厚膜压电阻- LTCC衬底的基准测试

M. Hrovat, D. Belavic, K. Makarovič, J. Holc
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引用次数: 0

摘要

陶瓷微机电系统(C-MEMS)大多采用低温共烧陶瓷(LTCC)制备。机械量传感器是微机电系统的基本组成部分,厚膜电阻器可以检测C-MEMS结构中的机械变形。与氧化铝陶瓷相比,LTCC陶瓷相对较低的弹性模量意味着传感元件的灵敏度增加。选择厚膜电阻器(Du Pont 2041和ESL 3414)作为力传感器的压阻电阻器进行了评估。选择2041电阻器是因为它的低噪声,而3414-B是专门为应变片开发的,电阻器是丝网印刷的,并在各种LTCC磁带以及氧化铝基板上烧制。测量了电特性,即薄片电阻率、噪声指数和测量因子。采用扫描电子显微镜、能量色散x射线分析和x射线粉末分析对LTCC胶带进行了分析。测定了LTCC材料的晶相。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Thick-film piezoresistors - benchmarking of LTCC substrates
The ceramic micro electro-mechanical systems (C-MEMS) are fabricated in most cases by low-temperature co-fired ceramics (LTCC). The sensors of mechanical quantities are fundamental parts of MEMS, and thick-film resistor can sense mechanical deformations in the C-MEMS structures. Relatively low elastic moduli of LTCC ceramics as compared to alumina ceramics imply an increased sensitivity of sensing elements. Selected thick film resistors (Du Pont 2041 and ESL 3414) were evaluated as piezo-resistors for force sensors. The 2041 resistor was chosen because of its low noise, whereas the 3414-B was developed specially for use in strain gauges Resistors were screen printed and fired on various LTCC tapes as well as on alumina substrates. Electrical characteristics, i.e., sheet resistivities, noise indices and gauge factors were measured. LTCC tapes were analysed by scanning electron microscopy, energy dispersive X-ray analysis and X-ray powder analysis. Crystalline phases in LTCC materials were determined.
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