K. Hassan, J. Ramírez, V. Ramez, S. Malhouitre, C. Jany, S. Guerber, D. Néel, J. Decobert, D. Bitauld
{"title":"On the yield assessment and improvement of III-V on silicon lasers","authors":"K. Hassan, J. Ramírez, V. Ramez, S. Malhouitre, C. Jany, S. Guerber, D. Néel, J. Decobert, D. Bitauld","doi":"10.1117/12.2616681","DOIUrl":"https://doi.org/10.1117/12.2616681","url":null,"abstract":"","PeriodicalId":286687,"journal":{"name":"Optical Interconnects XXII","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115559763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}