发布求助
文献互助 智能选刊 最新文献

2012 35th International Spring Seminar on Electronics Technology最新文献

筛选
英文 中文
Fuzzy risk analysis approach test-case: Lead-free soldering process 模糊风险分析方法测试案例:无铅焊接工艺
2012 35th International Spring Seminar on Electronics Technology Pub Date : 2012-05-09 DOI: 10.1109/ISSE.2012.6273083
P. Evgenia, M. Pavel
{"title":"Fuzzy risk analysis approach test-case: Lead-free soldering process","authors":"P. Evgenia, M. Pavel","doi":"10.1109/ISSE.2012.6273083","DOIUrl":"https://doi.org/10.1109/ISSE.2012.6273083","url":null,"abstract":"The increasing complexity of technological processes has imposed considerable uncertainties and subjectivities in the risk analyses of these processes. The paper integrates the use of fuzzy logic and expert database with FMEA. Application of fuzzy sets theory on FMEA of a technological process. Analysis of the lead-free soldering process is based on fuzzy logic. The proposed fuzzy risk analysis approach is more flexible and more intelligent than the original risk analysis techniques. The paper shows case-study of fuzzy FMEA of a lead-free soldering.","PeriodicalId":277579,"journal":{"name":"2012 35th International Spring Seminar on Electronics Technology","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125969092","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Optimized methods for theoretical and practical training 优化理论和实践培训方法
2012 35th International Spring Seminar on Electronics Technology Pub Date : 2012-05-09 DOI: 10.1109/ISSE.2012.6273146
T. Vlad, D. Pitica, L. Man, J. Rajmond
{"title":"Optimized methods for theoretical and practical training","authors":"T. Vlad, D. Pitica, L. Man, J. Rajmond","doi":"10.1109/ISSE.2012.6273146","DOIUrl":"https://doi.org/10.1109/ISSE.2012.6273146","url":null,"abstract":"This paper presents methods used to improve the teaching process applied in electronics, using the advantages of a complete educational platform. Also, this paper is focused both on maximizing the knowledge already acquired by the 1st year students and on exploitation of previous personal experiences. The purpose of using these methods is to establish an individualized path that would better highlight the specific skills of each student.","PeriodicalId":277579,"journal":{"name":"2012 35th International Spring Seminar on Electronics Technology","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130005273","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Thick-film piezoresistors - benchmarking of LTCC substrates 厚膜压电阻- LTCC衬底的基准测试
2012 35th International Spring Seminar on Electronics Technology Pub Date : 2012-05-09 DOI: 10.1109/ISSE.2012.6273141
M. Hrovat, D. Belavic, K. Makarovič, J. Holc
{"title":"Thick-film piezoresistors - benchmarking of LTCC substrates","authors":"M. Hrovat, D. Belavic, K. Makarovič, J. Holc","doi":"10.1109/ISSE.2012.6273141","DOIUrl":"https://doi.org/10.1109/ISSE.2012.6273141","url":null,"abstract":"The ceramic micro electro-mechanical systems (C-MEMS) are fabricated in most cases by low-temperature co-fired ceramics (LTCC). The sensors of mechanical quantities are fundamental parts of MEMS, and thick-film resistor can sense mechanical deformations in the C-MEMS structures. Relatively low elastic moduli of LTCC ceramics as compared to alumina ceramics imply an increased sensitivity of sensing elements. Selected thick film resistors (Du Pont 2041 and ESL 3414) were evaluated as piezo-resistors for force sensors. The 2041 resistor was chosen because of its low noise, whereas the 3414-B was developed specially for use in strain gauges Resistors were screen printed and fired on various LTCC tapes as well as on alumina substrates. Electrical characteristics, i.e., sheet resistivities, noise indices and gauge factors were measured. LTCC tapes were analysed by scanning electron microscopy, energy dispersive X-ray analysis and X-ray powder analysis. Crystalline phases in LTCC materials were determined.","PeriodicalId":277579,"journal":{"name":"2012 35th International Spring Seminar on Electronics Technology","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124025628","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Influence factors of warpage reduction of thin dies by capillary action 毛细管作用薄模具减翘曲的影响因素
2012 35th International Spring Seminar on Electronics Technology Pub Date : 2012-05-09 DOI: 10.1109/ISSE.2012.6273105
M. Froemmig, K. Wolter
{"title":"Influence factors of warpage reduction of thin dies by capillary action","authors":"M. Froemmig, K. Wolter","doi":"10.1109/ISSE.2012.6273105","DOIUrl":"https://doi.org/10.1109/ISSE.2012.6273105","url":null,"abstract":"This paper examines a new technology to overcome the warpage of thin dies during electronics assembly. A liquid is encased in the gap between substrate and die, which acts as capillary. Consequently the die is planarized due to capillary pressure caused by the capillary action in the gap. Influencing factors on this effect, like gap height, level and orientation of die warpage, volume of liquid and the kind of the used liquid, were investigated. It was found that the success of the planarization depends strongly on the warpage orientation of the die. In case of a concave warpage orientation the technology is sensitive on the volume of the liquid, the gap height and of the warpage level in the initial state. In contrast, the planarization works significantly better for a convex warpage orientation and is less sensitive to parameter changes. The reasons for these differences were explained by a mechanical beam model.","PeriodicalId":277579,"journal":{"name":"2012 35th International Spring Seminar on Electronics Technology","volume":"111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121544201","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Feasibility study and life cycle energy balance of thermoelectric generator modules for automotive applications 汽车用热电发电模块的可行性研究及生命周期能量平衡
2012 35th International Spring Seminar on Electronics Technology Pub Date : 2012-05-09 DOI: 10.1109/ISSE.2012.6273159
M. Weilguni, M. Franz, N. Slyusar'
{"title":"Feasibility study and life cycle energy balance of thermoelectric generator modules for automotive applications","authors":"M. Weilguni, M. Franz, N. Slyusar'","doi":"10.1109/ISSE.2012.6273159","DOIUrl":"https://doi.org/10.1109/ISSE.2012.6273159","url":null,"abstract":"Thermoelectric generators (TEGs) are highly promising for energy harvesting applications [1]. Currently, TEGs are mainly utilized in self-sustaining sensor systems where small amounts of energy (milli-Watt-range) are sufficient. Since the efficiency of TEGs can be increased due to new materials and technologies they become interesting to be used in passenger cars as an alternative to the alternator [2, 3]. In these vehicles the thermal energy of the exhaust gas of the car engine could potentially provide the required energy. This paper presents the results of a feasibility study and the life cycle inventory of TEG modules that should replace the alternator of a passenger car. Within this life cycle inventory, the cradle-to-gate energy efforts are estimated.","PeriodicalId":277579,"journal":{"name":"2012 35th International Spring Seminar on Electronics Technology","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134580927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Modelling and testing the impact of hot solder dip process on leaded components 模拟和测试热浸焊工艺对含铅元件的影响
2012 35th International Spring Seminar on Electronics Technology Pub Date : 2012-05-09 DOI: 10.1109/ISSE.2012.6273091
S. Stoyanov, C. Best, M. Alam, C. Bailey, P. Tollafield, M. Parker, J. Scott
{"title":"Modelling and testing the impact of hot solder dip process on leaded components","authors":"S. Stoyanov, C. Best, M. Alam, C. Bailey, P. Tollafield, M. Parker, J. Scott","doi":"10.1109/ISSE.2012.6273091","DOIUrl":"https://doi.org/10.1109/ISSE.2012.6273091","url":null,"abstract":"The use of microelectronics components with lead-free solder finishes on their terminations in high reliability and safety critical defence and aerospace equipment is associated with major long-term reliability issues due to tin-whisker growth phenomena. A potential solution to this problem is to “re-finish” the package terminations by removing the tin coating from the leads and replace with conventional tin-lead solder in a post-manufacturing process known as hot solder dip (HSD). This paper details a modelling approach to the thermo-mechanical characterisation of leaded components subjected to a double-dip HSD process. Transient thermal finite element analysis (FEA) is used to evaluate the temperature distribution and gradients in a QFP-type component and then used as thermal loads to predict the stress evolution in the package. The risk of thermally induced damage in the part at package level is assessed using the model predictions and compared with findings from electrical and CSAM tests undertaken on a pre- and post- refinished samples. It is concluded that in the instance of the studied part no thermo-mechanical damage is induced as a result of the HSD.","PeriodicalId":277579,"journal":{"name":"2012 35th International Spring Seminar on Electronics Technology","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132356231","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Design of low pass filter for UWB application 超宽带低通滤波器的设计
2012 35th International Spring Seminar on Electronics Technology Pub Date : 2012-05-09 DOI: 10.1109/ISSE.2012.6273164
A. Pietrikova, K. Ruman, I. Vehec, P. Galajda
{"title":"Design of low pass filter for UWB application","authors":"A. Pietrikova, K. Ruman, I. Vehec, P. Galajda","doi":"10.1109/ISSE.2012.6273164","DOIUrl":"https://doi.org/10.1109/ISSE.2012.6273164","url":null,"abstract":"This paper deals with design, simulation and experimental testing of a low pass (LP) filter for Ultra Wide-Band (UWB) radar applications. The paper focuses on various technological possibilities of production that are used in the branch of UWB filters. This paper demonstrates the design of LP filter realised by the Filter Solution 2011 from Nuhertz as well its simulation done by Ansoft Designer from ANSYS. Simulated and measured results of insertion loss and return loss response of LP filter for UWB radar are presented. This paper assesses the suitability of hydrocarbon ceramic laminate substrate for the production of LP filter for high frequency (HF) area. Paper refers to the needs to be focused on the design of passive filters used in UWB radar systems with emphasis on issues of quality of transmitted signals in the HF range. It examines potential manufacturing possibility of such filter based on Low Temperature Ceramics (LTCC) technology too. The presented filter is an example of an antialiasing LP filter for particular laboratory UWB radar.","PeriodicalId":277579,"journal":{"name":"2012 35th International Spring Seminar on Electronics Technology","volume":"91 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129291430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Effect of nitrogen atmosphere on the soldering process for different types of lead-free solders 氮气气氛对不同类型无铅焊料焊接工艺的影响
2012 35th International Spring Seminar on Electronics Technology Pub Date : 2012-05-09 DOI: 10.1109/ISSE.2012.6273139
P. Schnederle, M. Adamek, I. Szendiuch
{"title":"Effect of nitrogen atmosphere on the soldering process for different types of lead-free solders","authors":"P. Schnederle, M. Adamek, I. Szendiuch","doi":"10.1109/ISSE.2012.6273139","DOIUrl":"https://doi.org/10.1109/ISSE.2012.6273139","url":null,"abstract":"An important part of the microelectronics manufacturing is the reflow process. Even though that the soldering have a long history, the process is still not completely described. Particular still discussed the introduction of the WEEE Directive 2003/108/EC standards and RoHS Directive 2002/95/EC got the soldering received into new areas. There is a space for new material compositions which do not contain lead. Furthermore, a new procedure process, adjusting of equipment and began to make greater use of nitrogen as protective gas. The aim is to compare the already proven commercial solder alloys on different carrier and evaluate more exactly the benefits of nitrogen atmosphere. The evaluation was performed for solder SAC, Sn100C and SnPb solder paste was used as reference. Type of substrates was printed circuit board FR-4 and ceramic substrate. Soldering conducted in atmosphere with different residual oxygen. Results of this paper may serve to increase the quality of soldering classical package as well as BGA and CSP package.","PeriodicalId":277579,"journal":{"name":"2012 35th International Spring Seminar on Electronics Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131270856","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A review of data-driven prognostics in power electronics 电力电子学中数据驱动预测的综述
2012 35th International Spring Seminar on Electronics Technology Pub Date : 2012-05-09 DOI: 10.1109/ISSE.2012.6273136
Ahsanul Kabir, Chris Bailey, Hua Lu, S. Stoyanov
{"title":"A review of data-driven prognostics in power electronics","authors":"Ahsanul Kabir, Chris Bailey, Hua Lu, S. Stoyanov","doi":"10.1109/ISSE.2012.6273136","DOIUrl":"https://doi.org/10.1109/ISSE.2012.6273136","url":null,"abstract":"The discipline that connects prognostics and system lifecycle management is often referred to as prognostics and health management (PHM). Though prognostics is one of the main parts of PHM, it is the least mature. This paper is based on the past work of data driven prognostics applied in the field of power electronics modules and primarily concerned with the data driven prognostics methods that take advantage of measured characteristics of individual systems or components in order to predict the remaining useful life (RUL).","PeriodicalId":277579,"journal":{"name":"2012 35th International Spring Seminar on Electronics Technology","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122126719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 28
Material characteristics of the LTCC base material CeramTape GC LTCC基材CeramTape GC的材料特性
2012 35th International Spring Seminar on Electronics Technology Pub Date : 2012-05-09 DOI: 10.1109/ISSE.2012.6273086
M. Franz, I. Atassi, A. Maric, B. Balluch, M. Weilguni, W. Smetana, C. P. Kluge, G. Radosavljevic
{"title":"Material characteristics of the LTCC base material CeramTape GC","authors":"M. Franz, I. Atassi, A. Maric, B. Balluch, M. Weilguni, W. Smetana, C. P. Kluge, G. Radosavljevic","doi":"10.1109/ISSE.2012.6273086","DOIUrl":"https://doi.org/10.1109/ISSE.2012.6273086","url":null,"abstract":"This paper provides new material property measurement results of the ceramic film material CERAMTAPE GC (manufactured by CERAMTEC GMBH), a commercially available LTCC (Low Temperature Co-fired Ceramics) tape for electronic and microfluidic applications in harsh environment. Following material properties are presented: x-y-z-shrinkage dependent on the lamination pressure, density, weight loss, surface parameters of the green and co-fired tape, thermal properties, Young's modulus, permittivity, chemical composition, and bio-compatibility.","PeriodicalId":277579,"journal":{"name":"2012 35th International Spring Seminar on Electronics Technology","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122573721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信