and an FZP to form the small area. Consequently, wavefront aberration was successfully retrieved using 60 images of a 30-nm-diameter area near the focus.