K. Hassan, J. Ramírez, V. Ramez, S. Malhouitre, C. Jany, S. Guerber, D. Néel, J. Decobert, D. Bitauld
{"title":"硅激光器III-V的良率评估与改进","authors":"K. Hassan, J. Ramírez, V. Ramez, S. Malhouitre, C. Jany, S. Guerber, D. Néel, J. Decobert, D. Bitauld","doi":"10.1117/12.2616681","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":286687,"journal":{"name":"Optical Interconnects XXII","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On the yield assessment and improvement of III-V on silicon lasers\",\"authors\":\"K. Hassan, J. Ramírez, V. Ramez, S. Malhouitre, C. Jany, S. Guerber, D. Néel, J. Decobert, D. Bitauld\",\"doi\":\"10.1117/12.2616681\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":286687,\"journal\":{\"name\":\"Optical Interconnects XXII\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-03-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Interconnects XXII\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2616681\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Interconnects XXII","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2616681","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}