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Optimal placement of voltage sag monitors based on monitor reach area and sag severity index 基于监测覆盖面积和电压凹陷严重程度指数的电压凹陷监测器的优化布置
2010 IEEE Student Conference on Research and Development (SCOReD) Pub Date : 2010-12-01 DOI: 10.1109/SCORED.2010.5704055
A. A. Ibrahim, A. Mohamed, H. Shareef, S. Ghoshal
{"title":"Optimal placement of voltage sag monitors based on monitor reach area and sag severity index","authors":"A. A. Ibrahim, A. Mohamed, H. Shareef, S. Ghoshal","doi":"10.1109/SCORED.2010.5704055","DOIUrl":"https://doi.org/10.1109/SCORED.2010.5704055","url":null,"abstract":"In the modern industry, most of the equipment use semiconductor devices and microprocessors which are sensitive against power disturbances. Among all power disturbances, voltage sags are considered as the most frequent type of disturbances and their impact on sensitive loads is severe. To monitor these disturbances, voltage sag recorders (VSR) must be installed. However, installation of VSRs at all buses in the system is not economical and it needs to be minimized. This paper presents a sag monitor positioning algorithm which finds the optimal number and location of VSRs in the power distribution system. The IEEE 34-node test system was modeled in DIgSILENT software in obtaining monitor reach area matrix for various types of faults. Then, an optimization problem is formulated and performed using genetic algorithm to guarantee the observability of the whole system with minimum number of VSRs. A new index has been used to find the best location to install monitor in the distribution system.","PeriodicalId":277771,"journal":{"name":"2010 IEEE Student Conference on Research and Development (SCOReD)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116515059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
Failure analysis using IDD current leakage and photo localization for gate oxide defect of CMOS VLSI 基于IDD漏电流和光定位的CMOS VLSI栅氧化缺陷失效分析
2010 IEEE Student Conference on Research and Development (SCOReD) Pub Date : 2010-12-01 DOI: 10.1109/SCORED.2010.5704033
F. Abdullah, N. Nayan, M. Mahadi Abdul Jamil
{"title":"Failure analysis using IDD current leakage and photo localization for gate oxide defect of CMOS VLSI","authors":"F. Abdullah, N. Nayan, M. Mahadi Abdul Jamil","doi":"10.1109/SCORED.2010.5704033","DOIUrl":"https://doi.org/10.1109/SCORED.2010.5704033","url":null,"abstract":"The typical electrical degradation on the complementary metal oxide semiconductor (CMOS) performance is due to defect in gate oxide layer. During integrated circuit (IC) infant mortality phase, stress tests introduced at wafer sort and final test in order to assured only good IC being deliver to end customer. Stress tests such as burn-in, gate stress, and quiescent current (IDDQ) test, demonstrated their competency to screen out this type of early failure. Nevertheless, the latent defect is a time dependent failure, which, affect the CMOS reliability after certain time, temperatures and application stress. Consequently, revise failure analysis technique has to be introduced in effective approach to compensate the problem in the current technology due to metal interconnection layers and dense for front side failure analysis (FA). The motivation of this work is to present the fault localization on the elevated IDD current of the faulty logic cells during the transition by photo localization technique and clarify gate oxide defect through circuit simulation. We have confirmed that the IDD scan test and photo localization technique were effective to localize faulty IC in silicon active area through front side.","PeriodicalId":277771,"journal":{"name":"2010 IEEE Student Conference on Research and Development (SCOReD)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127763869","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Study on the effect of CBR on packet marking in assured forwarding CBR对保证转发中数据包标记的影响研究
2010 IEEE Student Conference on Research and Development (SCOReD) Pub Date : 2010-12-01 DOI: 10.1109/SCORED.2010.5703971
Arun Nagendran, V. Kartick, V. Sayee Ram, L. Senthilkumar, S. Sudha
{"title":"Study on the effect of CBR on packet marking in assured forwarding","authors":"Arun Nagendran, V. Kartick, V. Sayee Ram, L. Senthilkumar, S. Sudha","doi":"10.1109/SCORED.2010.5703971","DOIUrl":"https://doi.org/10.1109/SCORED.2010.5703971","url":null,"abstract":"Many research works have been carried out in differentiated Services, to study the fairness issues between aggregates of both TCP and UDP. Due to multimedia demands, the UDP flows can also demand assured service. Hence, there is a need to protect certain UDP flows which require the same fair treatment as TCP. In such cases, the UDP flows are characterized as AS UDP with target rates and are modeled as CBR sources with fixed traffic rate. In such situations, to study the fairness issue, what should be the CB Rate of the traffic is a question. With a goal to enlighten this, simulations have been carried out with fixed target rates and varying CB rates. The simulations are carried out with the time sliding window based two color marker in NS-2 and their corresponding results being furnished. It is inferred that the CBR should be set at a value greater than the target rate of the UDP source to study its performance and fairness issues.","PeriodicalId":277771,"journal":{"name":"2010 IEEE Student Conference on Research and Development (SCOReD)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115011197","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A hybrid PSO technique for damping electro-mechanical oscillations in large power system 大型电力系统中抑制机电振荡的混合粒子群算法
2010 IEEE Student Conference on Research and Development (SCOReD) Pub Date : 2010-12-01 DOI: 10.1109/SCORED.2010.5704050
M. Eslami, H. Shareef, A. Mohamed, M. Khajehzadeh
{"title":"A hybrid PSO technique for damping electro-mechanical oscillations in large power system","authors":"M. Eslami, H. Shareef, A. Mohamed, M. Khajehzadeh","doi":"10.1109/SCORED.2010.5704050","DOIUrl":"https://doi.org/10.1109/SCORED.2010.5704050","url":null,"abstract":"In this paper, a hybrid optimization technique is presented to solve the well-known problem of tuning power system stabilizers' (PSSs) parameters. The hybrid technique is derived from particle swarm optimization (PSO) by adding the passive congregation model. The tuning of the PSS parameters is formulated as the multi-objective function with constraints including the damping ratio and damping factor. Maximizations of the damping factor and the damping ratio of power system modes are taken as the goals or two objective functions, when designing the PSS parameters. The New England 16-unit 68-bus standard power system, under various system configurations and operation conditions, is employed to illustrate the performance of the proposed method. The results are very encouraging and suggest that the proposed PSO with passive Congregation (PSOPC) algorithm is very efficient in damping low frequency oscillations and improving the stability of power system.","PeriodicalId":277771,"journal":{"name":"2010 IEEE Student Conference on Research and Development (SCOReD)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124916430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Studies of potential carbon coating for high frequency microwave absorber 高频微波吸收体潜在碳涂层的研究
2010 IEEE Student Conference on Research and Development (SCOReD) Pub Date : 2010-12-01 DOI: 10.1109/SCORED.2010.5703960
H. A. Idris, M. Taib, R. Ariffin, S. A. Jalil, W. K. Wan Ali
{"title":"Studies of potential carbon coating for high frequency microwave absorber","authors":"H. A. Idris, M. Taib, R. Ariffin, S. A. Jalil, W. K. Wan Ali","doi":"10.1109/SCORED.2010.5703960","DOIUrl":"https://doi.org/10.1109/SCORED.2010.5703960","url":null,"abstract":"An electromagnetic (EM) wave absorber is used to absorb the reflected wave that occurs on the wall of the chamber in the anechoic chamber. To date findings show that the construction of the absorber material used for the absorbers, ferrite is in the lead. A survey on materials that can be used as a carbon for the absorber is performed and the best carbon content is a mix of wood. The absorbers are made of elephant board and then coated with carbon. The absorber is measured for 10GHz frequency. The performances of the designed absorber are compared to commercial absorbers available in terms of the absorption performance.","PeriodicalId":277771,"journal":{"name":"2010 IEEE Student Conference on Research and Development (SCOReD)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124932451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Stochastic subspace algorithm based on the orthogonal decomposition method for closed-loop system identification 基于正交分解法的随机子空间算法用于闭环系统辨识
2010 IEEE Student Conference on Research and Development (SCOReD) Pub Date : 2010-12-01 DOI: 10.1109/SCORED.2010.5704007
M. Aziz, R. Mohd-Mokhtar
{"title":"Stochastic subspace algorithm based on the orthogonal decomposition method for closed-loop system identification","authors":"M. Aziz, R. Mohd-Mokhtar","doi":"10.1109/SCORED.2010.5704007","DOIUrl":"https://doi.org/10.1109/SCORED.2010.5704007","url":null,"abstract":"This paper presents a stochastic subspace identification algorithm dedicated to subspace-based closed-loop system identification. The preliminary algorithm is based on the ordinary subspace technique followed by a modification in which a new proposed method based on orthogonal decomposition method is used to reconstruct the past input and past output data of the instrumental variables. The noise model is obtained as to improve the performance of the model in dealing with a stochastic system. The analysis of the proposed approach with PO-MOESP method is also carried out. The efficacy of the developed approach is then demonstrated by identifying a simulation based on experimental data. An evaluation performance test according to mean square errors, variance accounted for and best fit, are used as to verify the accuracy of the model. A comparative simulation results with PO-MOESP method is also included.","PeriodicalId":277771,"journal":{"name":"2010 IEEE Student Conference on Research and Development (SCOReD)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121421201","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Neural network based aircraft control 基于神经网络的飞机控制
2010 IEEE Student Conference on Research and Development (SCOReD) Pub Date : 2010-12-01 DOI: 10.1109/SCORED.2010.5704013
Furqan, J. Iqbal, Akhtar Nawaz Malik, W. Haider
{"title":"Neural network based aircraft control","authors":"Furqan, J. Iqbal, Akhtar Nawaz Malik, W. Haider","doi":"10.1109/SCORED.2010.5704013","DOIUrl":"https://doi.org/10.1109/SCORED.2010.5704013","url":null,"abstract":"This paper presents a technique of landing control, roll control, pitch control and altitude hold control of an airplane using neural networks. Firstly the neural network is trained from available flight data and then that trained neural network controls the landing, roll, pitch and altitude hold of the airplane. The neural network control has been implemented in MATLAB and the data for training have been taken from Flight Gear Simulator. The neural network control has been simulated for commercial airplane i.e. Cessna 172 using the Flight Gear Simulator. The trained neural network control detects variations from the Flight Gear Simulator and supplies back the corrective signals to aileron, elevator, throttle, and rudder. The flight performance has been shown in the Flight Gear Simulator. The objective is to improve the performance of conventional landing, roll, pitch and altitude hold controllers. Simulated results show that control for different flight phases is successful and the neural network controllers provide the robustness to system parameter variation.","PeriodicalId":277771,"journal":{"name":"2010 IEEE Student Conference on Research and Development (SCOReD)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125870195","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
The three phase rectifier with harmonic injection current 三相整流器与谐波注入电流
2010 IEEE Student Conference on Research and Development (SCOReD) Pub Date : 2010-12-01 DOI: 10.1109/SCORED.2010.5704030
M. Norhisam, A. Saadon, R. N. Firdaus, I. Aris, S. M. Bashi
{"title":"The three phase rectifier with harmonic injection current","authors":"M. Norhisam, A. Saadon, R. N. Firdaus, I. Aris, S. M. Bashi","doi":"10.1109/SCORED.2010.5704030","DOIUrl":"https://doi.org/10.1109/SCORED.2010.5704030","url":null,"abstract":"This paper demonstrates new circuit and concepts for three phase rectifier using harmonic current injection method. The proposed circuit is using active harmonic current injection method with a capacitor bank which is simple and low cost compared to conventional circuit that using a harmonic current injection method with star-delta transformer. This proposed circuit will reduce the total harmonic distortion which is drawn from input current supply. This will produce the waveform for the input current near to sinusoidal wave. A prototype of the proposed circuit had been developed. The comparison of simulation result and measurement result of the prototype shows good agreement between them. In addition, the THD versus output power of the proposed circuit also had been evaluated and compared with other the conventional circuit that using a harmonic current injection method with star-delta transformer. Finally, this paper will give an overview about a new harmonic current injection method that produce a very low THD of input current.","PeriodicalId":277771,"journal":{"name":"2010 IEEE Student Conference on Research and Development (SCOReD)","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127050798","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Breast Cancer prediction based on Backpropagation Algorithm 基于反向传播算法的乳腺癌预测
2010 IEEE Student Conference on Research and Development (SCOReD) Pub Date : 2010-12-01 DOI: 10.1109/SCORED.2010.5703994
M. S. Bin Mohd Azmi, Z. C. Cob
{"title":"Breast Cancer prediction based on Backpropagation Algorithm","authors":"M. S. Bin Mohd Azmi, Z. C. Cob","doi":"10.1109/SCORED.2010.5703994","DOIUrl":"https://doi.org/10.1109/SCORED.2010.5703994","url":null,"abstract":"Breast cancer is the second leading cause of cancer deaths in women worldwide and occurs in nearly one out of eight women. Currently there are three techniques to diagnose breast cancer: mammography, FNA (Fine Needle Aspirate) and surgical biopsy. In this paper, we develop a system that can classify “Breast Cancer Disease” tumor using neural network with Feed-forward Backpropagation Algorithm to classify the tumor from a symptom that causes the breast cancer disease. The main aim of research is to develop more cost-effective and easy-to-use systems for supporting clinicians. For the breast cancer tumor diagnosis problem, experimental results show that the concise models extracted from the network achieve high accuracy rate of on the training data set and on the test data set. Breast cancer tumor database used for this purpose is from the University of Wisconsin (UCI) Machine Learning Repository.","PeriodicalId":277771,"journal":{"name":"2010 IEEE Student Conference on Research and Development (SCOReD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129033732","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 28
Design and fabrication of Surface Acoustic Wave resonators on Lithium Niobate 铌酸锂表面声波谐振器的设计与制造
2010 IEEE Student Conference on Research and Development (SCOReD) Pub Date : 2010-12-01 DOI: 10.1109/SCORED.2010.5704036
F. Sidek, Noor Amalina Ramli, A. Nordin, I. Voiculescu
{"title":"Design and fabrication of Surface Acoustic Wave resonators on Lithium Niobate","authors":"F. Sidek, Noor Amalina Ramli, A. Nordin, I. Voiculescu","doi":"10.1109/SCORED.2010.5704036","DOIUrl":"https://doi.org/10.1109/SCORED.2010.5704036","url":null,"abstract":"Surface Acoustic Wave (SAW) resonators are essential components in communication devices and are used mainly as oscillators, frequency synthesizers and transceivers. Common piezoelectric substrates are quartz, Lithium Tantalate (LiTaO3) and Lithium Niobate (LiNbO3). In this paper we describe the design and fabrication of SAW resonators on LiNbO3. The design of the SAW resonators was simulated using COMSOL MultiphysicsTM. Two SAW resonators with resonance frequency of 218MHz with varying number of reflectors were fabricated and measured. Measurements conducted using an RF Probe station and network analyzer yielded losses of −48.3dB and −49.32dB for Resonator 1 and Resonator 2 respectively.","PeriodicalId":277771,"journal":{"name":"2010 IEEE Student Conference on Research and Development (SCOReD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131017079","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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